STEM imaging in the HT7700 is performed using Bright Field (BF) and annular Dark Field (DF) detectors. Contrast can be adjusted with push-button ease by choosing between diffraction-contrast or Z-contrast conditions. STEM imaging inherently reduces the impact of inelastically scattered electrons on image blur, allowing thicker samples to be imaged at low kV. Combining precision beam control of the STEM with EDX analysis enables simultaneous elemental mapping and imaging to see the elemental distribution.
Resolution
1.5nm (BF-STEM, 100kV, defined by measuring the gap of sputtered gold particles)
Detector
BF-STEM DF-STEM (Option)
Magnification
x1,000～x800,000 (High Mag mode) x1,000～x100,000 (Normal mode) x100～x2,000 (Low Mag mode)
STEM imaging in the HT7700 is performed using Bright Field (BF) and annular Dark Field (DF) detectors. Contrast can be adjusted with push-button ease by choosing between diffraction-contrast or Z-contrast conditions. STEM imaging inherently reduces the impact of inelastically scattered electrons on image blur, allowing thicker samples to be imaged at low kV. Combining precision beam control of the STEM with EDX analysis enables simultaneous elemental mapping and imaging to see the elemental distribution.
| Resolution | 1.5nm (BF-STEM, 100kV, defined by measuring
the gap of sputtered gold particles) |
|---|
| Detector | BF-STEM
DF-STEM (Option) |
|---|
| Magnification | x1,000～x800,000 (High Mag mode)
x1,000～x100,000 (Normal mode)
x100～x2,000 (Low Mag mode) |
|---|
