Hiden Analytical Datasheets for Ion Milling Systems

Ion milling systems use an ion beam to thin samples for transmission electron microscopy. Focused ion beam (FIB) systems use a narrow high current beam to mill specific regions or a low current beams to image samples (FIM).
Ion Milling Systems: Learn more

Product Name Notes
IG5C 5KeV Caesium Ion Source for UHV Surface Analysis -- IG5C Low power, high brightness, surface ionisation source coupled to a compact ion column, providing high performance in a small package.
IG20 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis -- IG20 Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling