Nikon Metrology XT H 225 Industrial Computed Tomography System

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XT H 225 Industrial Computed Tomography System -  - Nikon Metrology
Leuven, Belgium
XT H 225 Industrial Computed Tomography System
XT H 225 for all-purpose X-ray and CT inspection The versatile XT H 225 system offers a powerful microfocus X-ray source, a large inspection volume, high image resolution and is ready for ultrafast CT reconstruction. They cover a wide range of applications, including the inspection of small castings, plastic parts and complex mechanisms as well as researching materials and natural specimens. Key benefits Proprietary 225kV microfocus X-ray source with 3┬Ám focal spot size Easy system operation and low cost-of-ownership Stunning images providing great insight High performance image acquisition and volume processing Straightforward inspection automation Safety first
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Technical Specifications

  Nikon Metrology
Product Category Nondestructive Testing (NDT) Equipment
Product Name XT H 225 Industrial Computed Tomography System
Form Factor Monitoring System
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