Nikon Metrology Datasheets for Tomography and Digital Imaging NDT Systems

Tomography and digital imaging NDT systems create 3D images of patients or products by capturing 2D cross-sectional images and applying mathematical or computed reconstruction techniques.
Tomography and Digital Imaging NDT Systems: Learn more

Product Name Notes
MCT225 Absolute Accuracy Metrology Computed Tomography System MCT225 offering absolute accuracy for inside geometry This new ‘absolute-accuracy’ Metrology-CT (MCT) system guarantees that all internal and external geometry is measured efficiently. A proprietary liquid cooled micro-focus reflection source...
XT H 450 High Power 450KV Micro Computed Tomography System Unique XT H 450 micro-focus X-ray and CT system for turbine blade and casting inspection The XT H 450 system offers the necessary source power to penetrate through high density...
XT H 225 Industrial Computed Tomography System XT H 225 for all-purpose X-ray and CT inspection The versatile XT H 225 system offers a powerful microfocus X-ray source, a large inspection volume, high image resolution and is...
XT H 225/320 LC Large Cabinet Industrial Computed Tomography System XT H 225/320 LC for X-ray and CT inspection of larger samples The XT H 225/320 LC features a more powerful microfocus X-ray source that is able to run highly...
XT V 130C Electronics X-ray System XT V 130C - Cost-effective X-ray inspection of electronic components The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system. The system features a 130kv/10...
XT V 160 High-Quality PCB Inspection System XT V 160 high-quality PCB inspection system The XT V 160 is specifically designed for use in production lines and failure analysis laboratories. With a precision joystick, system users control...
XT V 160 NF Nanofocus X-ray Inspection XT V 160 NF Nanofocus X-ray inspection XT V 160 NF is a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor...
X-ray Computed Tomography An important challenge to manufacturers is to increase product quality, which can be achieved through 100% part inspection. Traditionally, X-ray Computed Tomography (CT) has been a valuable tool mainly used...
Extra Large-Envelope X-Ray/CT Inspection System -- C2 The C2 platform is a high-precision, extra large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 7-axis manipulator. Supporting dual sources up...
Configurable X-ray/ CT Inspection System -- M1 The M1 system is an economical, large-envelope modular inspection system. The perimeter frame and cantilevered sample stage allows for free and clear access around the sample stage for ease of...
High-Precision X-ray/ CT Inspection System -- M2 The M2 system is a high-precision large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 8 axis manipulator. Supporting dual sources up...
Industrial CT Scanning System -- XT H 225 ST The XT H 225 ST is a Computed Tomography (CT) system ideally suited to a wide range of materials and sample sizes, especially those that are too large or heavy...