Nikon Metrology Datasheets for Tomography and Digital Imaging NDT Systems
Tomography and digital imaging NDT systems create 3D images of patients or products by capturing 2D cross-sectional images and applying mathematical or computed reconstruction techniques.
Tomography and Digital Imaging NDT Systems: Learn more
| Product Name | Notes |
|---|---|
| MCT225 offering absolute accuracy for inside geometry This new ‘absolute-accuracy’ Metrology-CT (MCT) system guarantees that all internal and external geometry is measured efficiently. A proprietary liquid cooled micro-focus reflection source... | |
| Unique XT H 450 micro-focus X-ray and CT system for turbine blade and casting inspection The XT H 450 system offers the necessary source power to penetrate through high density... | |
| XT H 225 for all-purpose X-ray and CT inspection The versatile XT H 225 system offers a powerful microfocus X-ray source, a large inspection volume, high image resolution and is... | |
| XT H 225/320 LC for X-ray and CT inspection of larger samples The XT H 225/320 LC features a more powerful microfocus X-ray source that is able to run highly... | |
| XT V 130C - Cost-effective X-ray inspection of electronic components The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system. The system features a 130kv/10... | |
| XT V 160 high-quality PCB inspection system The XT V 160 is specifically designed for use in production lines and failure analysis laboratories. With a precision joystick, system users control... | |
| XT V 160 NF Nanofocus X-ray inspection XT V 160 NF is a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor... | |
| An important challenge to manufacturers is to increase product quality, which can be achieved through 100% part inspection. Traditionally, X-ray Computed Tomography (CT) has been a valuable tool mainly used... | |
| The C2 platform is a high-precision, extra large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 7-axis manipulator. Supporting dual sources up... | |
| The M1 system is an economical, large-envelope modular inspection system. The perimeter frame and cantilevered sample stage allows for free and clear access around the sample stage for ease of... | |
| The M2 system is a high-precision large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 8 axis manipulator. Supporting dual sources up... | |
| The XT H 225 ST is a Computed Tomography (CT) system ideally suited to a wide range of materials and sample sizes, especially those that are too large or heavy... |