StellarNet, Inc. Datasheets for Wafer and Thin Film Instrumentation

Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
Wafer and Thin Film Instrumentation: Learn more

Product Name Notes
Thin-Film Measuring Systems -- TF Series TF Systems for Non-Contact Film Thickness Measurements We offer a complete line of film thickness measurement systems that can measure from 5 nm to 200 ┬Ám for analysis of single...