Hitachi High Technologies America, Inc. Datasheets for Microscopes
Microscopes are instruments that produce magnified images of small objects
Microscopes: Learn more
| Product Name | Notes |
|---|---|
| As a new brand of FE-SEMs, the Regulus series lineup comprises four models: the Regulus8100, Regulus8220, Regulus8230, and Regulus8240, all of which extend the functions of the SU8200 series with... | |
| FIB-SEM System for True 3D Structural Analysis The newly developed FIB-SEM system from Hitachi, the NX9000 incorporates an optimized layout for true high-resolution serial sectioning to tackle the latest demands... | |
| FIB-SEM systems have become an indispensable tool for characterization and analysis of the latest technologies and high performance nano-scale materials. An ever-increasing demand for ultrathin TEM lamellas without artifacts during... | |
| Hitachi's general-purpose atomic force microscope, Model AFM5100N, features superior ease of use, a wide range of capabilities, and extraordinary performance. The breakthrough hardware option, the self-sensing detector, doesn't require laser... | |
| Innovative analytical FE-SEM allows for a simple transition between high vacuum and variable pressure mode. EM Wizard is a knowledge-based system for SEM imaging that goes beyond basic preset conditions... | |
| Innovative electron source and detectors give superior imaging and analytical performance. Hex bias technology delivers high brightness at low accelerating voltages and the ultra variable-pressure detector is optimized for imaging... | |
| SEM observation at an atmospheric pressure as well as under vacuum. Wet specimens can be observed in their natural state without preprocessing. The hybrid tabletop atmospheric SEM (ASEM) has an... | |
| STEM imaging in the HT7700 is performed using Bright Field (BF) and annular Dark Field (DF) detectors. Contrast can be adjusted with push-button ease by choosing between diffraction-contrast or Z-contrast... | |
| The AFM5500M is a SPM platform equipped with a fully addressable 4-inch stage, optimized for medium-sized samples. It affords exceptional levels of ease of use, automation, and accuracy, as well... | |
| The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness... | |
| The dual-beam FIB-SEM integrates a high-performance 40 kV FIB column and an ultra-high-resolutio n Schottky field-emission SEM column. By using dedicated fabrication template patterns for automatic lift-out, fabrication processes from... | |
| The FlexSEM 1000 Scanning Electron Microscope features newly designed electron optical and signal detection systems providing unparalleled imaging and analytical performance in a lab-friendly configuration. Keeping efficiency in mind, the... | |
| The H-9500 is a 100-300 kV TEM with an LaB6 electron gun. This is a user-friendly workhorse for atomic-resolution TEM imaging and routine structural characterization. The excellent imaging capability also... | |
| The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. With... | |
| The HF-3300 is a 100-300 kV TEM/STEM/SEM powered by Hitachi's state-of-the-art cold field emission technology for high-brightness and high-energy resolution. Capabilities needed for daily material structural characterizations and analysis are... | |
| The Hitachi research-grade AFM5300E offers significantly improved sensitivity, accuracy, and resolution of electromagnetic property measurements operated under high-vacuum conditions. Furthermore, it establishes a benchmark for comprehensive environmental control and is... | |
| The Hitachi SU-70 Analytical Field Emission SEM combines the field proven stability, high current and brightness of the Schottky electron source with the ultra-high resolution required in a multitude of... | |
| The HT7700 with Dual-Mode objective lens features superior high-contrast and high-resolution performance together with analytical capabilities for biological and materials science. Digital design and sophisticated automation increase throughput for both... | |
| The HT7800 RuliTEM is a 120 kV transmission electron microscope (TEM) with multiple lens configurations, including a standard lens for unsurpassed high contrast and a class-leading HR lens for high... | |
| The MI4050 High-Performance Focused Ion Beam System is equipped with new optics and provides the world-leading SIM imaging resolution and high-definition TEM sample preparation with improved imaging resolution at low... | |
| The S-3700N's huge sample chamber accommodates a variety of samples, while the flexible chamber design affords superior analytical analysis. Capable of accommodating a 300-mm diameter sample with a maximum height... | |
| The SU8200 FE-SEM is equipped with a novel CFE gun which employes Hitachi's patented "Mild Flashing" technology and a new vacuum system, minimizing gas mulecule deposition on the emitter tip. | |
| The TM3030Plus has a premium SE detector and a BSE detector which have been incorporated in FE-SEM & VP-SEM and well-accepted by users as a high-sensitivity detector. The premium SE... | |
| The TM4000 Series features innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use,... | |
| TM3030Plus has a premium SE detector which has been incorporated in FE-SEM & VP SEM, and well-accepted by users as a high-sensitivity detector. It can be operated effectively under a... |