Nikon Metrology XT H 225/320 LC Large Cabinet Industrial Computed Tomography System

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XT H 225/320 LC Large Cabinet Industrial Computed Tomography System -  - Nikon Metrology
Leuven, Belgium
XT H 225/320 LC Large Cabinet Industrial Computed Tomography System
XT H 225/320 LC for X-ray and CT inspection of larger samples The XT H 225/320 LC features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects. Nikon Metrology is the only company to produce 320kV microfocus X-ray sources. As the X-ray spot size of these sources is orders of magnitude smaller compared to minifocus sources, end users benefit from superior resolution, accuracy and a wider array of measurable parts. With the optional rotation reflection target, an even higher X-ray flux is available enabling customers to obtain faster CT data acquisition or achieve higher CT data accuracy in the same time span Key benefits Proprietary 225/320kV microfocus X-ray source Run highly accurate inspection on dense industrial objects Easy system operation and low cost-of-ownership Stunning images providing great insight High performance image acquisition and volume processing Straightforward inspection automation Safety first
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  Nikon Metrology
Product Category Nondestructive Testing (NDT) Equipment
Product Name XT H 225/320 LC Large Cabinet Industrial Computed Tomography System
Form Factor Monitoring System
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