Accuris Datasheets for Standards and Technical Documents
Standards and technical documents includes standards, codes, regulation, handbooks, manuals, comprehensive guides and other formal publications. Standards, codes, and regulation establish uniform specifications, procedures or technical criteria.
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| Product Name | Notes |
|---|---|
| Accessory Drives and Mounting Flanges (Metric Sizes) - Part 1: Design Criteria | |
| Accessory Drives and Mounting Flanges (Metric Sizes) - Part 2: Dimensions | |
| Aerospace - Bihexagonal Drives - Wrenching Configuration - Metric Series | |
| Aerospace - Bolts, with MJ Threads, in Titanium Alloys, Strength Class 1 100 MPa - Procurement Specification | |
| Aerospace - Nuts, Anchor, Self-Locking, Floating, Self-Aligning, Single Lug, with MJ Threads, Classifications: 900 MPa (at Ambient Temperature)/235 Degrees C, 900 MPa (at Ambient Temperature)/315 Degrees C, 900 MPa (at... | |
| Aerospace - Nuts, Anchor, Self-Locking, Floating, Self-Aligning, Two Lug, with MJ Threads, Classifications: 900 MPa (at Ambient Temperature)/235 Degrees C, 900 MPa (at Ambient Temperature)/315 Degrees C, 900 MPa (at... | |
| Aerospace - Nuts, Bihexagonal, Self-Locking, MJ Threads, Classifications: 1 100 MPa (at Ambient Temp)/425 Deg. C, 1 100 MPa (at Ambient Temp)/650 Deg. C 1 210 MPa (at Ambient Temp)/425... | |
| Aerospace - Nuts, Hexagonal, Plain, Normal Height, Normal Across Flats, with MJ Threads, Classifications: 600MPa(at Amb Temp)/120 Deg C,600MPa(at Amb Temp)/235 Deg C,900MPa(at Amb Temp)/425 Deg C,1100MPa(at Amb Temp)/235 Deg... | |
| Aerospace - Nuts, Hexagonal, Plain, Reduced Height, Reduced Across Flats, with MJ Threads, Classifications: 450 MPa (at Ambient Temp)/425 Deg C, 600 MPa (at Ambient Temp)/235 Deg C, 600 MPa... | |
| Aerospace - Nuts, Hexagonal, Slotted (Castellated), Reduced Height, Reduced Across Flats, with MJ Threads, Classifications: 450 MPa (at Amb Temp)/425 Deg C, 600 MPa (at Amb Temp)/235 Deg C, 600... | |
| Aerospace - Screws, 100 Degrees Reduced Countersunk Head, Internal Offset Cruciform Ribbed or Unribbed Drive, Normal Shank, Short or Medium Length MJ Threads, Metallic Material, Coated or Uncoated, Strength Classes... | |
| Aerospace - Screws, Pan Head, Internal Offset Cruciform Ribbed or Unribbed Drive, Pitch Diameter Shank, Long Length MJ Threads, Metallic Material, Coated or Uncoated, Strength Classes Less Than or Equal... | |
| Aerospace - Screws, Pan Head, Internal Offset Cruciform Ribbed or Unribbed Drive, Stepped Shank, Short or Medium Length MJ Threads, Metallic Material, Coated or Uncoated, Strength Classes Less Than or... | |
| Aerospace - Screws, Pan Head, Internal Offset Cruciform Ribbed or Unribbed Drive, Threaded to Head, Metallic Material, Coated or Uncoated, Strength Classes Less Than or Equal to 1 100 MPa... | |
| AEROSPACE SERIES - Nuts, hexagonal, ordinary, thin, slotted and castle, unified threads, alloy steel, cadmium plated - Specification Classification Rm = 145 600 lbf/in2 (1 004 MPa) in mating male... | |
| AEROSPACE SERIES \x96 Bolts, hexagonal heads with optional safety locking wire holes, unified threads, corrosion-resisting or heat-resisting steels, plain finish \x96 Specification Classification CR steel Rm = 127 600 lbf/in2... | |
| AEROSPACE SERIES Bolts, shear, hexagonal heads, close tolerance shank, unified threads, alloy steel, cadmium plated (on head and thread only) \x96 Specification Classification Rm = 127 600 \x96 156 600... | |
| Aerospace-Nuts, Hex, Plain, Reduced Height, Normal Across Flats, with MJ Threads, Class: 450 MPa(at Amb Temp)/120 Deg C, 450 MPa(at Amb Temp)/235 Deg C, 600 MPa(at Amb Temp)/425 Deg C,... | |
| Aerospace-Nuts, Hex, Slotted (Castellated), Reduced Height, Normal Across Flats, with MJ Threads, Class:450 MPa(at Amb Temp)/120 Deg C,450MPa(at Amb Temp)/235 Deg C,600MPa(at Amb Temp)/425 Deg C,900MPa(at Amb Temp)/235 Deg C,900MPa(at... | |
| Aerospace-Nuts, Hexagonal, Slotted (Castellated), Normal Hgt, Normal Across Flats, with MJ Threads, Class: 600MPa(at Amb Temp)/120 Deg C,600MPa(at Amb Temp)/235 Deg C,900MPa(at Amb Temp)/425 Deg C,1100MPa(at Amb Temp)/235 Deg C,1100MPa(at... | |
| AMD 1 Semiconductor Devices of Assessed Quality: Microwave Semiconductor Switches (Without Integrated Driver Circuits) | |
| Assessment for the performance of chemical inhibitors for use in domestic central heating and cooling water systems \x96 Test method | |
| Black bolts and nuts small hexagon and small square B.S.W and B.S.F | |
| Blank detail specification for - Quartz crystal oscillators of assessed quality - Full assessment level | |
| Blank Detail Specification for Fixed Insulated (Unshielded) r.f. Inductors at the Full Assessment Level | |
| Blank detail specification for fixed insulated (unshielded) R.F. inductors suitable for surface mounting at the full assessment level | |
| Blank Detail Specification for Quartz Crystal Filters of Assessed Quality: Full Assessment Level | |
| Blank detail specification for Quartz Crystal Units of Assessed Quality. Basic Assessment Level | |
| Blank detail specification for radio interference suppression filters of assessed quality. Basic assessment level | |
| Bolts - Test Methods | |
| Bolts, large bihexagonal head, normal shank, short or medium length MJ threads, metallic material, coated or uncoated, strength classes 1250 MPa to 1800 Mpa - Dimensions | |
| Bolts, Large Hexagonal Head, Normal or Pitch Diameter Shank, Long Length MJ Threads, Metallic Material, Coated or Uncoated, Strength Classes Less Than or Equal to 1100 MPa - Dimensions | |
| Bolts, Normal Bihexagonal Head, Normal or Pitch Diameter Shank, Long Length MJ Threads, Metallic Material, Coated or Uncoated, Strength Classes Less Than or Equal to 1100 MPa - Dimensions | |
| Bolts, normal bihexagonal head, normal shank, short or medium length MJ threads, metallic material, coated or uncoated, strength classes less than or equal to 1100 MPa - Dimensions | |
| Bolts, Normal Spline Head, Normal or Pitch Diameter Shank, Long Length MJ Threads, Metallic Material, Coated or Uncoated, Strength Classes Less Than or Equal to 1100 MPa - Dimensions | |
| Bolts, normal spline head, normal shank, short or medium length MJ threads, metallic material, coated or uncoated, strength classes less than or equal to 1100 MPa - Dimensions | |
| Bolts, Reduced Bihexagonal Head, Normal or Pitch Diameter Shank, Long Length MJ Threads, Metallic Material, Coated or Uncoated, Strength Classes Less Than or Equal to 1 275 MPa - Dimensions... | |
| Bolts, shear, hexagonal heads, close tolerance shank, unified threads, low alloy steel, cadmium plated (on head and thread only) - Specification Classification Rm = 123 200 \x96 145 600 lbf/in2... | |
| Bolts, with MJ Threads, Made of Heat-Resistant Nickel-Based Alloy, Strength Class 1 550 MPa - Procurement Specification | |
| British Association (B.A.) Low Screws and Nuts for Aeronautical Purposes | |
| Cable Fitting Accessories of Assessed Quality for Circular Electrical Connectors: Generic Data, Methods of Test and Rules for the Preparation of Detail Specifications | |
| Capability Approval for Custom-Built Capacitors and Capacitor Modules: Generic Data and Methods of Test | |
| Code of practice for design of the airtightness of ceilings in pitched roofs | |
| Code of practice for fire safety in the design, management and use of buildings | |
| Code of practice for non-automatic fire-fighting systems in buildings | |
| Code of practice for safe working on lifting platforms | |
| Components for residential sprinkler systems - Specification and test methods for residential sprinklers | |
| Connectors of Assessed Quality for Optical Fibres and Cables: Generic Data and Methods of Test | |
| Density-composition tables for aqueous solutions of hydrochloric acid | |
| Density-composition tables for aqueous solutions of nitric acid | |
| Design of accessible and adaptable general needs housing \x96 Code of practice | |
| Designation of the structure of single plied and cable yarns | |
| Detail Requirements for a Silicon N-P-N High Frequency Planar Transistor | |
| Detail Requirements for Silicon Voltage-Regulator Diodes | |
| Detail Specification for a Rotary Wafer Switch (Manual) of Assessed Quality. 30 mm Single Hole Mounting | |
| Detail Specification for a Rotary Wafer Switches of Assessed Quality, Central Hole Mounting with Solder Terminations, Spindle or Panel Sealed or Non-Sealed. Nominal Panel Dimensions 30mm. Full Assessment Level | |
| Detail specification for all-or-nothing electromechanical relays. Enclosed plug-in construction. Light and medium duty capability with continuous rating. Basic assessment level | |
| Detail Specification for Circular Rigid Waveguide Tubing - Standard Wall Thickness - General Application Category | |
| Detail specification for cold welded seal quartz crystal units for oscillator applications - DK enclosure, 6.0 to 25 MHz frequency range - Fundamental thickness-shear mode, AT-cut, for operation over wide... | |
| Detail specification for cold welded seal quartz crystal units for oscillator applications - DN, 47 U/2, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency... | |
| Detail specification for cold welded seal quartz crystal units for oscillator applications - DN, 47 U/2, DQ and DP enclosures, 17 to 75 MHz frequency range - Third overtone thickness-shear... | |
| Detail specification for cold welded seal quartz crystal units for oscillator applications - DN, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges -... | |
| Detail specification for cold welded seal quartz crystal units for oscillator applications - DN, DQ and DP enclosures, 50 to 125 MHz frequency range - Fifth overtone thickness-shear mode, AT-cut,... | |
| Detail specification for cold welded seal quartz crystal units for oscillator applications. DK enclosure, 25 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature... | |
| Detail specification for cold welded seal quartz crystal units for oscillator applications. DK enclosure, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature... | |
| Detail specification for cold welded seal quartz crystal units for oscillator applications. DK enclosure, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature... | |
| Detail specification for cold welded seal quartz crystal units for oscillator applications. DK enclosure, 6.0 to 25 MHz frequency range. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges... | |
| Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation... | |
| Detail specification for cold-welded seal quartz crystal units for oscillator applications. DK enclosures, 25 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges... | |
| Detail specification for fixed aluminium electrolytic capacitors (type 1). Non-solid electrolyte. Cylindrical, polarized, insulated case, screw terminations at one end. Full assessment level | |
| Detail Specification for Fixed Capacitors of Assessed Quality: Monolithic Ceramic Dielectric Type 1B. Full Assessment Level | |
| Detail Specification for Fixed Capacitors of Assessed Quality: Monolithic Ceramic Dielectric Type 2C1. Full Assessment | |
| Detail Specification for Fixed Capacitors of Assessed Quality: Monolithic Ceramic Dielectric Type 2F4. Full Assessment | |
| Detail Specification for Fixed Capacitors, Tantalum Electrolytic, Porous Anode, Polar, Non-Solid Electrolyte, Tubular Metallic Case, Insulated, PTFE/ Elastomer Seal, Axial Wire Terminations. Full Plus Additional Assessment | |
| Detail Specification for Fixed Capacitors, Tantalum Electrolytic, Porous Anode, Polar, Solid Electrolyte, Cylindrical Insulated and Uninsulated Metal Case, Hermetic Seal, Axial Terminations. Full Plus Additional Assessment | |
| Detail Specification for Fixed Ceramic Dielectric Capacitors, Type 1 and Type 2; Rectangular Monolithic Chips. Full Assessment Level | |
| Detail specification for fixed insulated (unshielded) radio frequency inductors Wire wound on ferrite, iron dust or phenolic cylindrical former Full assessment level | |
| Detail specification for fixed low power non-wirewound insulated resistors (type 1). Metal film, helically cut, axial wire terminations. Basic assessment level | |
| Detail specification for fixed metallized mica dielectric capacitors (style C2AEA). Rectangular non-metallic case, axial wires at both ends. General application category | |
| Detail Specification for Fixed Metallized Polyethylene-Metalli zed Polycarbonate Film Dielectric Capacitors. Rectangular Non-Metallic Case, Axial or Radial Terminations, Centrally Spaced. Full Assessment | |
| Detail specification for Fixed polystyrene film dielectric extended foil capacitors - Rectangular non-metallic case, unidirectional terminations - Full plus additional assessment level | |
| Detail Specification for Fixed Polystyrene Foil Dielectric Capacitors with Insulated Tubular Case and Axial Terminations. Capacitance Range 5pF to 500nF. Full Assessment | |
| Detail Specification for Fixed Polystyrene Foil Dielectric Capacitors with Insulated Tubular Case and Axial Terminations. Full Assessment | |
| Detail Specification for Flat Rectangular (8.33:1) Rigid Waveguide Tubing - Standard Wall Thickness - General Application Category | |
| Detail specification for General purpose silicon signal diodes - 150 mA, 150 V, hermetically sealed, glass encapsulation - General application category Q | |
| Detail specification for glass-encapsulated quartz crystal units for oscillator applications. DA, CY and CZ enclosures, 1.4 to 30 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut,... | |
| Detail specification for glass-encapsulated quartz crystal units for oscillator applications. DA, CY and CZ enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow... | |
| Detail specification for glass-encapsulated quartz crystal units for oscillator applications. DA, CY and CZ enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide... | |
| Detail specification for glass-encapsulated quartz crystal units for oscillator applications. DA, CY and CZ enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow... | |
| Detail specification for glass-encapsulated quartz crystal units for oscillator applications. DA, CY and CZ enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide... | |
| Detail Specification for Lead-Screw Actuated Wirewound or Non-Wirewound Preset Potentiometers Rectangular and Square Forms, Container Sealed, Actuating Device Insulated from Resistive Element, Slipping Clutch at Each End of Travel Full... | |
| Detail specification for lever operated switches, quick-make quick-break. Assessment levels as in individual detail specifications | |
| Detail Specification for Low Power N-P-N, 20 V, 300 mW Switching Transistor of Assessed Quality, Ambient Rated, Hermetic Encapsulation | |
| Detail specification for low power silicon n-p-n switching transistors - 20 V, planar epitaxial, ambient rated, hermetic encapsulation - Full plus additional assessment level | |
| Detail specification for low power silicon n-p-n switching transistors - 65 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version) - Full plus additional assessment level | |
| Detail specification for low power silicon n-p-n switching transistors - 65 V, planar epitaxial, ambient rated, hermetic encapsulation - Full plus additional assessment level | |
| Detail specification for low power silicon p-n-p switching transistors - 25 V, planar epitaxial, ambient rated, hermetic encapsulation - Full plus additional assessment level | |
| Detail specification for low power silicon p-n-p switching transistors - 65 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version) - Full plus additional assessment level | |
| Detail specification for low power silicon p-n-p switching transistors - 65 V, planer epitaxial, ambient rated, hermetic encapsulation - Full plus additional assessment level | |
| Detail Specification for Medium Current Rectifier Diodes (3A 300 v, 600 v, 900 v, 1200 V) Hermetically Sealed. Full Assessment Level | |
| Detail Specification for Medium Flat Rectangular (4:1) Rigid Waveguide Tubing - Standard wall thickness - General Application Category | |
| Detail specification for microswitches (sensitive switches). 30 mm nominal body dimension, plunger actuated. Assessment levels as in individual detail specifications | |
| Detail specification for Multi-contact circular electrical connectors for d.c. and low frequency applications - Bayonet coupling with front release, rear removable crimp contacts - Full assessment level | |
| Detail specification for multi-contact circular electrical connectors for d.c. and low frequency applications. Bayonet coupling non-barrier sealed with rear release, rear removable crimp contacts and barrier sealed with non-removable solder... | |
| Detail specification for multi-contact edge socket electrical connectors. Single or double sided, open ended, guide key location, replaceable contacts, through-board solder or wire wrap terminations. Full assessment level | |
| Detail specification for multi-contact rectangular electrical connectors with integral metal housing (shell) for d.c. and low frequency applications. Unsealed with trapezoidal polarized housing and non-removable solder contacts. Full assessment level... | |
| Detail specification for multi-contact rectangular electrical connectors with moulded bodies for d.c. and low frequency applications. Unsealed with end guides or jackscrew couplings and non-removable solder contacts. Full assessment level... | |
| Detail specification for multi-contact two-part printed board electrical connectors with replaceable contacts and through board solder, wire wrap or crimp terminations. Full assessment level | |
| Detail Specification for Ordinary Rectangular (2:1) Rigid Waveguide Tubing - Standard wall thickness - General Application Category | |
| Detail Specification for Radio Frequency Coaxial Connector (Series BNC), Unsealed, Soldered, Captive Contact 50 ohms, Basic Assessment Level | |
| Detail specification for radio frequency coaxial connectors (series SMA). 50 ohms , unsealed, soldered, centre contact, clamp outer for flexible cables, solder outer for semi-rigid cables. Full assessment level | |
| Detail specification for radio frequency coaxial connectors (series SMA). 50 ohms , unsealed, soldered, centre contact, clamp outer for flexible cables, solder outer for semi-rigid cables. Part 3: Parameters. Full... | |
| Detail Specification for Radio Frequency Connectors (Series SMA), 50 ohms, Unsealed, Soldered, Centre Contact, Clamp Outer for Flexible Cables, Solder Outer for Semi-Rigid Cables: Part 2: Control Drawings, Mating Face... | |
| Detail specification for radio frequency connectors (series SMC) \x97 Unsealed, soldered, captive contact 50 Ohms screw coupling \x97 Full assessment level | |
| Detail specification for radio frequency connectors (Type BNC) - Sealed, soldered, captive contact, 50 Omega - Full assessment level | |
| Detail specification for radio frequency connectors (type BNC). Sealed, soldered, captive contact, 50 ohms. Part 2: Control drawings. Mating face details and gauge information | |
| Detail specification for radio frequency connectors (type BNC). Unsealed, soldered, captive contact, 50 ohms. Full assessment level | |
| Detail specification for radio frequency connectors (type SMB) - Unsealed, soldered, captive contact, 50 ohms, snap-on couplings - Full assessment level | |
| Detail specification for resistance welded seal quartz crystal units for oscillator applications - DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges... | |
| Detail specification for resistance welded seal quartz crystal units for oscillator applications - DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range - Third overtone thickness-shear mode,... | |
| Detail specification for resistance welded seal quartz crystal units for oscillator applications - DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range - Fifth overtone thickness-shear mode,... | |
| Detail specification for silicon fast switching, double ended diodes | |
| Detail specification for silicon n-p-n high frequency transistor | |
| Detail specification for silicon n-p-n medium power transistors | |
| Detail specification for silicon n-p-n planar epitaxial transistors | |
| Detail specification for silicon n-p-n planar transistor intended for low level, low noise amplifier applications | |
| Detail specification for silicon stud mounted, reverse blocking triode thyristors | |
| Detail specification for silicon variable capacitance diodes | |
| Detail specification for silicon voltage regulator diodes - 1.0 W, 3.3 to 33 V (5 %), hermetically scaled - Full assessment level | |
| Detail specification for silicon voltage regulator diodes - 1.5 W, 3.3 to 33 V (5 %), hermetically sealed - General application category Q | |
| Detail specification for silicon voltage regulator diodes - 1.5 W, 6.8 to 200 V (5 %), hermetically sealed - General application category C | |
| Detail specification for silicon voltage regulator diodes - 400 mW, 2.7 to 33 V (5 %), hermetically sealed, glass encapsulation - General application category Q | |
| Detail specification for Single turn low power non-wirewound rotary potentiometers - Spindle insulated from resistance element, spindle and panel sealed or container, spindle and panel sealed - Full assessment level... | |
| Detail specification for six terminal device, containing two isolated high gain n-p-n silicon planar transistors | |
| Detail Specification for Solder-Sealed Quartz Crystal Units of Assessed Quality for Oscillator Applications. Full Assessment Level | |
| Detail specification for variable pre-set air dielectric capacitors (type C). Vane type without locking device, not sealed. Full assessment level | |
| Detail Specification. Fixed wirewound non-insulated resistor (Type 2) of assessed quality: axial terminations. General application category | |
| Detail specifications for silicon power rectifier diodes | |
| Double circular arc type gears - Gears for instruments and clockwork mechanisms - Part 2: Cycloidal Type Gears | |
| Electric Cable Soldering Sockets | |
| Electrical Connectors of Assessed Quality for d.c. and Low Frequency Application: Generic Data, Methods of Test and Capability Approval Procedures | |
| Electrical Refrigerators and Food Freezers for Household Use | |
| Electronic Components of Assessed Quality Detail Specification in Accordance with BS 9520 | |
| Electronic Components of Assessed Quality: Radio Frequency Connector Type SMC, Unsealed, Soldered, Captive Contact, 50 Ohm, (Screw Couplings) - Full Assessment Level - Part 2: Control Drawings - Mating Face... | |
| Electronic Components of Assessed Quality: Radio Frequency Connectors Type SMB, Unsealed, Soldered, Captive Contact 50 Ohms (Snap-On Coupling) - Full Assessment Level - Part 2: Control Drawings - Mating Face... | |
| Electronic parts of assessed quality - Coaxial mixer diodes | |
| Electronic parts of assessed quality - germanium coaxial mixed diodes | |
| Electronic parts of assessed quality - Matched pair of germanium coaxial mixer diodes | |
| Electronic parts of assessed quality - Mixer diode for use at X-band frequencies | |
| Electronic parts of assessed quality - Reverse blocking triode thyristors | |
| Electronic parts of assessed quality - Silicon avalance rectifier diode | |
| Electronic parts of assessed quality - Silicon avalanche rectifier diode | |
| Electronic parts of assessed quality - Silicon coaxial mixer diodes | |
| Electronic parts of assessed quality - Silicon coaxial resistive switching diode | |
| Electronic parts of assessed quality - Silicon microwave switching diode, rod mounted | |
| Electronic parts of assessed quality - Silicon stud mounted, power rectifier diodes | |
| Electronic parts of assessed quality - Silicon voltage regulator diode | |
| Electronic parts of assessed quality - silicon voltage regulator diodes | |
| Electronic parts of assessed quality - Silicon voltage-regulator diodes | |
| Facial recognition technology - Ethical use and deployment in video surveillance-based systems - Code of practice | |
| Fire performance of external cladding systems \x96 The application of results from BS 8414-1 and BS 8414-2 tests | |
| Fire risk assessment - Housing - Code of practice | |
| Fire risk management systems - Requirements with guidance for use | |
| Fire safety in the design, management and use of rail infrastructure \x97 Code of practice | |
| Fire safety in the design, management and use of residential buildings - Code of practice | |
| Fixed Capacitors for Use in Electronic Equipment Part 03.0: Aluminium Electrolytic Capacitors with Solid or Non-Solid Electrolyte | |
| Fixed Capacitors for Use in Electronic Equipment Part 04.0: Fixed Metallized Polyethylene Terephthalate Film Dielectric d.c. Capacitors | |
| Fixed Capacitors for Use in Electronic Equipment Part 0: Generic Specification. Specifies Terms, Definitions, Methods of Test and Inspection Requirements in the IECQ System | |
| Fixed Capacitors of Assessed Quality: Generic Data and Methods of Test N0002: Detail Specification for Fixed Mica Dielectric Capacitors of Assessed Quality: Style C2AED. General Application Category | |
| Fixed Capacitors of Assessed Quality: Generic Data and Methods of Test Section 10: Tantalum Electrolytic Capacitor Modules | |
| Fixed Capacitors of Assessed Quality: Generic Data and Methods of Test Section 8: Aluminium Electrolytic Capacitors | |
| Fixed Resistors for Use in Electronic Equipment Part 01.01: Fixed Resistors for Use Electronic Equipment Fixed Low Power Non-Wirewound Resistors Assessment Level E | |
| Fixed Resistors For Use in Electronic Equipment Part 03.01: Fixed Precision Resistors: Blank Detail Specification: Assessment Level E | |
| Fixed Resistors for Use In Electronic Equipment Part 03.0: Sectional Specification: Fixed Precision Resistors | |
| Fixed Resistors for Use in Electronic Equipment Part 04.0: Fixed Resistor Networks with Individually Measurable Resistors: Sectional Specification | |
| Fixed Resistors for Use in Electronic Equipment Part 04.1: Fixed Resistor Networks with Individually Measurable Resistors All of Equal Value and Equal Dissipation: Blank Detail Specification: Assessment Level E | |
| Fixed Resistors for Use in Electronic Equipment Part 04.2: Fixed Resistor Networks with Individually Measurable Resistors of Either Different Resistance Values or Different Rated Dissipators: Blank Detail Spec. Assessment Level... | |
| Fixed Resistors for Use in Electronic Equipment Part 05.00: Fixed Resistor Networks in Which Not All Resistors Are Individually Measurable: Sectional Specification | |
| Fixed Resistors for Use in Electronic Equipment Part 05.01: Fixed Resistor Networks in Which Not All Resistors Are Individually Measurable: Blank Detail Specification: Assessment Level E | |
| Gears for instruments and clockwork mechanisms - Part 3: Bevel gears | |
| Gears for instruments and clockwork mechanisms \x97 Part 2: Cycloidal type gears | |
| General requirements for steel protruding-head bolts of tensile strength 1250 MPa (180000 lbf/inu2) or greater | |
| General Requirements for Titanium Bolts | |
| Glass for glazing - Part 2: Terminology for work on glass | |
| Glass for Glazing Part 1: Classification | |
| Guide on High-Voltage Testing Techniques Part 2: Test Procedures | |
| Guide on High-Voltage Testing Techniques Part 3: Measuring Devices | |
| Guide on High-Voltage Testing Techniques Part 4: Application Guide for Measuring Devices | |
| Guide on high-voltage testing techniques. General | |
| Guide to the structural design of buried pipelines | |
| Guide to the structural design of buried pipes | |
| Harmonixed system of quality assessment for electronic components. Fixed capacitors for use in electric equipment - Part 02.0: Sectional specification: Fixed tantalum capacitors with solid or non-solid electrolyte | |
| Harmonized system of quality assessment for electronic components Fixed resistors for use in electronic equipment Part 01.0: Sectional specification: Fixed low power non-wirewound resistors | |
| Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment Part 0. Generic specification | |
| Harmonized system of quality assessment for electronic components. Semiconductor devices. Part 0. Generic specificaton | |
| Hexagonal Head Titanium Alloy Bolts 160 000 lbf/in2 (1100 MPa) | |
| High Alumina Cement Part 2: Metric Units | |
| Hydraulically bound materials for civil engineering purposes \x96 Specification for production and installation in pavements | |
| Inductor and Transformer Cores for Telecommunications Part 01.0: Magnetic Oxide Cores in Inductor Applications | |
| Inductor and Transformer Cores for Telecommunications Part 02.01 and Part 02.02: Magnetic Oxide Cores for Broad Band Transformers Assessment Levels A and B: Blank Detail Specification | |
| Inductor and Transformer Cores for Telecommunications Part 02.0: Magnetic Oxide Cores for Broad- Band Transformers: Sectional Specification | |
| Inductor and Transformer Cores for Telecommunications Part 03.01: Magnetic Oxide Cores for Transformers and Chokes for Power Applications. Assessment Level A | |
| Inductor and Transformer Cores for Telecommunications Part 03.0: Magnetic Oxide Cores for Transformers and Chokes for Power Applications | |
| Inductor and Transformer Cores for Telecommunications Part 0: Generic Specification | |
| Inductors and Transformer Cores for Telecommunications Part 01.01: Magnetic Oxide Cores for Inductor Applications: Blank Detail Specification: Assessment Level A | |
| Inserts, Self-Locking, with MJ Threads, Open Type, in Metallic Material, Coated or Uncoated - Dimensions | |
| Inserts, Self-Locking, with MJ Threads, Reduced Flanges, Closed Type, in Metallic Material, Coated or Uncoated - Dimensions | |
| Inserts, with Clearance Hole, in Metallic Material, Coated or Uncoated - Dimensions | |
| Inserts, with Self-Locking Floating Nut, with MJ Threads, in Metallic Material, Coated or Uncoated - Dimensions | |
| Inserts, with Self-Locking, with MJ Threads, Closed Type, in Metallic Material, Coated or Uncoated - Dimensions | |
| Integrated Electronic Circuits and Micro-Assemblies of Assessed Quality: (Qualification Approval Procedures): Generic Data and Methods of Test | |
| Intruder and hold-up alarm systems \x96 Commissioning, maintenance and remote support \x96 Code of practice | |
| Lockwire - Diameters | |
| Loco-type multitubular boilers | |
| Mastic Asphalt for Building (Limestone Aggregate) | |
| Memorandum to consumers and producers regarding the standardization of alloy steels with the object of alloy conservation | |
| Methods of Test for Safety and Protective Footwear | |
| Methods of Test for Self-Locking Nuts with Maximum Operating Temperature Greater than 425 Degrees C | |
| Methods of Test for Self-Locking Nuts with Maximum Operating Temperature Less than or Equal to 425 Degrees C | |
| MJ Threads - Part 1: General Requirements | |
| MJ Threads - Part 2: Limit Dimensions for Bolts and Nuts | |
| MJ Threads - Part 3: Limit Dimensions for Fittings for Fluid Systems | |
| Multi-Contact Rectangular Electric Connectors of Assessed Quality with Moulded Bodies, Unsealed with End Guides or Jackscrew Couplings and Front Release Rear Removable Crimp Contacts: Full Assessment Level | |
| Non-destructive testing - Guided wave testing Part 1: General guidance and principles | |
| Non-destructive testing - Guided wave testing Part 2: Basic requirements for guided wave testing of pipes, pipelines and structural tubulars | |
| Nuts, Anchor, Self-Locking, Fixed, 90 Degree Corner, Reduced Series, with Counterbore, with MJ Threads, Classifications: 1 100 MPa (at Ambient Temperature) / 235 Degrees Celsius, 1 100 MPa (at Ambient... | |
| Nuts, Anchor, Self-Locking, Fixed, 90 Degree Corner, with Counterbore, with MJ Threads, Classifications: 1 100 MPa (at Ambient Temperature) / 235 Degrees Celsius, 1 100 MPa (at Ambient Temperature) /... | |
| Nuts, Anchor, Self-Locking, Fixed, Closed Corner, Reduced Series, with Counterbore, with MJ Threads, Classifications: 1 100 MPa (at Ambient Temperature) / 235 Degrees Celsius, 1 100 MPa (at Ambient Temperature)... | |
| Nuts, Anchor, Self-Locking, Fixed, Single Lug, Reduced Series, with Counterbore, with MJ Threads, Classifications: 1 100 MPa (at Ambient Temperature) / 235 Degrees Celsius, 1 100 MPa (at Ambient Temperature)... | |
| Nuts, Anchor, Self-Locking, Fixed, Single Lug, with Counterbore, with MJ Threads, Classifications: 1 100 MPa (at Ambient Temperature)/235 Degrees Celsius, 1 100 MPa (at Ambient Temperature)/315 Degrees Celsius and 1... | |
| Nuts, Anchor, Self-Locking, Fixed, Two Lug, Reduced Series, with Counterbore, with MJ Threads, Classifications: 1 100 MPa (at Ambient Temperature) / 235 Degrees Celsius, 1 100 MPa (at Ambient Temperature)... | |
| Nuts, Anchor, Self-Locking, Fixed, Two Lug, with Counterbore, with MJ Threads, Classifications: 1 100 MPa (at Ambient Temperature) / 235 Degrees Celsius, 1 100 MPa (at Ambient Temperature) / 315... | |
| Nuts, Anchor, Self-Locking, Floating, Single Lug, with Counterbore, with MJ Threads, Classifications: 1 100 MPa (at Ambient Temperature) / 235 Degrees Celsius, 1 100 MPa (at Ambient Temperature) / 315... | |
| Nuts, Anchor, Self-Locking, Floating, Two Lug, Reduced Series, with Counterbore, with MJ Threads, Classifications: 1 100 MPa (at Ambient Temperature) / 235 Degrees Celsius, 1 100 MPa (at Ambient Temperature)... | |
| Nuts, Anchor, Self-Locking, Floating, Two Lug, with Counterbore, with MJ Threads, Classifications: 1 100 MPa (at Ambient Temperature) / 235 Degrees Celsius, 1 100 MPa (at Ambient Temperature) / 315... | |
| Nuts, Anchor, Self-Locking, Floating, Two Lug, with Incremental Counterbore, with MJ Threads, Classifications: 900MPa (at Ambient Temperature)/235 Degrees Celsius, 900 MPa (at Ambient Temperature)/315 Degrees Celsius and 900 MPa (at... | |
| Nuts, Barrel, Self-Locking, Floating, with MJ Threads, Classifications: 900 MPa (at Ambient Temperature)/235 Degrees C, 1100 MPa (at Ambient Temperature)/235 Degrees C, 1250 MPa (at Ambient Temperature)/235 Degrees C, 1550... | |
| Nuts, Bihexagonal, Self-Locking, with Counterbore and MJ Threads, Cl.: 1 100 MPa (at Ambient Temp.)/425 Degrees C, 1 100 MPa (at Ambient Temp.)/650 Degrees C, 1 210 MPa (at Ambient... | |
| Nuts, Hexagonal, Self-Locking, with Counterbore and Captive Washer, with MJ Threads, Classifications: 1 100 MPa (at Ambient Temperature)/235 Degrees Celsius, 1 100 MPa (at Ambient Temperature)/315 Degrees Celsius, 1 100... | |
| Nuts, Plain or Slotted (Castellated) - Procurement Specification | |
| Nuts, Plain or Slotted (Castellated) - Test Methods | |
| Personal financial planning - Guidance on the application of BS ISO 22222 and assessment of compliance | |
| Piezoelectric Crystal Filters of Assessed Quality: Generic Data and Methods of Test | |
| Plain Hexagon Nuts (of Class 3B UNJ Thread) | |
| Plain Hexagonal Thin Nuts (of Class 3B UNJ Thread) | |
| Printed Circuits of Assessed Quality: Generic Data and Methods of Test. Capability Approval Procedure and Rules | |
| Printed Circuits of Assessed Quality: Sectional Specification for Multilayer Flex- Rigid Printed Circuits with Through Hole Connections | |
| Processing of alarm signals by an alarm receiving centre \x97 Code of practice | |
| Procurement of Alloy Steel Bolts with Strength Classification 1100 MPa and MJ Threads | |
| Procurement of Corrosion and Heat-Resisting Steel Bolts with Strength Classification 1100 MPa and MJ Threads | |
| Procurement of Self- Locking Nuts with Non-Metallic Locking Element. Metric Series | |
| Public sector procurement \x96 Generic requirements for organizations providing products and services | |
| Qualification and approval of UAS operatives - UAS Pilot Level 1 | |
| Quality management systems \x97 Specification for the application of BS EN ISO 9001:2015 in the built environment sector | |
| Radio Frequency Connectors of Assessed Quality: Generic Data and Methods of Test | |
| Recycling of roads and other paved areas using bitumen emulsion, foamed bitumen or hydraulic material - Materials, production, installation and product type testing - Specification | |
| Reed Contact Units of Assessed Quality: Generic Data and Methods of Test | |
| Retainers, Spring, Sheet Metal, for Self-Locking Barrel Nuts - Dimensions | |
| Rivets, Solid - Materials | |
| Rivets, Solid - Test Method | |
| Rivets, Solid, 100 Degree Normal Countersunk Head, in Metallic Material, with or without Surface Treatment - Dimensions | |
| Rivets, Solid, 100 Degrees Normal Countersunk Head with Dome, Metallic Material, with or without Surface Treatment - Dimensions | |
| Rivets, Solid, in Nickel Alloy - Procurement Specification | |
| Rivets, Solid, in Titanium or Titanium Alloy - Procurement Specification | |
| Rivets, Solid, Universal Head, Metallic Material, With or Without Surface Treatment - Dimensions | |
| Rules for the preparation of - Detail specifications for - Integrated circuits of assessed quality which perform mixed digital and/or analogue functions | |
| Rules for the Preparation of Detail Specification for Semiconductor Devices of Assessed Quality: Low Noise, Low Power Microwave Transistors | |
| Rules for the Preparation of Detail Specifications for All-Or-Nothing Electromechanical Relays of Assessed Quality - Full and Basic Assessment Levels | |
| Rules for the preparation of detail specifications for all-or-nothing electromechanical relays of assessed quality primarily intended for telecommunication applications - Full and basic assessment levels | |
| Rules for the Preparation of Detail Specifications for Analogue Integrated Circuits of Assessed Quality: Full Assessment Level | |
| Rules for the Preparation of Detail Specifications for Capacitively Coupled Digital Integrated Circuits of Assessed Quality. Full Assessment Level | |
| Rules for the preparation of detail specifications for circular electrical connectors of assessed quality for d.c. and low frequency applications. Full and basic assessment levels | |
| Rules for the Preparation of Detail Specifications for Digital Integrated Circuits of Assessed Quality Full Assessment Level | |
| Rules for the Preparation of Detail Specifications for Electrical Edge Socket Connectors of Assessed Quality. Full and Basic Assessment Levels | |
| Rules for the preparation of Detail specifications for Ferrite cores of assessed quality for use in inductors | |
| Rules for the preparation of Detail specifications for Ferrite cores of assessed quality for use in transformers | |
| Rules for the Preparation of Detail Specifications for Fixed Low Power Non-Wirewound Resistors of Assessed Quality | |
| Rules for the Preparation of Detail Specifications for Fixed Wirewound Resistors (Type 2) of Assessed Quality | |
| Rules for the Preparation of Detail Specifications for Fusible Link Programmable Read-Only Memories of Assessed Quality (Full Assessment Level) | |
| Rules for the preparation of detail specifications for glass-encapsulated quartz crystal units of assessed quality for oscillator applications. General application category | |
| Rules for the preparation of detail specifications for hermetically-sealed metal enclosed piezoelectric crystal filters of assessed quality, full assessment | |
| Rules for the preparation of detail specifications for In-Line and Pin-Grid Array Sockets | |
| Rules for the Preparation of Detail Specifications for Integrated Circuits of Assessed Quality: Complex Digital Circuits - Bipolar. General Application Category | |
| Rules for the Preparation of Detail Specifications for Integrated Circuits of Assessed Quality: Differential Comparator Amplifiers. General Application Category | |
| Rules for the Preparation of Detail Specifications for Integrated Circuits of Assessed Quality: Differential Operational Amplifiers. General Application Category | |
| Rules for the Preparation of Detail Specifications for Integrated Circuits of Assessed Quality: DTL Digital Gate Circuits. General Application Category | |
| Rules for the Preparation of Detail Specifications for Integrated Circuits of Assessed Quality: DTL Digital Inverter Circuits. General Application Category | |
| Rules for the Preparation of Detail Specifications for Integrated Circuits of Assessed Quality: Insulated Gate Shift Registers. General Application Category | |
| Rules for the Preparation of Detail Specifications for Integrated Circuits of Assessed Quality: Microwave Amplifiers. Full Assessment Level | |
| Rules for the Preparation of Detail Specifications for Integrated Circuits of Assessed Quality: TTL Binary Counter Circuits. General Application Category | |
| Rules for the Preparation of Detail Specifications for Integrated Circuits of Assessed Quality: TTL Binary Memory Circuits. General Application Category | |
| Rules for the Preparation of Detail Specifications for Integrated Circuits of Assessed Quality: TTL Digital Bistable Circuits. General Application Category | |
| Rules for the Preparation of Detail Specifications for Integrated Circuits of Assessed Quality: TTL Digital Gate Circuits. General Application Category | |
| Rules for the Preparation of Detail Specifications for Integrated Circuits of Assessed Quality: TTL Digital Interconnected Gate Circuits. General Application Category | |
| Rules for the Preparation of Detail Specifications for Integrated Circuits of Assessed Quality: TTL Digital Inverter Circuits. General Application Category | |
| Rules for the Preparation of Detail Specifications for Integrated Circuits of Assessed Quality: Voltage Regulators Full Assessment Level | |
| Rules for the Preparation of Detail Specifications for Lead-Screw Actuated Preset Potentiometers of Assessed Quality | |
| Rules for the Preparation of Detail Specifications for Printed Board Programming Switches | |
| Rules for the preparation of Detail specifications for Quartz crystal units of assessed quality - Full assessment level | |
| Rules for the Preparation of Detail Specifications for Rectangular Electrical Connectors of Assessed Quality with Moulded Bodies for d.c. and Low Frequency Applications - Full and Basic Assessment Levels | |
| Rules for the Preparation of Detail Specifications for Reed Relays of Assessed Quality | |
| Rules for the Preparation of Detail Specifications for Semiconductor Devices of Assessed Quality: Case-Rated Bi-Directional Thyristors (Triacs) | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: controlled avalanche rectifier diodes | |
| Rules for the Preparation of Detail Specifications for Semiconductor Devices of Assessed Quality: Field Effect Transistors for Microwave Applications | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: general purpose signal diodes | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high current general purpose thyristors (greater than 50 ampere rating) | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high current rectifier diodes (greater than 50 ampere rating) | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high frequency, low power transistors | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high power transistors for linear applications | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high power transistors for switching applications | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: low current general purpose thyristors (up to 3 ampere rating) | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: low current rectifier diodes (up to 3 ampere rating) | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: low frequency, low power transistors | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: medium current general purpose thyristors (1-100 ampere rating) | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: medium current rectifier diodes (1-100 ampere rating) | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave avalanche oscillators (c.w. operation) | |
| Rules for the Preparation of Detail Specifications for Semiconductor Devices of Assessed Quality: Microwave Avalanche Oscillators (Pulse Operation) | |
| Rules for the Preparation of Detail Specifications for Semiconductor Devices of Assessed Quality: Microwave Detector Diodes | |
| Rules for the Preparation of Detail Specifications for Semiconductor Devices of Assessed Quality: Microwave Gunn Oscillators (C.W. Operation) | |
| Rules for the Preparation of Detail Specifications for Semiconductor Devices of Assessed Quality: Microwave Gunn Oscillators (Pulse Operation) | |
| Rules for the Preparation of Detail Specifications for Semiconductor Devices of Assessed Quality: Microwave Mixer Diodes (C.W. Operation) | |
| Rules for the Preparation of Detail Specifications for Semiconductor Devices of Assessed Quality: Microwave Mixer Diodes Pulse Operation) | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: p-i-n microwave active switching diodes | |
| Rules for the Preparation of Detail Specifications for Semiconductor Devices of Assessed Quality: P-I-N Microwave Passive Limiter Diodes | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: rectifier bridges. Ambient rated, single phase, in solid (plastics) encapsulation | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: switching diodess | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: switching transistors | |
| Rules for the Preparation of Detail Specifications for Semiconductor Devices of Assessed Quality: Transient Suppressor Diodes | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: transistors (general) | |
| Rules for the Preparation of Detail Specifications for Semiconductor Devices of Assessed Quality: Varactor Diodes for Frequency Multiplication | |
| Rules for the Preparation of Detail Specifications for Semiconductor Devices of Assessed Quality: Variable Capacitance Diodes for Tuning Applications | |
| Rules for the preparation of detail specifications for semiconductor devices of assessed quality: voltage regulator diodes | |
| Rules for the Preparation of Detail Specifications for Single Turn Low Power Rotary Potentiometers of Assessed Quality | |
| Rules for the preparation of detail specifications for solder-sealed quartz crystal units of assessed quality for oscillator applications. General application category | |
| Rules for the Preparation of Detail Specifications for Two- Part Printed Board Electrical Connectors and Board-Mounted Transition Devices of Assessed Quality for D.C. and L.F. Applications: Full and Basic Assessment... | |
| Rules for the preparation of detail specifications for variable pre-set capacitors, type C (basic assessment level) | |
| Rules for the preparation of Detail specifications for Variable pre-set capacitors, type C - (Full assessment level) | |
| Rules for the Preparation of Detail Specifications for Variable Trimmer Capacitors of Assessed Quality. Full Assessment Level | |
| Rules for the preparation of detail specifications for variable trimmer capacitors, type B (basic assessment level) | |
| Rules for the preparation of detail specifications for variable tuning capacitors, type A (basic assessment level) | |
| Rules for the preparation of detail specifications for variable tuning capacitors, type A (full assessment level) | |
| Rules for the preparation of detail specifications for welded seal quartz crystal units of assessed quality for oscillator applications. General application category | |
| Schedule of Tests for Coke Ovens | |
| Screw gauge limits and tolerances - Part 4: Limits of size for gauges for screw threads of unified form diameters 1/4 in and larger | |
| Screw Gauge Limits and Tolerances Part 1: Gauges for Screw Threads of Unified Form | |
| Screw Gauge Limits and Tolerances Part 2: Gauges for Screw Threads of Whitworth and BA Forms | |
| Screw Gauge Limits and Tolerances: Part 3: Gauges for ISO Metric Screw Threads | |
| Screwing Taps - Part 4: Metric Ground Thread Taps: Manufacturing Tolerances | |
| Screwing Taps - Part 5: Nomenclature and Terminology | |
| Screwing Taps Part 1: Taps for ISO Metric Threads | |
| Screwing Taps Part 2: Taps for Unified Threads (and for the Obsolescent Whitworth and BA Forms) | |
| Screwing Taps: Part 3: Specification for Taps for Pipe Threads (G Series, Rp Series and Rc Series) | |
| Sectional specification for airframe-fit circular electrical connectors of assessed quality for low-frequency a.c. and d.c. applications (including engine connectors): requirements for design, performance and testing, and rules for the preparation... | |
| Sectional specification for inductors of assessed quality for use in electronic equipment: basic assessment level | |
| Sectional specification for inductors of assessed quality for use in electronic equipment: full assessment level | |
| Sectional specification for power transformers of assessed quality for switched mode power supplies (SMPS) for use in electronic equipment: full assessment level | |
| Sectional specification for power transformers of assessed quality for use in electronic equipment: basic assessment level | |
| Sectional specification for power transformers of assessed quality for use in electronic equipment: full assessment level | |
| Sectional specification for pulse transformers of assessed quality for use in electronic equipment: basic assessment level | |
| Sectional Specification for Pulse Transformers of Assessed Quality for Use in Electronic Equipment: Full Assessment Level | |
| Sectional Specification for Signal Transformers of Assessed Quality for Use in Electronic Equipment for Capability Approval | |
| Sectional specification for variable r.f. type inductors of assessed quality for use in electronic equipment: full assessment level | |
| Self-Locking Nuts with Maximum Operating Temperature Less Than or Equal to 425 Degrees C - Procurement Specification | |
| Semiconductor Devices of Assessed Quality: Generic Data and Methods of Test | |
| Serrations and gauges for serrations | |
| Sockets of Assessed Quality for Electronic Tubes and Valves and Plug-in Devices: Generic Data and Methods of Test | |
| Solder-Sealed Quartz Crystal Units of Assessed Quality for Oscillator Applications. General Application Category | |
| Specification fir Printed Board Mounted Programming Switches of Assessed Quality: Generic Data and Methods of Test | |
| Specification for 100 Degree Countersunk Head Steel Bolts (160 000 Lbf/Square Inches (110 hbar) with Torq-Set Recesses) | |
| Specification for 100 Degree Countersunk Head Steel Bolts (Unified Threads and Cruciform Recesses) for Aircraft | |
| Specification for 100 Degree Countersunk Head Titanium Alloy Bolts 160 000 Lbf/Square Inches (1100 MPa) with Hi-Torque Speed Drive Recesses | |
| Specification for 140 g/m2 Linen (Flax) Fabric and Serrated Edge Strip for Aerospace Purposes | |
| Specification for 90 Degrees Countersunk Head Corrosion- Resisting Steel Bolts (UNF Threads) for Aircraft | |
| Specification for 90 Degrees Countersunk Head Steel Bolts (UNF Threads) for Aircraft | |
| Specification for a Universal System for Designating Linear Density of Textiles (Tex System) | |
| Specification for Artificial Daylight for the Assessment of Colour - Part 2: Viewing Conditions for Reproduction in the Graphic Arts | |
| Specification for Artificial Daylight for the Assessment of Colour Part 1: Illuminant for Colour Matching and Colour Appraisal | |
| Specification for British Association (B.A.) low tensile screws and nuts for aeronautical purposes | |
| Specification for British Association (B.A.) Screw Threads - with Tolerances for Sizes 0 B.A. to 16 B.A. | |
| Specification for capability approval of custom-built radio frequency connector/cable assemblies: generic specification | |
| Specification for capability approval of light emitting and infra-red diode arrays of assessed quality: generic data and methods of test | |
| Specification for Capability Approval of Manufacturers of Passive Radio Interference Suppression Filter Units of Assessed Quality Generic Data | |
| Specification for capability approval of modular electronic networks: generic specification | |
| Specification for Capability Approval of Quartz Crystal Units: Generic Data | |
| Specification for capability approval procedures for d.c. and low frequency connector cable assemblies and wiring harnesses: generic data | |
| Specification for custom-built transformers and inductors of assessed quality: generic data and methods of test | |
| Specification for Demensions of Screw Lamp Caps and Lampholders (Edison Type) | |
| Specification for dial gauges for linear measurement | |
| Specification for Electrical Relays of Assessed Quality: Generic Data and Methods of Test | |
| Specification for engineers' squares (including cylindrical and block squares) | |
| Specification for feeler gauges. Part 1: Inch units | |
| Specification for feeler gauges | |
| Specification for Filament Lamps for Road Vehicles | |
| Specification for Fine Pitch Gears - Part 1: Involute Spur and Helical Gears | |
| Specification for Fine pitch gears - Part 5: Hobs and Cutters | |
| Specification for fixed capacitors of assessed quality: generic data and methods of test - Section 1.Principles and mandatory procedures - Section 2. General rules for drafting detail specifications | |
| Specification for fixed capacitors of assessed quality: generic data and methods of test - Section 5. Ceramic dielectric capacitors | |
| Specification for fixed capacitors of assessed quality: generic data and methods of test. Mica dielectric capacitors | |
| Specification for fixed capacitors of assessed quality: generic data and methods of test. Polycarbonate dielectric capacitors and polyethylene terephthalate dielectric capacitors for d.c. use and polypropylene dielectric capacitors for d.c. | |
| Specification for fixed capacitors of assessed quality: generic data and methods of test. Polystyrene dielectric capacitors | |
| Specification for fixed r.f. inductors of assessed quality: generic data and methods of test | |
| Specification for Fixed Resistors of Assessed Quality: Generic Data and Methods of Test | |
| Specification for Gauging Practice for 100 Degrees Countersunk Head Fasteners for Flushness Control | |
| Specification for Hexagon (Thin) Self- Locking Nuts with Non-Metallic Locking Inserts. Metric Series | |
| Specification for Hexagon self-locking nuts with non-metallic locking inserts Metric series | |
| Specification for Hexagon Self-Locking Nuts with Non-Metallic Locking Inserts. Metric Series | |
| Specification for Hexagon Socket Head Cap Screws. Metric Series | |
| Specification for Hexagonal Castle Nuts (of Class 3B UNJ Thread) | |
| Specification for Hi-Torque Speed Drive Recess: Dimensions and Gauging for Countersunk Head Fasteners | |
| Specification for High yield stress (welding quality) structural steel | |
| Specification for Integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures): generic data and methods of test | |
| Specification for Internal Drive, Offset Cruciform Recess (Torq-Set) for Rotary Fastening Devices. Metric Series | |
| Specification for internal micrometers (including stick micrometers) | |
| Specification for Lever operated switches of assessed quality: generic data and methods of test; general rules for the preparation of detail specifications | |
| Specification for Metric Screws | |
| Specification for microswitches (sensitive switches) of assessed quality: generic data and methods of test: general rules for the preparation of detail specifications. Basic and full assessment levels | |
| Specification for Multi-contact edge socket electrical connectors - Single or double sided, closed ended, replaceable contacts, through-board solder or wire wrap terminations - Full assessment level | |
| Specification for Multi-contact edge socket electrical connectors - Single or double sided, open ended, metal fixing flanges, guide key location, replaceable contacts, through-board solder or wire wrap terminations - Full... | |
| Specification for Plain Hexagonal Thin Nut (of Class 3B UNJ Thread) | |
| Specification for Potentiometers of Assessed Quality: Generic Data and Methods of Test | |
| Specification for printed circuits of assessed quality: sectional specification for double-sided flexible and flexi-rigid printed circuits with through hole connections | |
| Specification for printed circuits of assessed quality: sectional specification for double-sided printed circuits with plated through holes | |
| Specification for printed circuits of assessed quality: sectional specification for flexible and flexi-rigid printed circuits without through hole connections | |
| Specification for printed circuits of assessed quality: sectional specification for multilayer printed circuits | |
| Specification for printed circuits of assessed quality: sectional specification for single- and double-sided printed circuits without plated through holes | |
| Specification for procurement of alloy steel bolts, metric, with a minimum tensile strength of 1100 MPa | |
| Specification for Procurement of alloy steel protruding head bolts with strength classification 1 250 MPa and MJ threads | |
| Specification for Push-button switches of assessed quality: generic data and methods of test; general rules for the preparation of detail specifications | |
| Specification for quality of laboratory porcelain | |
| Specification for Quartz crystal oscillators of assessed quality: Generic data and methods of test | |
| Specification for quartz crystal units of assessed quality: generic data and methods of test | |
| Specification for radio interference suppression filters of assessed quality: generic data and methods of test | |
| Specification for Removable contacts of assessed quality for electrical connectors as defined by BS 9520: generic data, methods of test and rules for the preparation of detail specifications | |
| Specification for Rigid Waveguide Tubing of Assessed Quality: Generic Data and Methods of Test | |
| Specification for Rotary (manual) switches of assessed quality: generic data and methods of test; general rules for the preparation of detail specifications | |
| Specification for Runout and Lead Threads for Rolled Threads | |
| Specification for Slotted Hexagonal Shear Nuts (of Class 3B UNJ Thread) | |
| Specification for Slotted Hexagonal Thick Nuts (of Class 3B UNJ Thread) | |
| Specification for Spirit Levels - for Use in Precision Engineering | |
| Specification for spline drive wrenching configuration. Metric series | |
| Specification for steel and aluminium access cover systems with over 1m clear opening | |
| SPECIFICATION FOR STEEL CASEMENT WINDOWS AND CASEMENT DOORS Part 1. Windows and Doors Accessible for Repair, Maintenance and Reglazing from Ladders | |
| Specification for Steel Hexagon Head Bolts (Short Thread: Class 3A) | |
| Specification for Steel Pan Head Bolts (Short Thread: Class 3A) | |
| Specification for Vacuum Salt for Butter and Cheese Making and Other Food Uses | |
| Specification for vulcanized fibre (natural colour) rods and tubes for electrical purposes | |
| Specification for weights of retail packages of knitting and rug yarns | |
| Specification for wrought steels for mechanical and allied engineering purposes. Requirements for carbon and carbon manganese steels for case hardening including free cutting steels | |
| Specification for Wrought steels in the form of blooms, billets, bars and forgings Part 6: SI Metric Values | |
| Specification for wrought steels in the form of blooms, billets, bars and forgings. Carbon and alloy spring steels for the manufacture of hot formed springs | |
| Specification for wrought steels in the form of blooms, billets, bars and forgings. Direct hardening alloy steels, including alloy steels capable of surface hardening by nitriding | |
| Specification for wrought steels in the form of blooms, billets, bars and forgings. Steels for case hardening | |
| Specification Rubber mats for electrical purposes | |
| Specification. Carbon brushes (parallel-sided) for use on commutator and slip-ring machines | |
| Specification. Earthing clamps | |
| Specificatiopn for Fixed Capacitors of Assessed Quality: Generic Data and Methods of Test - Section 3: Tantalum Electrolytic Capacitors | |
| Spray applied bitumen system for stress absorbing membrane interlayers \x96 Materials, installation, and testing \x96 Specification | |
| Sprinkler systems for residential and domestic occupancies Code of practice | |
| Steel and aluminium rainwater systems \x96 Specification | |
| Synthetic-resin bonded fabric sheet for electrical and mechanical purposes | |
| Tolerances for plain limit gauges | |
| Tolerances of Form and Position for Bolts and Screws. Metric Series | |
| Tracked Changes (Redline) - AEROSPACE SERIES \x96 Nuts, hexagonal, ordinary, thin, slotted and castle, unified threads, alloy steel, cadmium plated \x96 Specification Classification Rm = 145 600 lbf/in2 (1 004... | |
| Tracked Changes (Redline) - Bolts, shear, hexagonal heads, close tolerance shank, unified threads, low alloy steel, cadmium plated (on head and thread only) - Specification.Classi fication Rm = 123 200... | |
| Tracked Changes (Redline) - BS A 104 AEROSPACE SERIES Bolts, hexagonal heads with optional locking wire holes, unified threads, corrosion-resisting or heat-resisting steels, plain finish - Specification - Classification CR... | |
| Tracked Changes (Redline) - Fire risk assessment - Housing - Code of practice | |
| Tracked Changes (Redline) - Fire safety in the design, management and use of buildings \x96 Code of practice | |
| Tracked Changes (Redline) - Fire safety in the design, management and use of residential buildings \x96 Code of practice | |
| Tracked Changes (Redline) - Fire sprinkler systems for domestic and residential occupancies - Code of practice | |
| Tracked Changes (Redline) - Guide to the structural design of buried pipes | |
| Tracked Changes (Redline) - Non-automatic fire-fighting systems in buildings \x96 Code of practice | |
| Tracked Changes (Redline) - Processing of alarm signals by an alarm receiving centre - Code of practice | |
| Units of Measurement in Civil Aviation | |
| UNJ Threads - General Requirements and Limit Dimensions | |
| Variable Capacitors of Assessed Quality: Generic Data and Methods of Test | |
| Waterproof Electric Light Fittings | |
| Wood Preservation by Means of Pressure Creosoting | |
| Wrought steels (carbon and alloy steels) T.A.C. 1-33 steels EN 1-58 | |
| Wrought Steels for Mechanical and Allied Engineering Purposes Part 1: General Inspection and Testing Procedures and Specific Requirements for Carbon, Carbon Manganese, Alloy and Stainless Steels | |
| Wrought steels in the form of bars, billets, light forgings and stampings up to 6 in. ruling section for general engineering purposes | |
| Wrought Steels in the Form of Blooms, Billets, Bars and Forgings Part 4: Valve Steels |
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