Fischer Technology, Inc. Desktop Measurement Instrument BETASCOPE®

Description
BETASCOPE offers the broadest variety of material combinations of all the FISCHER measurement instruments. Through the deployment of beta radiation (electrons), BETASCOPE does not need to rely on the magnetic or electrical properties of the sample for coating thickness measurement. As a result, it is possible to measure the thickness of coatings of any type of layer on any type of substrate, so long as there is a difference of at least 5 atomic numbers between coating and substrate materials. As a plug-in module for the universal measurement system MMS PC2, BETASCOPE can be combined with many other measurement techniques, while simultaneously profiting from the advantages of MMS PC2. Features: Non-destructive measurement by means of the beta backscatter method Measures virtually any combination of coating and substrate Ready to measure without any special preparation; the measurement itself takes just seconds No chemicals or consumable materials needed for the measurement Measurement according to DIN EN ISO 3543 and ASTM B567a Implemented as a plug-in module for the universal measurement system MMS PC2 Numerous ancillary options available Areas of application: Nanocoatings Solar cell coatings Single layers in electroplating Organic paint coatings on any kind of substrate Anti-corrosion coatings such as oil in the metal producing and processing industry Foils, textiles, fabrics and other organic materials
Datasheet
Description
BETASCOPE offers the broadest variety of material combinations of all the FISCHER measurement instruments. Through the deployment of beta radiation (electrons), BETASCOPE does not need to rely on the magnetic or electrical properties of the sample for coating thickness measurement. As a result, it is possible to measure the thickness of coatings of any type of layer on any type of substrate, so long as there is a difference of at least 5 atomic numbers between coating and substrate materials. As a plug-in module for the universal measurement system MMS PC2, BETASCOPE can be combined with many other measurement techniques, while simultaneously profiting from the advantages of MMS PC2. Features: Non-destructive measurement by means of the beta backscatter method Measures virtually any combination of coating and substrate Ready to measure without any special preparation; the measurement itself takes just seconds No chemicals or consumable materials needed for the measurement Measurement according to DIN EN ISO 3543 and ASTM B567a Implemented as a plug-in module for the universal measurement system MMS PC2 Numerous ancillary options available Areas of application: Nanocoatings Solar cell coatings Single layers in electroplating Organic paint coatings on any kind of substrate Anti-corrosion coatings such as oil in the metal producing and processing industry Foils, textiles, fabrics and other organic materials
Datasheet

Suppliers

Company
Product
Description
Supplier Links
Desktop Measurement Instrument - BETASCOPE® - Fischer Technology, Inc.
Windsor, CT, USA
Desktop Measurement Instrument
BETASCOPE®
Desktop Measurement Instrument BETASCOPE®
BETASCOPE offers the broadest variety of material combinations of all the FISCHER measurement instruments. Through the deployment of beta radiation (electrons), BETASCOPE does not need to rely on the magnetic or electrical properties of the sample for coating thickness measurement. As a result, it is possible to measure the thickness of coatings of any type of layer on any type of substrate, so long as there is a difference of at least 5 atomic numbers between coating and substrate materials. As a plug-in module for the universal measurement system MMS PC2, BETASCOPE can be combined with many other measurement techniques, while simultaneously profiting from the advantages of MMS PC2. Features: Non-destructive measurement by means of the beta backscatter method Measures virtually any combination of coating and substrate Ready to measure without any special preparation; the measurement itself takes just seconds No chemicals or consumable materials needed for the measurement Measurement according to DIN EN ISO 3543 and ASTM B567a Implemented as a plug-in module for the universal measurement system MMS PC2 Numerous ancillary options available Areas of application: Nanocoatings Solar cell coatings Single layers in electroplating Organic paint coatings on any kind of substrate Anti-corrosion coatings such as oil in the metal producing and processing industry Foils, textiles, fabrics and other organic materials

BETASCOPE offers the broadest variety of material combinations of all the FISCHER measurement instruments. Through the deployment of beta radiation (electrons), BETASCOPE does not need to rely on the magnetic or electrical properties of the sample for coating thickness measurement. As a result, it is possible to measure the thickness of coatings of any type of layer on any type of substrate, so long as there is a difference of at least 5 atomic numbers between coating and substrate materials. As a plug-in module for the universal measurement system MMS PC2, BETASCOPE can be combined with many other measurement techniques, while simultaneously profiting from the advantages of MMS PC2.

Features:

  • Non-destructive measurement by means of the beta backscatter method
  • Measures virtually any combination of coating and substrate
  • Ready to measure without any special preparation; the measurement itself takes just seconds
  • No chemicals or consumable materials needed for the measurement
  • Measurement according to DIN EN ISO 3543 and ASTM B567a
  • Implemented as a plug-in module for the universal measurement system MMS PC2
  • Numerous ancillary options available

Areas of application:

  • Nanocoatings
  • Solar cell coatings
  • Single layers in electroplating
  • Organic paint coatings on any kind of substrate
  • Anti-corrosion coatings such as oil in the metal producing and processing industry
  • Foils, textiles, fabrics and other organic materials
Supplier's Site Datasheet

Technical Specifications

  Fischer Technology, Inc.
Product Category Dimensional Gages and Instruments
Product Number BETASCOPE®
Product Name Desktop Measurement Instrument
Mounting / Loading Options Handheld or Portable; Benchtop or Floor
Unlock Full Specs
to access all available technical data

Similar Products

Box Gauge System - MTG - ABB Measurement & Analytics
ABB Measurement & Analytics
Specs
Mounting / Loading Options Benchtop or Floor
Gage / Instrument Type Gaging System or Station
Gaging Technology Electronic
View Details
Leaf Spring Hole ID Measurement Machine - RF096-30/75-120 - RIFTEK EUROPE Sp. z.o.o.
Specs
Measurement Scale / Units Metric
Gage / Instrument Type Laser micrometer; Bore Gage; Depth Gage
Gaging Technology Optical; Non-contact
View Details
Dial Indicator - D-R / D-L / D-C - Imao-Fixtureworks
Specs
Measurement Scale / Units Metric
Gage / Instrument Type Indicator / Comparator
View Details
Thickness measurement system - C15151-01 - Hamamatsu Photonics
Specs
Measurement Scale / Units Metric
Gaging Technology Optical
Attribute Measurement Capability Thickness Gage
View Details