IEC - International Electrotechnical Commission Datasheets for Standards and Technical Documents
Standards and technical documents includes standards, codes, regulation, handbooks, manuals, comprehensive guides and other formal publications. Standards, codes, and regulation establish uniform specifications, procedures or technical criteria.
Standards and Technical Documents: Learn more
| Product Name | Notes |
|---|---|
| Adds new Clause 6: Selection of current ratings of fuselinks for transformer circuit applications. | |
| Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive. The contents of the... | |
| Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such... | |
| Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux... | |
| Aims at verifying that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test... | |
| Amends and improves Chapters 391 and 392 of the International Electrotechnical Vocabulary. Defines general terms, fundamental terms and additional terms of these chapters as well as new terms and amended... | |
| Applicable to industrial electroslag remelting furnaces having one or more electrodes and having different melting power supplies, such as alternating current, direct current, or low-frequency current. Standardizes electroslag remelting furnace... | |
| Applicable to optical fibre types A1a, A1b, and A1d. These fibres are used or can be incorporated in information transmission equipment and optical fibre cables. Three types of requirements apply... | |
| Applicable to optical fibre types B1.1, B1.2, B1.3, and categories B2 and B4. These fibres are used or can be incorporated in information transmission equipment and optical fibre cables. Three... | |
| Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have... | |
| Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices. The contents of the corrigenda of April 2003 and August 2003 have been... | |
| Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of... | |
| Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of... | |
| Applicable to semiconductor devices (discrete devices and integrated circuits), this test measures bond strength or determine compliance with specified bond strength requirements. The contents of the corrigendum of August 2003... | |
| Applicable to transmitters which have either a standard analogue electric current output signal or a standard pneumatic output signal in accordance with IEC 60381-1 or IEC 60382. The tests detailed... | |
| Applies to a high quality approval system for hybrid integrated circuits and film structures.This checklist is intended for the use of a hybrid microcircuit manufacturer's internal assessment team. It will... | |
| Applies to analogue oscilloscopes and to peak voltmeters used for measurements during tests with high impulse voltages and high impulse currents. Covers the specific characteristics and calibrations required to meet... | |
| Applies to annealed aluminium alloy conductors of diameter not greater than 1 mm. Prescribes physical and mechanical property values which may be used internationally for this type of wire in... | |
| Applies to cable penetrations in reactor containments. Covers the engineered safety requirements to be in the design, calculation, fabrication, assembly, testing, installation and maintenance of cable penetrations. Describes the requirements... | |
| Applies to CAMAC systems as defined in IEC 60516. The generic standard for BASIC includes a real-time enhancement which is necessarily general. This standard defines specific syntax and semantics for... | |
| Applies to electrical items of the safety system that are used in nuclear power generating stations including components or equipment of any interface whose failure could adversely affect the performance... | |
| Applies to encapsulated semiconductor integrated circuits, including multichip integrated circuits, but excluding hybrid circuits. Gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and... | |
| Applies to equipment for continuously monitoring radioactivity in gaseous effluents during normal operations and during anticipated operational occurrences. Does not deal with sample extraction and laboratory analysis. Specifies the general... | |
| Applies to equipment for the monitoring of radioactive substances within plant process streams of stationary nuclear power plants with light-water reactors during specified normal operation (routine operation) and during anticipated... | |
| Applies to equipment intended for continuous or sequential measurement of alpha-emitting transuranic aerosols in gaseous effluents discharged to the environment. | |
| Applies to film and hybrid film integrated circuits (F and HICs), manufactured as catalogue or as custom-built circuits whose quality is assessed on the basis of the capability approval procedure. | |
| Applies to film and hybrid film integrated circuits, manufactured as catalogue or as custom-built products whose quality is assessed on the basis of Qualification Approval. Presents preferred values for rating... | |
| Applies to film integrated circuits and hybrid film integrated circuits (F and HICs), manufactured as catalogue or as custom-built circuits whose quality is assessed on the basis of the capability... | |
| Applies to film integrated circuits and to hybrid film integrated circuits both passive and active. Applies also to partly-completed F and HFICs supplied to customers for subsequent processing as well... | |
| Applies to flat quick-connect terminations consisting of male tabs with hole or dimple detents and the mating female connectors. Establishes uniform requirements for the dimensions, performance characteristics and test programme. | |
| Applies to headphones with integrated infra-red detectors for use with television and stereo equipment. | |
| Applies to high quality approval systems for hybrid integrated circuits and film structures. The purpose of the tests is to perform visual inspections on the internal materials, construction and workmanship... | |
| Applies to high quality hybrid integrated circuits (with films) incorporating special customer quality and reliability requirements. Hybrid integrated circuits may be fully or partly completed. Partly completed devices are those... | |
| Applies to high quality hybrids (with films) incorporating special customer quality and reliability requirements whose quality is assessed on the basis of Qualification Approval. NOTE: Hybrid integrated circuits may be... | |
| Applies to magnetic video recording and/or playback with a 12.70 mm (0.5 in) tape, one-reel cartridge, on two-head helical-scan cartridge video tape recorders suitable for recording and playback of monochrome... | |
| Applies to magnetic video recording on 12,65 mm (0,5 in) wide tape using the wide band VHS recording system. | |
| Applies to magnetic video recording using 12.70 mm (0.5 in) tape cassettes on two-head helical-scan video-cassette recorders. Gives dimensional and other characteristics necessary to permit the interchangeability of recorded cassettes. | |
| Applies to optical fibre cables for use with telecommunication equipment and devices employing similar techniques and to cables having a combination of both optical fibre and electrical conductors. Establishes uniform... | |
| Applies to optical fibre cables for use with telecommunication equipment and devices employing similar techniques, and to cables having a combination of both optical fibres and electrical conductors. Defines test... | |
| Applies to optical fibre cables for use with telecommunication equipment and devices employing similar techniques, and to cables having a combination of both optical fibres and electrical conductors. Establishes uniform... | |
| Applies to optical fibre cables for use with telecommunication equipment and devices employing similar techniques, and to cables having a combination of both optical fibres and electrical conductors.The object is... | |
| Applies to optical fibre types A3a, A3b, A3c and A3d. It covers requirements common to A3 multimode fibres. It also covers particular requirements for individual fibre types and specific applications. | |
| Applies to optical fibre types A4a, A4b, A4c and A4d. It covers requirements common to A4 multimode fibres. It also covers particular requirements for individual fibre types and specific applications. | |
| Applies to optical fibre types B1.1, B1.2, B1.3, and categories B2, and B4. It covers requirements common to class B single-mode fibres. It also covers particular requirements for individual fibre... | |
| Applies to partially annealed aluminium conductors of diameter not less than 0.6 mm and not greater than 1.4 mm used in polyolefin insulated telecommunication cables. Prescribes physical and mechanical property... | |
| Applies to practical measurements of transmission and optical parameters of fibres. The methods are for use in inspection of fibres and cables for commercial purposes. | |
| Applies to primary coated or buffered optical fibres for use in telecommunication equipment and in devices employing similar techniques and defines categories of optical fibres as well as packaging. | |
| Applies to semiconductor devices (discrete devices and integrated circuits) - and provides a means of assessing the resistance to soldering heat of plastic-encapsulated surface mount devices. The contents of the... | |
| Applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control and selection. | |
| Applies to test methods and apparatus for the measurement of the operational characteristics of brushes (contact drop voltage, coefficient of friction, brush wear) designed to operate on commutating and slip... | |
| Applies to the practical measurements of transmission and optical parameters of fibre. The methods are to be used for inspection of fibres and cables for commercial purposes. to establish uniform... | |
| Applies to the tests of mechanical strength, ease of handling or the recognition of physical defects of primary coated or primary buffered optical glass fibres. The methods are to be... | |
| Applies to the text of descriptions, drawings, markings, etc., in the electrotechnical field and lays down a letter code for the designation of some distinct colour. Has the status of... | |
| Applies to the use, for transformer circuit applications, of fuse-links of fuses complying with the requirements of IEC 60282-1. Specifies criteria for co-ordination of high-voltage fuse-links with other circuit components... | |
| Applies to three methods of measuring PMD. Uniform requirements for measuring the PMD of optical fibre, thereby assisting in the inspection of fibres and cables for commercial purposes are established. | |
| Applies to three methods of measuring polarization mode dispersion (PMD). Establishes uniform requirements for measuring the PMD of single-mode optical fibre, thereby assisting in the inspection of fibres and cables... | |
| Applies to transmitters which have either a standard electric current output signal or a standard pneumatic output signal in accordance with IEC 60381-1 or IEC 60382. The tests may be... | |
| applies to transmitters, which have either a standard analogue electric current output signal or a standard pneumatic output signal in accordance with IEC 60381-1 or IEC 60382. The tests detailed... | |
| Chapter VI now includes a new Clause 10: General scheme for all types of integrated circuits. | |
| Constitutes the general part of IEC 60748. Together with the relevant material of IEC 60747-1, it gives general information on integrated circuits. | |
| Contains more than 400 terms and definitions as used or to be used in safety and performance standards dealing with electrical equipment in medical practice. | |
| Contains the definitions required for the understanding of all three parts, the classification of material into types, and the general requirements applicable to all material covered by the standard. | |
| Contains the general requirements for both multimode and single mode optical fibres. Sectional specifications for each of the four multimode categories: A1, A2, A3, and A4 contain requirements specific to... | |
| Covers specific requirements of optical fibres type A1a, A1b and A1d. These fibres are used in transmission equipment and optical fibre cables. For general requirements, see IEC 60793-2. | |
| Covers specific requirements of optical fibres type A2a, A2b and A2c. These fibres are used in information transmission equipment and optical fibre cables (typically up to 2 km). For general... | |
| Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define... | |
| Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due... | |
| Deals with definitions and test requirements for ionizing radiation measurement systems designed for either continuous or discrete measurement and checks of thickness, mass per unit area, or mass per unit... | |
| Defines a test aiming at detecting the presence of loose particles inside a cavity device such as, for example, chips of ceramic, pieces of bonding wire or solder balls (prills). | |
| Defines a test for optical fibres (types A1a to A1d and B1 to B4) to withstand immersion in distilled or demineralized water, which may occur in actual use, storage and/or... | |
| Defines a test that determines the suitability of optical fibres (types A1a to A1d and B1 to B4) to withstand changes in temperature in actual use, storage and/or transport. The... | |
| Defines a test that determines the suitability of optical fibres (types A1a to A1d and B1 to B4) to withstand high humidity and temperature in actual use, storage and/or transport. | |
| Defines a test that determines the suitability of optical fibres (types A1a to A1d and B1 to B4) to withstand high temperatures (dry heat) in actual use, storage and/or transport. | |
| Defines the electrical and mechanical parameters and the necessary characteristics of the VHS and the compact VHS video cassette system. The requirements relate to the 525 line-60 field and 625... | |
| Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. Provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly... | |
| Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated... | |
| Deletes the free loop bend test and adds the 0.2% proof stress value. | |
| Describes a method for characterizing the modal structure of a graded-index multimode fibre. The information is useful for assessing the bandwidth performance of a fibre when used with laser sources. | |
| Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed... | |
| Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly... | |
| Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to... | |
| Describes a test used to determine whether encapsulated solid state devices used for through-hole mounting can withstand the effects of the temperature to which they are subjected during soldering of... | |
| Describes measuring methods which apply to environmental tests of optical fibres. The methods are to be used for inspection of optical fibres. | |
| Describes methods for the determination of stress corrosion susceptibility parameters of optical fibres. Dynamic fatigue and static fatigue tests are used to determine stress corrosion susceptiblity parameters, dynamic n-value and... | |
| Describes procedures for briefly applying a specified tensile load as a proof test to continuous lengths of optical fibre. The method is applicable to types A1, A2, A3 and B... | |
| Describes successively the general qualification process, the qualification procedures and methods to be used and the associated documentation. Is applicable to electrical equipment of safety systems used in nuclear power... | |
| Describes two methods for determining and measuring the modal bandwidth of multi-mode optical fibres (see IEC 60793-2-10, IEC 60793-2-30 and IEC 60793-2-40).The baseband frequency response is directly measured in the... | |
| Detailed the procedures for the measurement of the characteristic properties of moisture diffusivity and water solubility in organic materials used in the packaging of semiconductor components. These two material properties... | |
| Determines the integrity of materials and procedures used to attach semiconductor die to package headers or other substrates. Generally only applicable to cavity packages or as a process monitor. | |
| Establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative... | |
| Establishes a standard procedure for determining the solderability of device package terminations that are intended to be joined to another surface using tin-lead or lead-free solder for the attachment. Provides... | |
| Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). | |
| Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model electrostatic discharge. The objective... | |
| Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It... | |
| Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model electrostatic discharge. The objective is... | |
| Establishes requirements for measuring the mode field diameter (MFD) of fibres. Four methods are described: (a) direct far-field scan: (b) variable aperture in the far field: (c) near-field scan: (d)... | |
| Establishes requirements for measuring the numerical aperture of category A1 graded-index multimode fibre, and its light-gathering ability. This is used to predict lauching efficiency, joint loss at splices, and micro/macrobending... | |
| Establishes specific standard requirements, including technical characteristics and general test conditions and gives examples of acceptable methods for the tritium effluent monitors. | |
| Establishes specific standard requirements, including technical characteristics and general test conditions, and gives examples of acceptable methods for aerosol effluent monitors. | |
| Establishes uniform generic requirements for the geometrical, transmission, material, mechanical, ageing (environmental exposure) and climatic properties of optical fibre cables, and electrical requirements, where appropriale. It applies to optical fibre... | |
| Establishes uniform requirements for coating strippability. This test quantifies the force required to mechanically remove the protective coating from optical fibres along their longitudinal axis. The test is for fibres... | |
| Establishes uniform requirements for fibre curl or latent curvature in uncoated optical fibres. This is important in minimizing splice loss when using fusion splicers. Two methods are used: (a) side... | |
| Establishes uniform requirements for measuring macrobending sensitivity for category B1 to B4 single-mode optical fibres at 1550 nm and of category A1 multimode fibres at 850 nm and 1300 nm. | |
| Establishes uniform requirements for measuring the attenuation of optical fibres. Four methods are described: (a) cut-back, (b) insertion loss, (d) backscattering, (d) modelling spectral attenuation. Methods (a), (b) and (c)... | |
| Establishes uniform requirements for measuring the macrobending loss of single-mode fibres (category B) at 1 550 nm or 1 625 nm, category A1 multimode fibres at 850 nm or 1... | |
| Four methods are described for measuring chromatic dispersion: (a) phase shift, (b) spectral group delay in the time domain, (c) differential phase shift, and (d) interferometry. Methods (a), (b) and... | |
| Four methods are described for measuring chromatic dispersion: (a) phase shift, (b) spectral group delay in the time domain, (c) differential phase shift, and (d) interferometry. Methods A, B, and... | |
| Gives details for the following categories of metal-oxide semiconductor field-effect transistors (MOSFETs) with inverse diodes: type B depletion (normally on) type and Type C enhancement (normally off) type. | |
| Gives four methods for measuring the coating geometry of optical fibres. The following parameters are measured: coating diameter, coating non-circularity, coating-cladding concentricity error. The methods are conducted off-line during inspection. | |
| Gives four methods for measuring the geometry of uncoated optical fibres. Parameters include: cladding diameter, cladding non-circularity, core diameter, core non-circularity, core-cladding concentricity error, and theoretical numerical numerical aperture. | |
| Gives methods for measuring the length and elongation of optical fibres (typically within a cable). Length is fundemental for evaluation of transmission characteristics such as losses and bandwidths. Five methods... | |
| Gives methods of test applicable for the material classified in Part 1. | |
| Gives product specific standards for terminology, letter symbols, essential ratings and characteristics and measuring methods for insulated-gate bipolar transistors (IGBTs). This consolidated version consists of the first edition (1998) and... | |
| Gives product specific standards for terminology, letter symbols, essential ratings and characteristics and measuring methods for insulated-gate bipolar transistors (IGBTs). | |
| Gives requirements for the following categories of interface integrated circuits:line circuits (transmitters and receivers), sense amplifiers, peripheral drivers (including memory drivers) and level shifters, voltage comparators, linear and non-linear analogue-to... | |
| Gives specific standard requirements, technical characteristics, general test conditions and examples of acceptable methods for aerosol effluent monitors designed to measure the concentration of radioactivity emitted in gaseous effluents in... | |
| Gives specifications for synthetic quartz crystals used in piezoelectric devices for frequency control and selection; gives guidance on the use of synthetic quartz crystals; gives specifications for lumbered synthetic quartz... | |
| Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer. | |
| Gives standards for the following categories or sub-categories of interface integrated circuits: -Category I: Sub-category A: Line circuits (transmitters and receivers); Sub-category B: Sense amplifiers; Sub-category C: Peripheral drivers (including... | |
| Gives standards on the following sub-categories of analogue integrated circuits: -operational amplifiers (having two inputs and one output); -audio-amplifiers, video-amplifiers and multichannel amplifiers for telecommunications; -R.F. and I.F. amplifiers; -voltage... | |
| Gives the measureing methods applicable to environmental tests of optical fibres. The methods are to be used for inspection of optical fibres for commercial puposes. They establish uniform requirements for... | |
| Gives the requirements for laminated precompressed board comprised of 100 % sulphate wood pulp or a mixture of sulphate wood pulp and cotton, bonded with two bonding agents; casein and... | |
| Gives two methods for monitoring the changes in optical transmittance of optical fibres and cables that occur during mechanical and environmental testing. It provides a monitor in the change of... | |
| IEC 60747-8:2010+A1:2021 gives standards for the following categories of field-effect transistors: - type A: junction-gate type; - type B: insulated-gate depletion (normally on) type; - type C: insulated-gate enhancement (normally... | |
| IEC 60747-9:2019 specifies product specific standards for terminology, letter symbols, essential ratings and characteristics, verification of ratings and methods of measurement for insulated-gate bipolar transistors (IGBTs). This third edition includes... | |
| IEC 60748-2-20:2008 aims at giving DC interface specifications for various sets of values, where each comprises the nominal value of power supply voltage, its tolerance, and the worst-case limit values... | |
| IEC 60749-10:2022 is intended to evaluate devices in the free state and assembled to printed wiring boards for use in electrical equipment. The method is intended to determine the compatibility... | |
| IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally... | |
| IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on... | |
| IEC 60749-15:2010 describes a test used to determine whether encapsulated solid state devices used for through-hole mounting can withstand the effects of the temperature to which they are subjected during... | |
| IEC 60749-15:2020 describes a test used to determine whether encapsulated solid state devices used for through-hole mounting can withstand the effects of the temperature to which they are subjected during... | |
| IEC 60749-15:2020 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices... | |
| IEC 60749-18:2019 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma... | |
| IEC 60749-18:2019 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60749-19:2003+A1:201 0 determines the integrity of materials and procedures used to attach semiconductor die to package headers or other substrates. This test method is generally only applicable to cavity... | |
| IEC 60749-20-1:2009 applies to all non-hermetic SMD packages which are subjected to reflow solder processes and which are exposed to the ambient air. The purpose of this document is to... | |
| IEC 60749-20-1:2019 applies to all devices subjected to bulk solder reflow processes during PCB assembly, including plastic encapsulated packages, process sensitive devices, and other moisture-sensitive devices made with moisture-permeable materials... | |
| IEC 60749-20-1:2019 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60749-20:2008 provides a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is destructive. This second edition cancels... | |
| IEC 60749-20:2020 provides a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is destructive. This edition includes the... | |
| IEC 60749-20:2020 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60749-21:2011 establishes a standard procedure for determining the solderability of device package terminations that are intended to be joined to another surface using tin-lead (SnPb) or lead-free (Pb-free) solder... | |
| IEC 60749-23:2004+A1:201 1 is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way,... | |
| IEC 60749-26:2013 establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model... | |
| IEC 60749-26:2018 establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model... | |
| IEC 60749-27:2006+A1:201 2 Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic... | |
| IEC 60749-28:2017(E) establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device... | |
| IEC 60749-28:2022 establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device... | |
| IEC 60749-28:2022 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and... | |
| IEC 60749-30:2005+A1:201 1 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic... | |
| IEC 60749-30:2020 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state... | |
| IEC 60749-30:2020 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60749-32:2002+A1:201 0 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The... | |
| IEC 60749-34:2010 describes a test method used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor... | |
| IEC 60749-37:2022 provides a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment,... | |
| IEC 60749-37:2022 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60749-39:2021 details the procedures for the measurement of the characteristic properties of moisture diffusivity and water solubility in organic materials used in the packaging of semiconductor components. These two... | |
| IEC 60749-39:2021 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60749-3:2017 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a... | |
| IEC 60749-40:2011 is intended to evaluate and compare drop performance of a surface mount semiconductor device for handheld electronic product applications in an accelerated test environment, where excessive flexure of... | |
| IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and... | |
| IEC 60749-42:2014 provides a test method to evaluate the endurance of semiconductor devices used in high temperature and high humidity environments. This test method is used to evaluate the endurance... | |
| IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications. | |
| IEC 60749-44:2016 establishes a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected... | |
| IEC 60749-4:2017 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. This edition includes... | |
| IEC 60749-5:2017 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This second edition cancels... | |
| IEC 60749-5:2023 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments. This test method is considered destructive. This... | |
| IEC 60749-5:2023 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60749-6:2017 is to test and determine the effect on all solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is typically used to... | |
| IEC 60749-7:2011 specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as... | |
| IEC 60749-9:2017 is to determine whether the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents... | |
| IEC 60751:2008 specifies the requirements and temperature/resistan ce relationship for industrial platinum resistance temperature sensors later referred to as "platinum resistors" or "resistors" and industrial platinum resistance thermometers later referred... | |
| IEC 60751:2022 specifies the requirements, in addition to the resistance versus temperature relationship, for both industrial platinum resistance thermometers (later referred to as "thermometers") and industrial platinum resistance temperature sensors... | |
| IEC 60754-1:2011 specifies the apparatus and procedure for the determination of the amount of halogen acid gas, other than hydrofluoric acid, evolved during the combustion of compounds based on halogenated... | |
| IEC 60754-1:2011+A1:2019 specifies the apparatus and procedure for the determination of the amount of halogen acid gas, other than hydrofluoric acid, evolved during the combustion of compounds based on halogenated... | |
| IEC 60754-2:2011 specifies the apparatus and procedure for the determination of the potential corrosivity of gases evolved during the combustion of materials taken from electric or optical fibre cable constructions... | |
| IEC 60754-2:2011+A1:2019 specifies the apparatus and procedure for the determination of the potential corrosivity of gases evolved during the combustion of materials taken from electric or optical fibre cable constructions... | |
| IEC 60754-3:2018 specifies the apparatus and procedure for the measurement of the amount of halogens evolved during the combustion of materials taken from electric or optical fibre cable constructions. The... | |
| IEC 60755-1:2022 gives requirements, recommendations and information for the drafting of standards for residual current operated protective devices, intended to be used in DC systems, hereafter referred to as DC-RCDs. | |
| IEC 60757:2021 specifies letter codes for designation of colours and provides rules for their combination to designate colour combinations. The letter codes are intended to be applied in the technical... | |
| IEC 60758:2008 applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control and selection. This edition includes the following significant technical changes with respect to the... | |
| IEC 60758:2016 applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control, selection and optical applications. This edition includes the following significant technical changes with respect... | |
| IEC 60763-1:2010 contains the definitions required for the understanding of all three parts of IEC 60763, the classification of material into types, and the general requirements applicable to all material... | |
| IEC 60763-2:2007 gives methods of test applicable for the material classified in IEC 60763-1. This edition includes the following significant technical changes with respect to the previous edition: The standard... | |
| IEC 60763-2:2007+AMD1:20 23 CSV gives methods of test applicable for the material classified in IEC 60763-1. This edition includes the following significant technical changes with respect to the previous edition:... | |
| IEC 60763-3-1:2010 gives the requirements for laminated precompressed boards comprised of 100 % sulphate wood pulp. The main changes with respect to the previous edition are: - requirements for the... | |
| IEC 60768:2009 provides criteria for the design, selection, testing, calibration and functional location of equipment for the monitoring of radioactive substances within plant-process streams during normal operation conditions and anticipated... | |
| IEC 60770-1:2010 is intended to specify uniform methods of test for the evaluation of the performance of transmitters with pneumatic or electric output signals. It is applicable to transmitters which... | |
| IEC 60770-2:2010 is applicable to transmitters, which have either a standard analogue electric current output signal or a standard pneumatic output analogue signal in accordance with IEC 60381-1 or IEC... | |
| IEC 60770-3:2014 specifies methods for: - assessment of the functionality of intelligent transmitters; - testing the operational behaviour, as well as the static and dynamic performance of an intelligent transmitter... | |
| IEC 60772:2018 applies to electrical penetration assemblies (EPAs) in containment structures of nuclear power plants. It covers the engineering safety requirements to be met in the design, calculation, qualification, fabrication,... | |
| IEC 60773:2021 applies to test methods for the measurement of the operational characteristics of brushes designed to operate on commutating and slip ring machines under specified test conditions. By extension... | |
| IEC 60774-5:2004 applies to the MPEG TS (Transport Stream) packet recording for helical-scan video tape cassette system using 12,65 mm magnetic tape on type VHS. This standard specifies the cassettes,... | |
| IEC 60775:2017(E) provides general minimum requirements, recommendations and information for the drafting of standards on residual current operated protective devices (hereinafter referred to as residual current devices, "RCDs"). It applies... | |
| IEC 60779:2020 specifies the test procedures, conditions and methods for determining the main performance parameters and operational characteristics of electroslag remelting furnaces. Measurements and tests that are solely used for... | |
| IEC 60793-1-1: 2017 lists and gives guidance on the use of documents giving the uniform requirements for measuring and testing optical fibres, thereby assisting in the inspection of fibres and... | |
| IEC 60793-1-1:2008 lists and gives guidance on the use of documents giving the uniform requirements for measuring and testing optical fibres, thereby assisting in the inspection of fibres and cables... | |
| IEC 60793-1-1:2017 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60793-1-1:2022 lists and gives guidance on the use of documents giving uniform requirements for measuring and testing optical fibres, thereby assisting in the inspection of fibres and cables for... | |
| IEC 60793-1-1:2022 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60793-1-20:2014 establishes uniform requirements for measuring the geometrical characteristics of uncoated optical fibres. The geometry of uncoated optical fibres directly affect splicing, connectorization and cabling and so are fundamental... | |
| IEC 60793-1-22:2024 CMV contains both the official standard and its commented version. The commented version provides you with a quick and easy way to compare all the changes between IEC... | |
| IEC 60793-1-22:2024 establishes uniform requirements for measuring the length and elongation of optical fibre (typically within cable). The length of an optical fibre is a fundamental value for the evaluation... | |
| IEC 60793-1-30:2010 describes procedures for briefly applying a specified tensile load as a proof test to continuous lengths of optical fibre. The tensile load is applied for as short a... | |
| IEC 60793-1-31:2010 provides values of the tensile strength of optical fibre samples and establishes uniform requirements for the mechanical characteristic - tensile strength. The main change with respect to the... | |
| IEC 60793-1-31:2019 provides values of the tensile strength under dynamic loading of optical fibre samples. The method tests individual lengths of uncabled and unbundled glass optical fibre. Sections of fibre... | |
| IEC 60793-1-32:2010 is intended primarily for testing either fibres as produced by a fibre manufacturer or subsequently overcoated (tight buffered) using various polymers. The test can be performed either on... | |
| IEC 60793-1-32:2018 is intended primarily for testing either fibres as produced by a fibre manufacturer or subsequently overcoated (tight buffered) using various polymers. The test can be performed either on... | |
| IEC 60793-1-32:2018 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60793-1-33:2017 contains descriptions of the five main test methods for the determination of stress corrosion susceptibility parameters. The object of this document is to establish uniform requirements for the... | |
| IEC 60793-1-34:2021 establishes uniform requirements for the mechanical characteristic: fibre curl or latent curvature in uncoated optical fibres, i.e. a specified length of the fibre has been stripped from coating. | |
| IEC 60793-1-34:2021 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60793-1-40:2019 establishes uniform requirements for measuring the attenuation of optical fibre, thereby assisting in the inspection of fibres and cables for commercial purposes. Four methods are described for measuring... | |
| IEC 60793-1-40:2019 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60793-1-40:2024 establishes uniform requirements for measuring the attenuation of optical fibre, thereby assisting in the inspection of fibres and cables for commercial purposes. Four methods are described for measuring... | |
| IEC 60793-1-40:2024 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60793-1-41:2010 describes three methods for determining and measuring the modal bandwidth of multimode optical fibres (see IEC 60793-2-10, IEC 60793-30 series and IEC 60793-40 series). The baseband frequency response... | |
| IEC 60793-1-41:2024 describes three methods for determining and measuring the modal bandwidth of multimode optical fibres (see IEC 60793-2-10, IEC 60793-2-30, and the IEC 60793‑2‑40 series). The baseband frequency response... | |
| IEC 60793-1-41:2024 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60793-1-42:2013 establishes uniform requirements for measuring the chromatic dispersion of optical fibre, thereby assisting in the inspection of fibres and cables for commercial purposes. This third edition cancels and... | |
| IEC 60793-1-43:2015 establishes uniform requirements for measuring the numerical aperture of optical fibre, thereby assisting in the inspection of fibres and cables for commercial purposes. The numerical aperture (NA) of... | |
| IEC 60793-1-44:2011 establishes uniform requirements for measuring the cut-off wavelength of single-mode optical fibre, thereby assisting in the inspection of fibres and cables for commercial purposes. This standard gives the... | |
| IEC 60793-1-44:2023 CMV contains both the official standard and its commented version. The commented version provides you with a quick and easy way to compare all the changes between IEC... | |
| IEC 60793-1-44:2023 establishes uniform requirements for measuring the cut-off wavelength of single-mode optical fibre, thereby assisting in the inspection of fibres and cables for commercial purposes. This document gives methods... | |
| IEC 60793-1-45:2017 establishes uniform requirements for measuring the mode field diameter (MFD) of single-mode optical fibre, thereby assisting in the inspection of fibres and cables for commercial purposes. This second... | |
| IEC 60793-1-45:2017 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60793-1-45:2024 establishes uniform requirements for measuring the mode field diameter (MFD) of single-mode optical fibre, thereby assisting in the inspection of fibres and cables for commercial purposes. This third... | |
| IEC 60793-1-45:2024 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60793-1-46:2024 CMV contains both the official standard and its commented version. The commented version provides you with a quick and easy way to compare all the changes between IEC... | |
| IEC 60793-1-46:2024 establishes uniform requirements for the monitoring of changes in attenuation, thereby assisting in the inspection of fibres and cables for commercial purposes. This document gives two methods for... | |
| IEC 60793-1-47:2009 establishes uniform requirements for measuring the macrobending loss of single-mode fibres (category B) at 1 550 nm or 1 625 nm, category A1 multimode fibres at 850 nm... | |
| IEC 60793-1-47:2017 establishes uniform requirements for measuring the macrobending loss of single-mode fibres (class B) at 1 550 nm or 1 625 nm, category A1 multimode fibres at 850 nm... | |
| IEC 60793-1-47:2017 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60793-1-48: 2017 applies to three methods of measuring polarization mode dispersion (PMD), which are described in Clause 4. It establishes uniform requirements for measuring the PMD of single-mode optical... | |
| IEC 60793-1-50:2014 provides a practical method for evaluating fibre performance in a defined environment. The purpose of this standard is to determine the suitability of optical fibre sub-category A1a to... | |
| IEC 60793-1-51:2014 provides a practical method for evaluating fibre performance in a defined environment. The purpose of this standard is to determine the suitability of optical fibre sub-category A1a to... | |
| IEC 60793-1-52:2014 provides a practical method for evaluating fibre performance in a defined environment. The purpose of this standard is to define a test that determines the suitability of sub-category... | |
| IEC 60793-1-53:2014 provides a practical method for evaluating fibre performance in a defined environment. The purpose of this standard is to define a test that determines the suitability of sub-category... | |
| IEC 60793-1-54:2012 outlines a method for measuring the steady state response of optical fibres and optical cables exposed to gamma radiation. It can be employed to determine the level of... | |
| IEC 60793-1-54:2018 outlines a method for measuring the steady state response of optical fibres and optical cables exposed to gamma radiation. It can be employed to determine the level of... | |
| IEC 60793-1-54:2018 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60793-1-60:2017 defines test methods for both the phase beat length, and the group beat length. These two parameters are defined differently, and will give different results depending on the... | |
| IEC 60793-1-61: 2017 establishes uniform requirements for measuring the polarization crosstalk of polarization-maintai ning (PM) fibres. This document gives two methods for measuring the polarization crosstalk of PM fibres. Method... | |
| IEC 60793-2-10:2011 is applicable to optical fibre types A1a, A1b, and A1d. These fibres are used or can be incorporated in information transmission equipment and optical fibre cables. Other applications... | |
| IEC 60793-2-10:2015 is applicable to optical fibre types A1a, A1b, and A1d. These fibres are used or can be incorporated in information transmission equipment and optical fibre cables. Type A1a... | |
| IEC 60793-2-10:2017 is applicable to optical fibre sub-categories A1a, A1b, and A1d. These fibres are used or can be incorporated in information transmission equipment and optical fibre cables. Sub-category A1a... | |
| IEC 60793-2-10:2019 is applicable to optical fibre sub-categories A1-OM1, A1-OM2, A1-OM3, A1-OM4, A1-OM5, and A1d. These fibres are used or can be incorporated in information transmission equipment and optical fibre... | |
| IEC 60793-2-10:2019 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60793-2-10:2019+A1:2 022 is applicable to optical fibre sub-categories A1-OM1, A1-OM2, A1-OM3, A1-OM4, A1-OM5, and A1d. These fibres are used or can be incorporated in information transmission equipment and optical... | |
| IEC 60793-2-20:2015 is applicable to sub-categories A2a, A2b, and A2c. These fibres are used or can be incorporated in information transmission equipment and optical fibre cables (typically up to 2... | |
| IEC 60793-2-30:2012 is applicable to sub-categories A3a, A3b, A3c, A3d and A3e. Three types of requirements apply to these fibres: - general requirements, as defined in IEC 60793-2; - specific... | |
| IEC 60793-2-30:2015 is applicable to sub-categories A3a, A3b, A3c, A3d, A3e, A3f and A3g. These fibres are used or can be incorporated in different information transmission equipment, other applications employing... | |
| IEC 60793-2-40:2009 is applicable to optical fibre categories A4a, A4b, A4c, A4d, A4e, A4f, A4g and A4h. These fibres have a plastic core and plastic cladding and may have step-index,... | |
| IEC 60793-2-40:2015 is applicable to category A4 optical multimode fibres and the related sub-categories A4a, A4b, A4c, A4d, A4e, A4f, A4g and A4h. These fibres have a plastic core and... | |
| IEC 60793-2-40:2021 is applicable to category A4 optical multimode fibres and the related subcategories A4a, A4b, A4c, A4d, A4e, A4g, A4h and A4i. These fibres have a plastic core and... | |
| IEC 60793-2-40:2021 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60793-2-50: 2018 is applicable to optical fibre categories B-652, B-653, B-654, B-655, B 656 and B-657. A map illustrating the connection of IEC designations to ITU-T designations is shown... | |
| IEC 60793-2-50:2008 is applicable to optical fibre types B1.1, B1.2, B1.3, and categories B2, B4, B5 and B6. A map illustrating the connection of IEC designations to ITU-T designations is... | |
| IEC 60793-2-50:2012 is applicable to optical fibre categories B1.1, B1.2, B1.3, B2, B4, B5 and B6. A map illustrating the connection of IEC designations to ITU-T designations is shown in... | |
| IEC 60793-2-50:2015 is applicable to optical fibre categories B1.1, B1.2, B1.3, B2, B4, B5 and B6. A map illustrating the connection of IEC designations to ITU-T designations is shown in... | |
| IEC 60793-2-50:2018 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60793-2-60:2008 is applicable to optical fibre types C1, C2, C3, C4, as described in Table 1. These fibres are used for the intraconnections within or between components or photonic... | |
| IEC 60793-2-70: 2017 This part of IEC 60793 is applicable to optical fibre types D1, D2, D3, as described in Table 1 . These fibres are polarization-maintai ning fibre types,... | |
| IEC 60793-2:2011 contains the general specifications for both multimode and single-mode optical fibres. Sectional specifications for each of the four categories multimode class: A1, A2, A3, and A4 contain requirements... | |
| IEC 60793-2:2015 contains the general specifications for both multimode and single-mode optical fibres. Sectional specifications for each of the four categories multimode fibres: A1, A2, A3, and A4 (part of... | |
| IEC 60793-2:2019 contains the general specifications for both multimode and single-mode optical fibres. Sectional specifications for each of the four categories of multimode fibres: A1, A2, A3, and A4 (part... | |
| IEC 60793-2:2019 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60793-49:2018 applies only to multimode, graded-index glass-core (category A1) fibres. The test method is commonly used in production and research facilities, but is not easily accomplished in the field. | |
| IEC 60794-1-101:2024 applies to optical fibre cables for use with telecommunication equipment and devices employing similar techniques, and to cables having a combination of both optical fibres and electrical conductors. | |
| IEC 60794-1-104:2024 applies to optical fibre cables for use with telecommunication equipment and devices employing similar techniques, and to cables having a combination of both optical fibres and electrical conductors. | |
| IEC 60794-1-111: 2023 defines the test procedure to determine the ability of an optical fibre cable to withstand bending around a test mandrel. The primary purpose of this procedure is... | |
| IEC 60794-1-1:2011 applies to optical fibre cables for use with communication equipment and devices employing similar techniques and to cables having a combination of both optical fibres and electrical conductors. | |
| IEC 60794-1-1:2015 applies to optical fibre cables for use with communication equipment and devices employing similar techniques and to cables having a combination of both optical fibres and electrical conductors. | |
| IEC 60794-1-1:2015 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60794-1-1:2023 applies to optical fibre cables for use with communication equipment and devices employing similar techniques. Electrical properties are specified for optical ground wire (OPGW) and optical phase conductor... | |
| IEC 60794-1-1:2023 CMV contains both the official standard and its commented version. The commented version provides you with a quick and easy way to compare all the changes between IEC... | |
| IEC 60794-1-201: 2024 defines test procedures to be used in establishing uniform requirements for the environmental performance of: - optical fibre cables for use with telecommunication equipment and devices employing... | |
| IEC 60794-1-209:2024 defines test procedures to be used in establishing uniform requirements for the environmental performance of: - optical fibre cables for use with telecommunication equipment and devices employing similar... | |
| IEC 60794-1-20:2014 applies to optical fibre cables for use with telecommunication equipment and devices employing similar techniques, and to cables having a combination of both optical fibres and electrical conductors. | |
| IEC 60794-1-211:2021 defines test procedures to measure the shrinkage of the sheath due to thermal exposure of cables. A first test method, F11A, is included for cables where the fibre... | |
| IEC 60794-1-212:2024 defines the test procedure to examine the attenuation behaviour (change in attenuation) when an optical fibre cable with cable elements fixed at both ends is subjected to temperature... | |
| IEC 60794-1-213:2024 defines test procedures to be used in establishing uniform requirements for the environmental performance of microduct. The test determines the capability of the microduct to withstand internal pressure... | |
| IEC 60794-1-215:2020 defines test procedures to be used in establishing uniform requirements for the environmental performance of - optical fibre cables for use with telecommunication equipment and devices employing similar... | |
| IEC 60794-1-217:2024 series defines the test procedure to measure the permanent fibre protrusion compared to the cable elements and cable sheath due to thermal exposure of a cable. This document... | |
| IEC 60794-1-219:2021 applies to optical fibre cables for use with telecommunication equipment and devices employing similar techniques, as well as hybrid telecommunication cables having a combination of both optical fibres... | |
| IEC 60794-1-21:2015 applies to optical fibre cables for use with telecommunication equipment and devices employing similar techniques, and to cables having a combination of both optical fibres and electrical conductors. | |
| IEC 60794-1-21:2015+A1:2 020 applies to optical fibre cables for use with telecommunication equipment and devices employing similar techniques, and to cables having a combination of both optical fibres and electrical... | |
| IEC 60794-1-220:2022 defines a test standard to determine the ability of an optical fibre cable to withstand the effects of a controlled salt atmosphere. This document applies to optical ground... | |
| IEC 60794-1-22:2012(E) applies to optical fibre cables for use with telecommunication equipment and devices employing similar techniques, and to cables having a combination of both optical fibres and electrical conductors. | |
| IEC 60794-1-22:2017 defines test procedures to be used in establishing uniform requirements for the environmental performance of: - optical fibre cables for use with telecommunication equipment and devices employing similar... | |
| IEC 60794-1-22:2017 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60794-1-23:2019 describes test procedures to be used in establishing uniform requirements for the geometrical, material, mechanical, environmental properties of optical fibre cable elements. This document applies to optical fibre... | |
| IEC 60794-1-23:2019 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60794-1-24:2014 applies to optical fibre cables for use with telecommunication equipment and devices employing similar techniques, and to cables having a combination of both optical fibres and electrical conductors. | |
| IEC 60794-1-2: 2017 applies to optical fibre cables for use with telecommunications equipment and devices employing similar techniques, and to cables having a combination of both optical fibres and electrical... | |
| IEC 60794-1-2:2013 applies to optical fibre cables for use with telecommunication equipment and devices employing similar techniques, and to cables having a combination of both optical fibres and electrical conductors. | |
| IEC 60794-1-2:2021 applies to optical fibre cables for use with telecommunications equipment and devices employing similar techniques, and to cables having a combination of both optical fibres and electrical conductors. | |
| IEC 60794-1-2:2021 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60794-1-303: 2023 describes test procedures to be used in establishing uniform requirements for the geometrical properties of optical fibre ribbons. This document applies to optical fibre ribbons for use... | |
| IEC 60794-1-305:2023 describes test procedures to be used in establishing uniform requirements for optical fibre ribbons as optical fibre cable elements for the mechanical property-tear (separability). This document applies to... | |
| IEC 60794-1-306: 2023 describes test procedures to verify the mechanical and functional integrity of the fibre ribbon structure. The test determines the capability of the ribbon to withstand torsion without... | |
| IEC 60794-1-308: 2023 describes test procedures to evaluates the degree of permanent twist in an uncabled ribbon or in a cabled optical fibre ribbon. This document applies to optical fibre... | |
| IEC 60794-1-309:2023 describes the test procedures to be used in establishing uniform requirements for optical fibre cable elements, filling compounds or flooding compounds, for the environmental property-bleeding and evaporation. This... | |
| IEC 60794-1-310:2022 describes test procedures to be used in establishing uniform requirements of optical fibre cable elements for the mechanical property – strippability. This document applies to optical fibre cables... | |
| IEC 60794-1-311:2024 describes test procedures to be used in establishing uniform requirements of optical fibre cable elements for the mechanical property – tensile strength and elongation at break. This document... | |
| IEC 60794-1-31:2018 which is a generic specification, covers optical fibre ribbons. Requirements which are described in this part apply to optical fibre ribbon cables for use with telecommunication equipment and... | |
| IEC 60794-1-31:2021 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy... | |
| IEC 60794-1-31:2021 which is a generic specification, covers optical fibre ribbons. Requirements which are described in this part apply to optical fibre ribbon cables for use with telecommunication equipment and... | |
| IEC 60794-23:2012 applies to optical fibre cables for use with telecommunication equipment and devices employing similar techniques, and to cables having a combination of both optical fibres and electrical conductors... | |
| IEC 60794-301:2023 describes test procedures to be used in establishing uniform requirements of optical fibre cable elements for the mechanical property – bending. This document applies to optical fibre cables... | |
| Incorporates Amendment 1 (1991). | |
| Lays down mandatory general requirements and gives examples of acceptable methods for equipment for continuous monitoring of radioactivity in gaseous effluents. Specifies general characteristics, general test procedures, radiation, electrical, safety... | |
| Lays down specific standard requirements, including technical characteristics and general test conditions, and gives examples of acceptable methods for iodine monitors. | |
| Lays down specific standard requirements, including technical characteristics and general test conditions, and gives examples of acceptable methods for noble gas effluent monitors. | |
| Lays down uniform methods of expression of the properties of logic analyzers, and more particularly: -defines special terminology and catalogue data related to these types of apparatus; -specifies conditions and... | |
| Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels... | |
| Modification of the validity date: now put at 2007. | |
| Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. The contents of the corrigendum... | |
| Provides a list, and gives an overview of, the documents giving the uniform requirements for measuring and testing optical fibres, thereby assisting in the inspection of fibres and cables for... | |
| Provides a method for measuring the steady state response of optical fibres and optical cables exposed to gamma radiation. It can be used to determine the level of radiation-induced attenuation... | |
| Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. | |
| Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily... | |
| Provides a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive... | |
| Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes... | |
| Provides a test procedure for determining the ability of semiconductor devices and components and/or board assemblies to withstand mechanical stresses induced by alternating high and low temperature extremes. Permanent changes... | |
| Provides methods for measuring the cut-off wavelength of single-mode optical fibres. The test method applies to a sample fibre in either an uncabled condition, or in a cable, or as... | |
| Provides product specifications for coated optical fibres with or without buffer and deals with two classes of optical fibres, class A (multimode) and class B (single mode). There are at... | |
| Provides technical guidance for inspection and routine testing of transmitters, for instance as acceptance tests or after repair. For full evaluation, IEC 60770 should be used. | |
| Provides values of the tensile strength of optical fibre samples. Tensile strength values depend on the sample length, loading velocity and environmental conditions. The test can be used for inspection... | |
| Provides various tests for determining the integrity between the lead/package interface and the lead itself when the lead(s) are bent due to faulty board assembly followed by rework of the... | |
| Same as IEC 60761-2 but for monitoring of iodine in any gaseous form. | |
| Same as IEC 60761-2 but for monitoring of tritium in any gaseous form. | |
| Same as IEC 60761-2 but for radioactive noble gas effluent monitors. | |
| Serves as a Blank Detail Specification for a high quality approval system and contains requirements for style and layout and minimum content of detail specifications. These requirements are applicable when... | |
| Specifies a method for the determination of the amount of halogen acid gas, other than hydrofluoric acid, evolved during the combustion of compounds based on halogenated polymers and compounds containing... | |
| Specifies a method for the determination of the degree of acidity of gases evolved during the combustion of compounds taken from the components of electric or optical cables. Has the... | |
| Specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics | |
| Specifies audio-frequency calibration tapes to be used for adjusting the sensitivity and the frequency response of the audio reproducing systems of transverse track recorders for 625 line-50 field systems operating... | |
| Specifies requirements for industrial platinum resistance thermometer sensors suitable for all or parts of the temperature range -200°C to +850°C with two tolerance classes. It is primarily concerned with sheathed... | |
| Specifies standards on the subcategories of semicustom integrated circuits. Provides basic information on terminology and graphical symbols, essential ratings and characteristics, functional specifications, measuring methods, acceptance and reliability. | |
| Specifies test methods for declaring the characteristics of Anger type gamma cameras. The latter are composed of a collimator, a detector shield and a radiation detector assembly, together with recording... | |
| Specifies test methods to permit the determination of the essential parameters and technical characteristics of electroheating installations comprising electro-slag remelting furnaces. | |
| specifies the methods for reviewing the functionality and the degree of intelligence in intelligent transmitters, for testing the operational behaviour, as well as the static and dynamic performance of an... | |
| Specifies the time base errors of the monochrome as well as of the colour composite video signal reproduced from two head helical-scan domestic video recorders, recording one field on each... | |
| Standard | |
| The contents of the corrigendum of June 1996 have been included in this copy. | |
| The dimensions of integrated circuit devices being continually reduced, to obtain better performance and higher density, the electric fields within the die will increase, which leads to reduced reliability. This... | |
| The object of this standard is to specify terminology and test methods for declaring the characteristics of Anger type Gamma cameras. These consist of a collimator, a detector shield and... | |
| The purpose of these examinations is to check the internal materials, construction and workmanship of film and hybrid integrated circuits (F and HFICs). These examinations will normally be used prior... | |
| The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification. | |
| The S-VHS ET mode records an S-VHS signal format on a VHS cassette. In this mode, several video signal system recording parameters are switched so that the signal characteristics recorded... | |
| The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated... | |
| The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing... | |
| These series supersede series 148. | |
| This application guide presents a practical method to be used when calculating short-circuit currents in low-voltage networks. The method corresponds strictly with IEC 60909 and leads to conservative results with... | |
| This part of IEC 60747 gives product specific standards for terminology, letter symbols, essential ratings and characteristics, verification of ratings and methods of measurement for insulated-gate bipolar transistors (IGBTs). The... | |
| This part of IEC 60749 establishes a procedure for measuring the soft error susceptibility of semiconductor devices with memory when subjected to energetic particles such as alpha radiation. Two tests... | |
| This part of IEC 60774 is applicable to frequency modulation (FM) audioi recording fully compatible with the VHS system defined in IEC 60774-1. The object of this standard is to... | |
| This part of IEC 60793-2 is applicable to optical fibre categories A4a, A4b, A4c, A4d, A4e, A4f, A4g and A4h. These fibres have a plastic core and plastic cladding and... | |
| This publication gives standards for the following categories or sub-categories of devices: -Combinatorial and sequential digital circuits; -Integrated circuit memories; -Integrated circuit microprocessors; -Charge-transfer devices. Should be used together with... | |
| This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and... | |
| Two methods are described for measuring bandwidth: impulse response and frequency response. Both methods apply to the measurement of bandwidth of category A1 multimode fibres. Application to other categories of... | |
| Used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors. This happens... | |
| Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices. |
| << Prev | Next >> |