Hitachi High Technologies America, Inc. Compact General-Purpose Atomic Force Microscope AFM5100N

Hitachi's general-purpose atomic force microscope, Model AFM5100N, features superior ease of use, a wide range of capabilities, and extraordinary performance. The breakthrough hardware option, the self-sensing detector, doesn't require laser and detector alignments and thus can effectively simplify AFM operation. As a full-featured system in support of high-resolution and multifunctional AFM measurements, the AFM5100N offers a wide variety of advanced modes, including the proprietary sampling intelligent scan (SIS), which delivers previously unattainable results for very challenging samples. Sample Size (Selectable) 35mm (diameter) Thickness: 10mm 2inch Adjustment Block 50.08mm×50.08mm×20mm Scan Range (Select at least one) 20μm×20μm×1.5μm 100μm×100μm×15μm 150μm×150μm×5μm Closed Loop Scanner 110μm×110μm×6μm