Fischer Technology, Inc. Datasheets for Dimensional Gages and Instruments

Dimensional gages and instruments provide quantitative measurements of product or component dimensional and form attributes such as wall thickness, depth, height, length, inner diameter (ID), outer diameter (OD), taper or bore.
Dimensional Gages and Instruments: Learn more

Product Name Notes
X-Ray Fluorescence Measuring System for Continuous In-line Measurement and Analysis of Thin Coatings -- FISCHERSCOPE® X-RAY 5000 Series As modular units, the instruments of the X-RAY 5000 range can be easily integrated into manufacturing lines. For example, when coatings on large-surface substrates such as tin sheets must be...
Desktop Measurement Instrument -- BETASCOPE® BETASCOPE offers the broadest variety of material combinations of all the FISCHER measurement instruments. Through the deployment of beta radiation (electrons), BETASCOPE does not need to rely on the magnetic...
Pocket Instrument for Simple and Fast Coating Thickness Measurement -- DUALSCOPE® MP0
Pocket Instruments with PC-Interface for Coating Thickness Measurement -- DUALSCOPE® MP0R / MPOR-FP
Compact, handy and robust – instruments from the MP0 and MP0R series make it easy and fast to measure coating thicknesses non-destructively. With two displays, a particularly strong casing and...
Multi-sensory Measurement Instrument -- MMS® DFT Developed by anti-corrosion experts, the three devices impress with robustness, usability and performance. All required measurement tasks in heavy corrosion protection are solved quickly and reliably. The DFT is the...
Ultrasonic Device for Measuring Wall Thickness -- FISCHERSCOPE® UMP 100
Ultrasonic Device for Measuring Wall Thickness -- FISCHERSCOPE® UMP 20
Ultrasonic Device for Measuring Wall Thickness -- FISCHERSCOPE® UMP 40
Fischer’s ultrasonic line is ideal for measuring wall thicknesses in all aspects of corrosion protection. Exchangeable probes make the devices of the UMP series particularly flexible; models range from entry...
X-ray Fluorescence Instrument -- FISCHERSCOPE® X-RAY XAN® 500 Handheld, desktop, inline: the XAN®500 X-ray fluorescence instrument is Fischer’s most versatile yet. It can be used as a handheld device, as a fully enclosed desktop unit or...
Desktop Coating Thickness Measurement Instrument -- COULOSCOPE® CMS2
Desktop Coating Thickness Measurement Instrument -- COULOSCOPE® CMS2 STEP
Instruments from the COULOSCOPE CMS2 range measure coating thicknesses by means of deplating layers through electrolysis. In particular, the Coulometric method can be used to precisely determine multi-layers on any...
X-Ray Fluorescence Measuring Instrument for Fast and Non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys -- FISCHERSCOPE® X-RAY XUL® Series Measurement instruments from the XUL® series are the solution of choice wherever the need is to determine coating thicknesses quickly and very precisely in electroplating or electronics manufacturing. The...
X-Ray Fluorescence Measuring System for Continuous In-line Measurement and Analysis -- FISCHERSCOPE® X-RAY 4000 Series The FISCHERSCOPE X-RAY 4000 is specially designed for coating thickness measurement and material analysis during strip electroplating processes. This measurement system has already been installed over 300 times in electroplating...
EDXRF Instrument for Non-destructive Microstructure Wafer Metrology -- FISCHERSCOPE® X-RAY XDV®-µ SEMI The FISCHERSCOPE X-RAY XDV-μ SEMI is an automated measurement system optimized for the quality control of micro-structures in complex 2.5D/3D packaging applications in the semiconductor industry. Fully automated analysis prevents...
Handheld Coating Thickness Measurement Instrument -- DELTASCOPE® FMP10
Handheld Coating Thickness Measurement Instrument -- DELTASCOPE® FMP30
Handheld Coating Thickness Measurement Instrument -- DUALSCOPE® FMP20
Handheld Coating Thickness Measurement Instrument -- DUALSCOPE® FMP40
Handheld Coating Thickness Measurement Instrument -- ISOSCOPE® FMP10
Handheld Coating Thickness Measurement Instrument -- ISOSCOPE® FMP30
The handheld coating thickness measurement devices from the FMP10 to FMP40 range deliver precise results and the various measurement techniques available make them highly flexible. Models are available with magnetic...
X-Ray Fluorescence Measuring Instrument for Fast and Non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys -- FISCHERSCOPE® X-RAY XAN® 220 / 222
X-Ray Fluorescence Measuring Instrument for Fast and Non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys -- FISCHERSCOPE® X-RAY XAN® 250 / 252
X-Ray Fluorescence Measuring Instrument for Fast and Non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys -- FISCHERSCOPE® X-RAY XAN® 315
The main application of the instruments from the XAN® range is coating thickness measurement and analysis of gold and other precious-metal alloys. Products in this range stand out through...
X-Ray Fluorescence Measuring Instrument with a Programmable XY-Stage and Z-Axis for Automated Measurements of very thin Coatings and for Trace Analysis -- FISCHERSCOPE® X-RAY XDV®-SDD The models of the XDV® range are the most powerful X-ray fluorescence instruments in the Fischer portfolio. They are equipped with a highly sensitive silicon drift detector (SDD) as...
Universal Multi-Measuring System for Coating Thickness Measurement and Material Testing -- FISCHERSCOPE® MMS® PC2 The modular measurement system FISCHERSCOPE MMS PC2 with the Windows™ CE operating system is the ideal solution for highly precise coating thickness measurement and material testing. Networking capability via LAN...
Handheld Coating Thickness Measurement Instrument -- SR-SCOPE® RM­P30-S The portable device uses the 4-point resistance method, which is optimally suited for coating thickness measurement of thin layers, for example on multi-layer boards. Here, several copper layers are separated...
High-precision Ultrasound Device Designed for Ultra-fine, Non-destructive Wall Thickness Measurement -- FISCHERSCOPE® UMP 150 The UMP 150 is a high-precision ultrasound device designed for ultra-fine, non-destructive wall thickness measurement. It uses single-element probes and a high-frequency square wave generator (30 MHz), which together ensure...
High Performance X-Ray Fluorescence Measuring Instrument with Vacuum Chamber for non-destructive Coating Thickness Measurement and Material Analysis -- FISCHERSCOPE® X-RAY XUV® 773 The vacuum measurement chamber of devices in the XUV® range enables the verification of light materials from sodium onwards by means of X-ray fluorescence analysis (RFA). Because of the...
Handheld Coating Thickness Measurement Instrument -- PHASCOPE® PMP10
Handheld Coating Thickness Measurement Instrument -- PHASCOPE® PMP10 Duplex
Using phase-sensitive measurement techniques, the PMP10 and PMP10 DUPLEX are also suitable for coating thickness measurement on rough surfaces or for nickel layers on steel. The PMP10 DUPLEX is the...
Desktop Coating Thickness Measurement Instrument -- GOLDSCOPE With its GOLDSCOPE series, Fischer offers a tailored solution for the non-destructive testing of gold and precious metals. The hardware and software of these robust X-ray fluorescence instruments is adapted...
X-Ray Fluorescence Measuring Instrument for Manual or Automated Coating Thickness Measurements and Analysis -- FISCHERSCOPE® X-RAY XDL® Series
X-Ray Fluorescence Measuring Instrument with a Programmable XY-Stage and Z-Axis for Automated Measurements of thin Coatings and for Material Analysis -- FISCHERSCOPE® X-RAY XDAL® 237
With motor-driven axes (optional) and measurement direction from top to bottom, the measurement instruments from the XDL® range enable automated serial tests. A variety of versions – differing in...
Handheld Coating Thickness Measurement Instrument -- DUALSCOPE® FM­P100/150 With the DUALSCOPE® FMP100 and FMP150, Fischer offers high-performance handheld measurement instruments for demanding, variable tasks in professional coating thickness measurement. Equipped with a touchscreen and the Windows™ CE...