Wafer and Thin Film Instrumentation Datasheets

Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
Search By Specification | Manufacturers and Distributors | Wafer and Thin Film Instrumentation: Selection Guide

Wafer and Thin Film Instrumentation Datasheets From:
Headquarters
Zygo Corporation
United States
Advanced Energy Industries, Inc.
Fort Collins, CO
Bruker Corporation
Billerica, MA
Cascade Microtech, Inc.
Beaverton, OR
Copper Mountain Technologies
Indianapolis, IN
Filmetrics, Inc.
San Diego, CA
Hiden Analytical
Livonia, MI
Hitachi High Technologies America, Inc.
Schaumburg, IL
Imego
Sweden
KEYENCE
Elmwood Park, NJ
MicroSense, LLC
Lowell, MA
MTI Instruments Inc.
Albany, NY
Nanotronics Imaging
Cuyahoga Falls, OH
Nikon Metrology
Belgium
Nor-Cal Products, Inc. - The Vacuum Experts
Yreka, CA
Palomar Technologies, Inc
United States
Park Systems, Inc.
United States
Phenom-World BV
Netherlands
Polytec, Inc.
Irvine, CA
PTB Sales, Inc.
United States
Rigaku Corporation
The Woodlands, TX
SemiProbe
Winooski, VT
StellarNet, Inc.
Tampa, FL
Technic, Inc.
Cranston, RI
TSI Incorporated
United States
Unitron Ltd.
Commack, NY
WDI Wise Device Inc.
Canada
Xenemetrix Ltd.
Israel