PTB Sales, Inc. Datasheets for Wafer and Thin Film Instrumentation
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
Wafer and Thin Film Instrumentation: Learn more
| Product Name | Notes |
|---|---|
| Four Point Probe Automatic Resistivity Meter Easy to operate: simply load the wafer and close the lid. Automatic calculation and display of sheet or slice resistivity, V/I, metallization thickness, and... | |
| Ask for current price. The Veeco Dektak V200-Si is an advanced surface profilometer that measures surface texture below submicro-inch and film thickness to 262 �m with high accuracy. | |
| Ask for pricing. The Dektak IIA is used for making accurate measurements on small vertical features ranging in height from 100 to 655,000 angstroms. Dektak IIA acquires data by moving... | |
| Ozone generators can be sold individually or as a system. Applied Science and Technology (ASTeX). | |
| PTB Sales toll free: 866-332-0500 | |
| The STC-200 utilizes the time tested 6Mhz quartz crystal as the sensor device. It's CRT display allows the clear presentation of data and deposition status. Both numeric and graphical data... | |
| The Sycon STM-100 Thickness/Rate Monitor/MF a precision mass and film thickness measurement instrument for use in thin film deposition processes and other quartz crystal microbalance applications. | |
| The Wentworth MP-926 is a manual probe station that accepts wafers up to 6 inches in diameter. It features a rugged and stable cast aluminum base. It also has a... |