Xenemetrix Ltd. Datasheets for Wafer and Thin Film Instrumentation

Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
Wafer and Thin Film Instrumentation: Learn more

Product Name Notes
EDXRF Analyzer -- EX-6600 SDD EX-6600 SDD Secondary Target EDXRF Xenemetrix’s EX-6600 SDD Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer offers the ultimate in sensitivity and selectivity. The Silicon Drift Detector (SDD) simultaneously delivers lower electronic...
EDXRF Analyzer -- RoHS Vision RoHS Vision The Fast and Easy Method for Ensuring Compliance with Regulations for Hazardous Substances The Restriction of Hazardous Substances Directive (RoHS) restricts toxic metals in electrical and electronic equipment.
EDXRF Analyzer -- S-Mobile SDD S-Mobile SDD Brings the power of laboratory spectrometer to the field A small compact analyzer that can be taken to the job site. When the task calls for fast real...
EDXRF Analyzer -- S-Mobile ULS S-Mobile ULS Brings the power of laboratory spectrometer to the field This portable analyzer is specially adapted for Ultra Low Sulfur applications. Complies with the latest and most severe international...
EDXRF Analyzer -- X-Calibur SDD X-Calibur SDD Bench Top EDXRF Spectrometer versatile, high energy resolution Our X-Calibur SDD EDXRF spectrometer features similar configuration like X-Calibur but with Silicon Drift Detector. Thanks to SDD high count...
EDXRF Analyzer -- X-Cite X-Cite Bench Top EDXRF Spectrometer economical, accurate, easy to use Xenemetrix’s powerful X-Cite benchtop Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer enables system operators to identify the elemental composition of samples.
EDXRF Analyzer -- X-PMA X-PMA Precious Metals EDXRF Spectrometer fast, accurate, easy to use XRF is a non-destructive analytical technique that can rapidly and easily identify and determine the presence of various elements such...