Hitachi High Technologies America, Inc. Datasheets for Electron Microscopes
Electron microscopes use a focused beam of electrons instead of light to "image" the specimen and gain information as to its structure and composition.
Electron Microscopes: Learn more
|Real-time 3D analytical Focused ion Beam Microscope -- FIB-SEM NX9000||FIB-SEM System for True 3D Structural Analysis The newly developed FIB-SEM system from Hitachi, the NX9000 incorporates an optimized layout for true high-resolution serial sectioning to tackle the latest demands...|
|Focused Ion and Electron Beam -- NX2000||FIB-SEM systems have become an indispensable tool for characterization and analysis of the latest technologies and high performance nano-scale materials. An ever-increasing demand for ultrathin TEM lamellas without artifacts during...|
|Ultra-high Resolution Scanning Electron Microscope -- SU9000||The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness...|
|Focused Ion & Electron Beam Microscope -- nanoDUE'T NB5000||The dual-beam FIB-SEM integrates a high-performance 40 kV FIB column and an ultra-high-resolution Schottky field-emission SEM column. By using dedicated fabrication template patterns for automatic lift-out, fabrication processes from fiducial...|
|High-Performance Focused Ion Beam Microscope -- MI4050||The MI4050 High-Performance Focused Ion Beam System is equipped with new optics and provides the world-leading SIM imaging resolution and high-definition TEM sample preparation with improved imaging resolution at low...|