Hamamatsu Photonics Datasheets for Flaw Detectors
Flaw detectors are used to detect or measure defects in raw materials or finished products. This product area includes fault detectors, NDT instruments that are used to find faults in electrical, mechanical, optical, or other systems.
Flaw Detectors: Learn more
| Product Name | Notes |
|---|---|
| A high-resolution X-ray imaging system combines an imaging unit that visualizes the incident X-ray beam with a phosphor and a camera. By simply selecting the main body of the X-ray... | |
| The C11750 is an optical pinhole inspection unit designed to detect pinhole defects in aluminum laminated pouches for rechargeable batteries and fuel cell separators. The C11750 is available with light... | |
| The C12190 is an optical pinhole inspection unit optimized for inspection of aluminum laminate film and metal foil. It has a detection width selectable from 300 to 1800 mm to... | |
| The C12570 series is designed to inspect pinhole defects in aluminum laminated film and metal foil. Among pinhole inspection units for film, the C12570 series has the highest sensitivity capable... | |
| The C12760 is a versatile pinhole inspection unit designed for rechargeable battery separators and can detect pinholes in translucent materials that allow light to pass through and so cannot be... |