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Hitachi High Technologies America, Inc. Datasheets for Electron Microscopes

Electron microscopes use a focused beam of electrons instead of light to "image" the specimen and gain information as to its structure and composition.
Electron Microscopes: Learn more

Product Name Notes
FIB-SEM System for True 3D Structural Analysis The newly developed FIB-SEM system from Hitachi, the NX9000 incorporates an optimized layout for true high-resolution serial sectioning to tackle the latest demands...
FIB-SEM systems have become an indispensable tool for characterization and analysis of the latest technologies and high performance nano-scale materials. An ever-increasing demand for ultrathin TEM lamellas without artifacts during...
The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness...
The dual-beam FIB-SEM integrates a high-performance 40 kV FIB column and an ultra-high-resolutio n Schottky field-emission SEM column. By using dedicated fabrication template patterns for automatic lift-out, fabrication processes from...
The MI4050 High-Performance Focused Ion Beam System is equipped with new optics and provides the world-leading SIM imaging resolution and high-definition TEM sample preparation with improved imaging resolution at low...