XT V 160 NF Nanofocus X-ray inspection
XT V 160 NF is a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor device and PCBA applications.
<0.1 µm feature recognition up to 6 W power
High precision manipulator with vibration reduction
3Mpixel flat panel for ultra high definition
Large tray to load multiple components and boards as well as 450 mm wafer ready
Productivity increase by automation and instant reporting