Hiden Analytical IG5C 5KeV Caesium Ion Source for UHV Surface Analysis IG5C

Description
Low power, high brightness, surface ionisation source coupled to a compact ion column, providing high performance in a small package.

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IG5C 5KeV Caesium Ion Source for UHV Surface Analysis - IG5C - Hiden Analytical
Livonia, MI, USA
IG5C 5KeV Caesium Ion Source for UHV Surface Analysis
IG5C
IG5C 5KeV Caesium Ion Source for UHV Surface Analysis IG5C
Low power, high brightness, surface ionisation source coupled to a compact ion column, providing high performance in a small package.

Low power, high brightness, surface ionisation source coupled to a compact ion column, providing high performance in a small package.

Supplier's Site

Technical Specifications

  Hiden Analytical
Product Category Wafer and Thin Film Instrumentation
Product Number IG5C
Product Name IG5C 5KeV Caesium Ion Source for UHV Surface Analysis
Form Factor Ion Beam Gun
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