Fischer Technology, Inc. X-Ray Fluorescence Measuring Instrument with a Programmable XY-Stage and Z-Axis for Automated Measurements of thin Coatings and for Material Analysis FISCHERSCOPE® X-RAY XDAL® 237

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X-Ray Fluorescence Measuring Instrument with a Programmable XY-Stage and Z-Axis for Automated Measurements of thin Coatings and for Material Analysis FISCHERSCOPE® X-RAY XDAL® 237
With motor-driven axes (optional) and measurement direction from top to bottom, the measurement instruments from the XDL® range enable automated serial tests. A variety of versions – differing in their X-ray source, filter, Aperture and detector – make it possible to select the X-ray device with the configuration that best suits your specific measurement task. Features: X-ray fluorescence instruments for a variety of measurement tasks, made possible through different hardware components Also suitable for testing assembled circuit boards or parts with indentations, due to the variable measuring distance (up to 80 mm) Automated serial testing with programmable XY-table and Z-axis (optional) Ideal for the measurement of very thin layers using the silicon drift detector with high energy resolution (XDAL device) Applications: Coating Thickness Measurement Measurement of coatings on large boards and flexible circuit boards (flex PCBs) Thin conductive and/or separating layers on circuit boards Coatings on three-dimensional components Chrome coatings, for example plastic items with decorative chrome finish Material Analysis Analysis of electroplating baths Analysis of functional coatings in the electronics and semiconductor industry Analysis of hard material coatings, for example CrN, TiN or TiCN
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  Fischer Technology, Inc.
Product Category Nondestructive Testing (NDT) Equipment
Product Number FISCHERSCOPE® X-RAY XDAL® 237
Product Name X-Ray Fluorescence Measuring Instrument with a Programmable XY-Stage and Z-Axis for Automated Measurements of thin Coatings and for Material Analysis
Form Factor Bench / Rack / Cabinet
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