Hiden Analytical Datasheets for Ion Milling Systems
Ion milling systems use an ion beam to thin samples for transmission electron microscopy. Focused ion beam (FIB) systems use a narrow high current beam to mill specific regions or a low current beams to image samples (FIM).
Ion Milling Systems: Learn more
|Low power, high brightness, surface ionisation source coupled to a compact ion column, providing high performance in a small package.|
|Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling|