Xenemetrix Ltd. Datasheets for Wafer and Thin Film Instrumentation
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
Wafer and Thin Film Instrumentation: Learn more
| Product Name | Notes |
|---|---|
| EDXRF Analyzer -- EX-6600 SDD | EX-6600 SDD Secondary Target EDXRF Xenemetrix’s EX-6600 SDD Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer offers the ultimate in sensitivity and selectivity. The Silicon Drift Detector (SDD) simultaneously delivers lower electronic... |
| EDXRF Analyzer -- RoHS Vision | RoHS Vision The Fast and Easy Method for Ensuring Compliance with Regulations for Hazardous Substances The Restriction of Hazardous Substances Directive (RoHS) restricts toxic metals in electrical and electronic equipment. |
| EDXRF Analyzer -- S-Mobile SDD | S-Mobile SDD Brings the power of laboratory spectrometer to the field A small compact analyzer that can be taken to the job site. When the task calls for fast real... |
| EDXRF Analyzer -- S-Mobile ULS | S-Mobile ULS Brings the power of laboratory spectrometer to the field This portable analyzer is specially adapted for Ultra Low Sulfur applications. Complies with the latest and most severe international... |
| EDXRF Analyzer -- X-Calibur SDD | X-Calibur SDD Bench Top EDXRF Spectrometer versatile, high energy resolution Our X-Calibur SDD EDXRF spectrometer features similar configuration like X-Calibur but with Silicon Drift Detector. Thanks to SDD high count... |
| EDXRF Analyzer -- X-Cite | X-Cite Bench Top EDXRF Spectrometer economical, accurate, easy to use Xenemetrix’s powerful X-Cite benchtop Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer enables system operators to identify the elemental composition of samples. |
| EDXRF Analyzer -- X-PMA | X-PMA Precious Metals EDXRF Spectrometer fast, accurate, easy to use XRF is a non-destructive analytical technique that can rapidly and easily identify and determine the presence of various elements such... |