Hitachi High Technologies America, Inc. Environmental Control Atomic Force Microscopes AFM5300E

Description
The Hitachi research-grade AFM5300E offers significantly improved sensitivity, accuracy, and resolution of electromagnetic property measurements operated under high-vacuum conditions. Furthermore, it establishes a benchmark for comprehensive environmental control and is the only tool on the market affording AFM imaging in air/liquid/vacuum, a broad temperature range (-120 °C to 800 °C), magnetic field or humidity controls, as well as correlated AFM/SEM/ion milling investigations. Sample Size 25mm (diameter) Thickness: 10mm Scan range 20µm×20µm×1.5µm 100µm×100µm×15µm 150µm×150µm×5µm Closed Loop Scanner XY 1.5µm
Description
The Hitachi research-grade AFM5300E offers significantly improved sensitivity, accuracy, and resolution of electromagnetic property measurements operated under high-vacuum conditions. Furthermore, it establishes a benchmark for comprehensive environmental control and is the only tool on the market affording AFM imaging in air/liquid/vacuum, a broad temperature range (-120 °C to 800 °C), magnetic field or humidity controls, as well as correlated AFM/SEM/ion milling investigations. Sample Size 25mm (diameter) Thickness: 10mm Scan range 20µm×20µm×1.5µm 100µm×100µm×15µm 150µm×150µm×5µm Closed Loop Scanner XY 1.5µm

Suppliers

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Environmental Control Atomic Force Microscopes - AFM5300E - Hitachi High Technologies America, Inc.
Schaumburg, IL, USA
Environmental Control Atomic Force Microscopes
AFM5300E
Environmental Control Atomic Force Microscopes AFM5300E
The Hitachi research-grade AFM5300E offers significantly improved sensitivity, accuracy, and resolution of electromagnetic property measurements operated under high-vacuum conditions. Furthermore, it establishes a benchmark for comprehensive environmental control and is the only tool on the market affording AFM imaging in air/liquid/vacuum, a broad temperature range (-120 °C to 800 °C), magnetic field or humidity controls, as well as correlated AFM/SEM/ion milling investigations. Sample Size 25mm (diameter) Thickness: 10mm Scan range 20µm×20µm×1.5µm 100µm×100µm×15µm 150µm×150µm×5µm Closed Loop Scanner XY 1.5µm

The Hitachi research-grade AFM5300E offers significantly improved sensitivity, accuracy, and resolution of electromagnetic property measurements operated under high-vacuum conditions. Furthermore, it establishes a benchmark for comprehensive environmental control and is the only tool on the market affording AFM imaging in air/liquid/vacuum, a broad temperature range (-120 °C to 800 °C), magnetic field or humidity controls, as well as correlated AFM/SEM/ion milling investigations.

Sample Size25mm (diameter)
Thickness: 10mm
Scan range20µm×20µm×1.5µm100µm×100µm×15µm
150µm×150µm×5µm
Closed Loop Scanner
XY 1.5µm
Supplier's Site

Technical Specifications

  Hitachi High Technologies America, Inc.
Product Category Microscopes
Product Number AFM5300E
Product Name Environmental Control Atomic Force Microscopes
Application Biological / Life Sciences; Medical / Forensic
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