Nikon Metrology Datasheets for Nondestructive Testing (NDT) Equipment
Non-destructive testing (NDT) equipment is used to detect, inspect, and measure flaws, bond integrity, and other material conditions without permanently altering or destroying the examined part or product. NDT equipment includes a wide variety of instruments and systems.
Nondestructive Testing (NDT) Equipment: Learn more
| Product Name | Notes |
|---|---|
| MCT225 offering absolute accuracy for inside geometry This new ‘absolute-accuracy’ Metrology-CT (MCT) system guarantees that all internal and external geometry is measured efficiently. A proprietary liquid cooled micro-focus reflection source... | |
| Unique XT H 450 micro-focus X-ray and CT system for turbine blade and casting inspection The XT H 450 system offers the necessary source power to penetrate through high density... | |
| XT H 225 for all-purpose X-ray and CT inspection The versatile XT H 225 system offers a powerful microfocus X-ray source, a large inspection volume, high image resolution and is... | |
| XT H 225/320 LC for X-ray and CT inspection of larger samples The XT H 225/320 LC features a more powerful microfocus X-ray source that is able to run highly... | |
| XT V 130C - Cost-effective X-ray inspection of electronic components The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system. The system features a 130kv/10... | |
| XT V 160 high-quality PCB inspection system The XT V 160 is specifically designed for use in production lines and failure analysis laboratories. With a precision joystick, system users control... | |
| XT V 160 NF Nanofocus X-ray inspection XT V 160 NF is a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor... | |
| An important challenge to manufacturers is to increase product quality, which can be achieved through 100% part inspection. Traditionally, X-ray Computed Tomography (CT) has been a valuable tool mainly used... | |
| The C2 platform is a high-precision, extra large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 7-axis manipulator. Supporting dual sources up... | |
| The M1 system is an economical, large-envelope modular inspection system. The perimeter frame and cantilevered sample stage allows for free and clear access around the sample stage for ease of... | |
| The M2 system is a high-precision large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 8 axis manipulator. Supporting dual sources up... | |
| The XT H 225 ST is a Computed Tomography (CT) system ideally suited to a wide range of materials and sample sizes, especially those that are too large or heavy... |