Fischer Technology, Inc. X-Ray Fluorescence Measuring System for Continuous In-line Measurement and Analysis of Thin Coatings FISCHERSCOPE® X-RAY 5000 Series

Description
As modular units, the instruments of the X-RAY 5000 range can be easily integrated into manufacturing lines. For example, when coatings on large-surface substrates such as tin sheets must be measured, X-RAY 5000 is the ideal solution. Depending on the base and coating materials, the X-ray source, detector and primary filter can be customized to the customer's needs. Features Continuous measurement during ongoing processes, with connection to production systems Flexible application: for vacuum or air, on surfaces up to 400°C Particularly robust design and construction for sustainably precise measurements under harsh conditions Outstandingly well-suited to coating thickness measurement and material analysis on products with large surfaces Applications: Coating Thickness Measurement Thickness of CIGS, CIS, CdTe and CdS layers in the solar industry Thin layers a few µm thick on metal strips, metallic foil and plastic foils Material Analysis Composition of CIGS, CIS, CdTe and CdS layers in photovoltaics Metal coatings in continuous production processes Process monitoring in sputter and electroplating plants
Datasheet
Description
As modular units, the instruments of the X-RAY 5000 range can be easily integrated into manufacturing lines. For example, when coatings on large-surface substrates such as tin sheets must be measured, X-RAY 5000 is the ideal solution. Depending on the base and coating materials, the X-ray source, detector and primary filter can be customized to the customer's needs. Features Continuous measurement during ongoing processes, with connection to production systems Flexible application: for vacuum or air, on surfaces up to 400°C Particularly robust design and construction for sustainably precise measurements under harsh conditions Outstandingly well-suited to coating thickness measurement and material analysis on products with large surfaces Applications: Coating Thickness Measurement Thickness of CIGS, CIS, CdTe and CdS layers in the solar industry Thin layers a few µm thick on metal strips, metallic foil and plastic foils Material Analysis Composition of CIGS, CIS, CdTe and CdS layers in photovoltaics Metal coatings in continuous production processes Process monitoring in sputter and electroplating plants
Datasheet

Suppliers

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X-Ray Fluorescence Measuring System for Continuous In-line Measurement and Analysis of Thin Coatings - FISCHERSCOPE® X-RAY 5000 Series - Fischer Technology, Inc.
Windsor, CT, USA
X-Ray Fluorescence Measuring System for Continuous In-line Measurement and Analysis of Thin Coatings
FISCHERSCOPE® X-RAY 5000 Series
X-Ray Fluorescence Measuring System for Continuous In-line Measurement and Analysis of Thin Coatings FISCHERSCOPE® X-RAY 5000 Series
As modular units, the instruments of the X-RAY 5000 range can be easily integrated into manufacturing lines. For example, when coatings on large-surface substrates such as tin sheets must be measured, X-RAY 5000 is the ideal solution. Depending on the base and coating materials, the X-ray source, detector and primary filter can be customized to the customer's needs. Features Continuous measurement during ongoing processes, with connection to production systems Flexible application: for vacuum or air, on surfaces up to 400°C Particularly robust design and construction for sustainably precise measurements under harsh conditions Outstandingly well-suited to coating thickness measurement and material analysis on products with large surfaces Applications: Coating Thickness Measurement Thickness of CIGS, CIS, CdTe and CdS layers in the solar industry Thin layers a few µm thick on metal strips, metallic foil and plastic foils Material Analysis Composition of CIGS, CIS, CdTe and CdS layers in photovoltaics Metal coatings in continuous production processes Process monitoring in sputter and electroplating plants

As modular units, the instruments of the X-RAY 5000 range can be easily integrated into manufacturing lines. For example, when coatings on large-surface substrates such as tin sheets must be measured, X-RAY 5000 is the ideal solution. Depending on the base and coating materials, the X-ray source, detector and primary filter can be customized to the customer's needs.

Features

  • Continuous measurement during ongoing processes, with connection to production systems
  • Flexible application: for vacuum or air, on surfaces up to 400°C
  • Particularly robust design and construction for sustainably precise measurements under harsh conditions
  • Outstandingly well-suited to coating thickness measurement and material analysis on products with large surfaces

Applications:

Coating Thickness Measurement

  • Thickness of CIGS, CIS, CdTe and CdS layers in the solar industry
  • Thin layers a few µm thick on metal strips, metallic foil and plastic foils

Material Analysis

  • Composition of CIGS, CIS, CdTe and CdS layers in photovoltaics
  • Metal coatings in continuous production processes
  • Process monitoring in sputter and electroplating plants
Supplier's Site Datasheet

Technical Specifications

  Fischer Technology, Inc.
Product Category Dimensional Gages and Instruments
Product Number FISCHERSCOPE® X-RAY 5000 Series
Product Name X-Ray Fluorescence Measuring System for Continuous In-line Measurement and Analysis of Thin Coatings
Mounting / Loading Options Benchtop or Floor
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