Nikon Metrology XT V 160 NF Nanofocus X-ray Inspection

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XT V 160 NF Nanofocus X-ray Inspection -  - Nikon Metrology
Leuven, Belgium
XT V 160 NF Nanofocus X-ray Inspection
XT V 160 NF Nanofocus X-ray inspection XT V 160 NF is a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor device and PCBA applications. Key benefits <0.1 ┬Ám feature recognition up to 6 W power High precision manipulator with vibration reduction 3Mpixel flat panel for ultra high definition Large tray to load multiple components and boards as well as 450 mm wafer ready Productivity increase by automation and instant reporting
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Technical Specifications

  Nikon Metrology
Product Category Nondestructive Testing (NDT) Equipment
Product Name XT V 160 NF Nanofocus X-ray Inspection
Form Factor Monitoring System
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