Hitachi High Technologies America, Inc. Environmental Control Atomic Force Microscopes AFM5300E

The Hitachi research-grade AFM5300E offers significantly improved sensitivity, accuracy, and resolution of electromagnetic property measurements operated under high-vacuum conditions. Furthermore, it establishes a benchmark for comprehensive environmental control and is the only tool on the market affording AFM imaging in air/liquid/vacuum, a broad temperature range (-120 °C to 800 °C), magnetic field or humidity controls, as well as correlated AFM/SEM/ion milling investigations. Sample Size 25mm (diameter) Thickness: 10mm Scan range 20µm×20µm×1.5µm 100µm×100µm×15µm 150µm×150µm×5µm Closed Loop Scanner XY 1.5µm