Hitachi High Technologies America, Inc. Datasheets for Microscopes

Microscopes are instruments that produce magnified images of small objects
Microscopes: Learn more

Product Name Notes
Ultra-high Resolution Scanning Electron Microscope -- Regulus Series As a new brand of FE-SEMs, the Regulus series lineup comprises four models: the Regulus8100, Regulus8220, Regulus8230, and Regulus8240, all of which extend the functions of the SU8200 series with...
Real-time 3D analytical Focused ion Beam Microscope -- FIB-SEM NX9000 FIB-SEM System for True 3D Structural Analysis The newly developed FIB-SEM system from Hitachi, the NX9000 incorporates an optimized layout for true high-resolution serial sectioning to tackle the latest demands...
Focused Ion and Electron Beam -- NX2000 FIB-SEM systems have become an indispensable tool for characterization and analysis of the latest technologies and high performance nano-scale materials. An ever-increasing demand for ultrathin TEM lamellas without artifacts during...
Compact General-Purpose Atomic Force Microscope -- AFM5100N Hitachi's general-purpose atomic force microscope, Model AFM5100N, features superior ease of use, a wide range of capabilities, and extraordinary performance. The breakthrough hardware option, the self-sensing detector, doesn't require laser...
Schottky Field Emission Scanning Electron Microscope -- SU5000 Innovative analytical FE-SEM allows for a simple transition between high vacuum and variable pressure mode. EM Wizard is a knowledge-based system for SEM imaging that goes beyond basic preset conditions...
Scanning Electron Microscope -- SU3500 Innovative electron source and detectors give superior imaging and analytical performance. Hex bias technology delivers high brightness at low accelerating voltages and the ultra variable-pressure detector is optimized for imaging...
Tabletop Atmospheric Scanning Electron Microscope (ASEM) -- AeroSurf 1500 SEM observation at an atmospheric pressure as well as under vacuum. Wet specimens can be observed in their natural state without preprocessing. The hybrid tabletop atmospheric SEM (ASEM) has an...
Transmission Electron Microscopes (TEM) -- BF/DF STEM HT7710 STEM imaging in the HT7700 is performed using Bright Field (BF) and annular Dark Field (DF) detectors. Contrast can be adjusted with push-button ease by choosing between diffraction-contrast or Z-contrast...
Scanning Probe Microscope -- AFM5500M The AFM5500M is a SPM platform equipped with a fully addressable 4-inch stage, optimized for medium-sized samples. It affords exceptional levels of ease of use, automation, and accuracy, as well...
Ultra-high Resolution Scanning Electron Microscope -- SU9000 The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness...
Focused Ion & Electron Beam Microscope -- nanoDUE'T NB5000 The dual-beam FIB-SEM integrates a high-performance 40 kV FIB column and an ultra-high-resolution Schottky field-emission SEM column. By using dedicated fabrication template patterns for automatic lift-out, fabrication processes from fiducial...
Scanning Electron Microscope -- FlexSEM 1000 The FlexSEM 1000 Scanning Electron Microscope features newly designed electron optical and signal detection systems providing unparalleled imaging and analytical performance in a lab-friendly configuration. Keeping efficiency in mind, the...
Transmission Electron Microscopes (TEM) -- 300kV TEM H-9500 The H-9500 is a 100-300 kV TEM with an LaB6 electron gun. This is a user-friendly workhorse for atomic-resolution TEM imaging and routine structural characterization. The excellent imaging capability also...
Transmission Electron Microscopes (TEM) -- Cs-Corrected FE-STEM HD-2700 The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. With...
Transmission Electron Microscopes (TEM) -- 300 kV FE-TEM HF-3300 The HF-3300 is a 100-300 kV TEM/STEM/SEM powered by Hitachi's state-of-the-art cold field emission technology for high-brightness and high-energy resolution. Capabilities needed for daily material structural characterizations and analysis are...
Environmental Control Atomic Force Microscopes -- AFM5300E The Hitachi research-grade AFM5300E offers significantly improved sensitivity, accuracy, and resolution of electromagnetic property measurements operated under high-vacuum conditions. Furthermore, it establishes a benchmark for comprehensive environmental control and is...
Analytical UHR Schottky Emission Scanning Electron Microscope -- SU-70 The Hitachi SU-70 Analytical Field Emission SEM combines the field proven stability, high current and brightness of the Schottky electron source with the ultra-high resolution required in a multitude of...
High-Contrast/High-Resolution Digital Transmission Electron Microscope (TEM) -- TEM HT7700 The HT7700 with Dual-Mode objective lens features superior high-contrast and high-resolution performance together with analytical capabilities for biological and materials science. Digital design and sophisticated automation increase throughput for both...
Transmission Electron Microscopes (TEM) -- HT7800 Series The HT7800 RuliTEM is a 120 kV transmission electron microscope (TEM) with multiple lens configurations, including a standard lens for unsurpassed high contrast and a class-leading HR lens for high...
High-Performance Focused Ion Beam Microscope -- MI4050 The MI4050 High-Performance Focused Ion Beam System is equipped with new optics and provides the world-leading SIM imaging resolution and high-definition TEM sample preparation with improved imaging resolution at low...
Scanning Electron Microscope -- S-3700N The S-3700N's huge sample chamber accommodates a variety of samples, while the flexible chamber design affords superior analytical analysis. Capable of accommodating a 300-mm diameter sample with a maximum height...
Ultra-high Resolution Scanning Electron Microscope -- SU8200 Series The SU8200 FE-SEM is equipped with a novel CFE gun which employes Hitachi's patented "Mild Flashing" technology and a new vacuum system, minimizing gas mulecule deposition on the emitter tip.
Tabletop Microscope -- TM3030 The TM3030Plus has a premium SE detector and a BSE detector which have been incorporated in FE-SEM & VP-SEM and well-accepted by users as a high-sensitivity detector. The premium SE...
Tabletop Microscopes -- TM4000/TM4000Plus The TM4000 Series features innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use,...
Tabletop Microscope -- TM3030Plus TM3030Plus has a premium SE detector which has been incorporated in FE-SEM & VP SEM, and well-accepted by users as a high-sensitivity detector. It can be operated effectively under a...