Micro-Epsilon Group Datasheets for Surface Profilometers

Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters.
Surface Profilometers: Learn more

Product Name Notes
reflectCONTROL Compact -- RCC100-105
reflectCONTROL Compact -- RCC100-140
reflectCONTROL Compact has been specifically developed for the inspection of lustrous surfaces. The system projects a striped pattern onto the measurement object. Defects on the surface cause deviations from the...
thicknessCONTROL RTP 8302 Inline Profilometer The modularly designed C-frame based sys- tems of the RTP8302 family are convincing due to their flexibility and performance in the rubber processing industry. Applying them in extruder lines or...
thicknessCONTROL TTP 8301 Inspection System The systems of the series TTP 8301 are based on the light intersection method, traversing tri- angulation, respectively. They are designed as O-frames and offer precise results in the case...
thicknessCONTROL TIP 8301 Profilometer The systems of the TIP 8301 family are designed as O-frames and significantly impress by large material width and stability as well as high preci- sion during thickness measurements. Applying...