Nikon Metrology Datasheets for X-ray Instruments and X-ray Systems
X-ray instruments and X-ray systems use penetrating X-rays or gamma radiation to capture images of the internal structure of a part or finished product.
X-ray Instruments and X-ray Systems: Learn more
| Product Name | Notes |
|---|---|
| MCT225 offering absolute accuracy for inside geometry This new ‘absolute-accuracy’ Metrology-CT (MCT) system guarantees that all internal and external geometry is measured efficiently. A proprietary liquid cooled micro-focus reflection source... | |
| Unique XT H 450 micro-focus X-ray and CT system for turbine blade and casting inspection The XT H 450 system offers the necessary source power to penetrate through high density... | |
| XT H 225 for all-purpose X-ray and CT inspection The versatile XT H 225 system offers a powerful microfocus X-ray source, a large inspection volume, high image resolution and is... | |
| XT H 225/320 LC for X-ray and CT inspection of larger samples The XT H 225/320 LC features a more powerful microfocus X-ray source that is able to run highly... | |
| XT V 160 NF Nanofocus X-ray inspection XT V 160 NF is a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor... | |
| An important challenge to manufacturers is to increase product quality, which can be achieved through 100% part inspection. Traditionally, X-ray Computed Tomography (CT) has been a valuable tool mainly used... | |
| The C2 platform is a high-precision, extra large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 7-axis manipulator. Supporting dual sources up... | |
| The M1 system is an economical, large-envelope modular inspection system. The perimeter frame and cantilevered sample stage allows for free and clear access around the sample stage for ease of... | |
| The M2 system is a high-precision large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 8 axis manipulator. Supporting dual sources up... | |
| The XT H 225 ST is a Computed Tomography (CT) system ideally suited to a wide range of materials and sample sizes, especially those that are too large or heavy... |