Hitachi High Technologies America, Inc. Transmission Electron Microscopes (TEM) Cs-Corrected FE-STEM HD-2700

The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. With the option for a probe-forming aberration corrector, ultra-high resolution can be achieved for both STEM and SE imaging. The Hitachi corrector minimizes the user's effort in doing aberration correction. Large solid-angle EDS* and atomic-spatial-resol ution EDS* and EELS spectrum imaging* are enabled. Image resolution 0.204 nm guaranteed (at a magnification of ×4,000,000) 0.136 nm guaranteed (HAADF-STEM image) 0.105 nm guaranteed (FFT)(at a magnification of ×7,000,000)(HR lens) Magnification ×100 - ×10,000,000 Accelerating voltage 200 kV, 120 kV *, 80 kV*