Nikon Metrology XT V 130C Electronics X-ray System

Description
XT V 130C - Cost-effective X-ray inspection of electronic components The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system. The system features a 130kv/10 watt Nikon Metrology manufactured source, a globally recognized open tube design with integrated generator, and a high-resolution imaging chain. Through a series of factory and field upgrades, the end-user can configure these systems to its own needs with a higher power source, a rotating sample tray, automatic inspection software, a digital flat panel option, and the ability to add future-proof CT technology. Key benefits Proprietary 30-130kv micro-focus source with 2μm feature recognition True 75° manipulator tilting angle allows oblique viewing for easy inspection of internal features Large measurement area of 406x406mm Intuitive joystick navigation drives real-time X-ray imaging Dual display for combined measurement and real-time analysis Low cost of ownership and maintenance with open-tube technology Safety as a design criterion CT ready
Datasheet

Suppliers

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Product
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XT V 130C Electronics X-ray System -  - Nikon Metrology
Leuven, Belgium
XT V 130C Electronics X-ray System
XT V 130C Electronics X-ray System
XT V 130C - Cost-effective X-ray inspection of electronic components The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system. The system features a 130kv/10 watt Nikon Metrology manufactured source, a globally recognized open tube design with integrated generator, and a high-resolution imaging chain. Through a series of factory and field upgrades, the end-user can configure these systems to its own needs with a higher power source, a rotating sample tray, automatic inspection software, a digital flat panel option, and the ability to add future-proof CT technology. Key benefits Proprietary 30-130kv micro-focus source with 2μm feature recognition True 75° manipulator tilting angle allows oblique viewing for easy inspection of internal features Large measurement area of 406x406mm Intuitive joystick navigation drives real-time X-ray imaging Dual display for combined measurement and real-time analysis Low cost of ownership and maintenance with open-tube technology Safety as a design criterion CT ready

XT V 130C - Cost-effective X-ray inspection of electronic components

The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system. The system features a 130kv/10 watt Nikon Metrology manufactured source, a globally recognized open tube design with integrated generator, and a high-resolution imaging chain.

Through a series of factory and field upgrades, the end-user can configure these systems to its own needs with a higher power source, a rotating sample tray, automatic inspection software, a digital flat panel option, and the ability to add future-proof CT technology.

Key benefits

  • Proprietary 30-130kv micro-focus source with 2μm feature recognition
  • True 75° manipulator tilting angle allows oblique viewing for easy inspection of internal features
  • Large measurement area of 406x406mm
  • Intuitive joystick navigation drives real-time X-ray imaging
  • Dual display for combined measurement and real-time analysis
  • Low cost of ownership and maintenance with open-tube technology
  • Safety as a design criterion
  • CT ready
Supplier's Site Datasheet

Technical Specifications

  Nikon Metrology
Product Category Nondestructive Testing (NDT) Equipment
Product Name XT V 130C Electronics X-ray System
Form Factor Monitoring System
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