Fischer Technology, Inc. Datasheets for X-ray Instruments and X-ray Systems

X-ray instruments and X-ray systems use penetrating X-rays or gamma radiation to capture images of the internal structure of a part or finished product.
X-ray Instruments and X-ray Systems: Learn more

Product Name Notes
X-Ray Fluorescence Measuring System for Continuous In-line Measurement and Analysis of Thin Coatings -- FISCHERSCOPE® X-RAY 5000 Series As modular units, the instruments of the X-RAY 5000 range can be easily integrated into manufacturing lines. For example, when coatings on large-surface substrates such as tin sheets must be...
X-ray Fluorescence Instrument -- FISCHERSCOPE® X-RAY XAN® 500 Handheld, desktop, inline: the XAN®500 X-ray fluorescence instrument is Fischer’s most versatile yet. It can be used as a handheld device, as a fully enclosed desktop unit or...
X-Ray Fluorescence Measuring Instrument for Fast and Non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys -- FISCHERSCOPE® X-RAY XUL® Series Measurement instruments from the XUL® series are the solution of choice wherever the need is to determine coating thicknesses quickly and very precisely in electroplating or electronics manufacturing. The...
X-Ray Fluorescence Measuring System for Continuous In-line Measurement and Analysis -- FISCHERSCOPE® X-RAY 4000 Series The FISCHERSCOPE X-RAY 4000 is specially designed for coating thickness measurement and material analysis during strip electroplating processes. This measurement system has already been installed over 300 times in electroplating...
EDXRF Instrument for Non-destructive Microstructure Wafer Metrology -- FISCHERSCOPE® X-RAY XDV®-ยต SEMI The FISCHERSCOPE X-RAY XDV-μ SEMI is an automated measurement system optimized for the quality control of micro-structures in complex 2.5D/3D packaging applications in the semiconductor industry. Fully automated analysis prevents...
X-Ray Fluorescence Measuring Instrument for Fast and Non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys -- FISCHERSCOPE® X-RAY XAN® 220 / 222
X-Ray Fluorescence Measuring Instrument for Fast and Non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys -- FISCHERSCOPE® X-RAY XAN® 250 / 252
X-Ray Fluorescence Measuring Instrument for Fast and Non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys -- FISCHERSCOPE® X-RAY XAN® 315
The main application of the instruments from the XAN® range is coating thickness measurement and analysis of gold and other precious-metal alloys. Products in this range stand out through...
X-Ray Fluorescence Measuring Instrument with a Programmable XY-Stage and Z-Axis for Automated Measurements of very thin Coatings and for Trace Analysis -- FISCHERSCOPE® X-RAY XDV®-SDD The models of the XDV® range are the most powerful X-ray fluorescence instruments in the Fischer portfolio. They are equipped with a highly sensitive silicon drift detector (SDD) as...
High Performance X-Ray Fluorescence Measuring Instrument with Vacuum Chamber for non-destructive Coating Thickness Measurement and Material Analysis -- FISCHERSCOPE® X-RAY XUV® 773 The vacuum measurement chamber of devices in the XUV® range enables the verification of light materials from sodium onwards by means of X-ray fluorescence analysis (RFA). Because of the...
Desktop Coating Thickness Measurement Instrument -- GOLDSCOPE With its GOLDSCOPE series, Fischer offers a tailored solution for the non-destructive testing of gold and precious metals. The hardware and software of these robust X-ray fluorescence instruments is adapted...
X-Ray Fluorescence Measuring Instrument for Manual or Automated Coating Thickness Measurements and Analysis -- FISCHERSCOPE® X-RAY XDL® Series
X-Ray Fluorescence Measuring Instrument with a Programmable XY-Stage and Z-Axis for Automated Measurements of thin Coatings and for Material Analysis -- FISCHERSCOPE® X-RAY XDAL® 237
With motor-driven axes (optional) and measurement direction from top to bottom, the measurement instruments from the XDL® range enable automated serial tests. A variety of versions – differing in...