Hitachi High Technologies America, Inc. Analytical UHR Schottky Emission Scanning Electron Microscope SU-70

Description
The Hitachi SU-70 Analytical Field Emission SEM combines the field proven stability, high current and brightness of the Schottky electron source with the ultra-high resolution required in a multitude of analytical applications. Designed with a semi-in-lens optical configuration, Hitachi's patented ExB technology provides a unique electron signal filtering and mixing system suited for today's demanding applications for research and development and multidiscipline studies. The large specimen stage and analytical chamber accommodate a wide variety of analytical instrumentation such as EDS*, WDS*, EBSP*, CL*, STEM*, and e-Beam Lithography* techniques optimized for simultaneous analysis. Ultra High Resolution Imaging; 1 nm/15 kV, 1.6 nm/1 kV
Description
The Hitachi SU-70 Analytical Field Emission SEM combines the field proven stability, high current and brightness of the Schottky electron source with the ultra-high resolution required in a multitude of analytical applications. Designed with a semi-in-lens optical configuration, Hitachi's patented ExB technology provides a unique electron signal filtering and mixing system suited for today's demanding applications for research and development and multidiscipline studies. The large specimen stage and analytical chamber accommodate a wide variety of analytical instrumentation such as EDS*, WDS*, EBSP*, CL*, STEM*, and e-Beam Lithography* techniques optimized for simultaneous analysis. Ultra High Resolution Imaging; 1 nm/15 kV, 1.6 nm/1 kV

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Analytical UHR Schottky Emission Scanning Electron Microscope - SU-70 - Hitachi High Technologies America, Inc.
Schaumburg, IL, USA
Analytical UHR Schottky Emission Scanning Electron Microscope
SU-70
Analytical UHR Schottky Emission Scanning Electron Microscope SU-70
The Hitachi SU-70 Analytical Field Emission SEM combines the field proven stability, high current and brightness of the Schottky electron source with the ultra-high resolution required in a multitude of analytical applications. Designed with a semi-in-lens optical configuration, Hitachi's patented ExB technology provides a unique electron signal filtering and mixing system suited for today's demanding applications for research and development and multidiscipline studies. The large specimen stage and analytical chamber accommodate a wide variety of analytical instrumentation such as EDS*, WDS*, EBSP*, CL*, STEM*, and e-Beam Lithography* techniques optimized for simultaneous analysis. Ultra High Resolution Imaging; 1 nm/15 kV, 1.6 nm/1 kV

The Hitachi SU-70 Analytical Field Emission SEM combines the field proven stability, high current and brightness of the Schottky electron source with the ultra-high resolution required in a multitude of analytical applications. Designed with a semi-in-lens optical configuration, Hitachi's patented ExB technology provides a unique electron signal filtering and mixing system suited for today's demanding applications for research and development and multidiscipline studies.

The large specimen stage and analytical chamber accommodate a wide variety of analytical instrumentation such as EDS*, WDS*, EBSP*, CL*, STEM*, and e-Beam Lithography* techniques optimized for simultaneous analysis.

  • Ultra High Resolution Imaging; 1 nm/15 kV, 1.6 nm/1 kV
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Technical Specifications

  Hitachi High Technologies America, Inc.
Product Category Microscopes
Product Number SU-70
Product Name Analytical UHR Schottky Emission Scanning Electron Microscope
Application Biological / Life Sciences; Medical / Forensic
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