Hiden Analytical IG20 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis IG20

Description
Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling
  • IG20 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis - IG20 - Hiden Analytical
    Hiden Analytical
Description
Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling

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IG20 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis - IG20 - Hiden Analytical
Hiden Analytical
Livonia, MI, USA
IG20 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis
IG20
IG20 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis IG20
Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling

Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling

Supplier's Site

Technical Specifications

  Hiden Analytical
Product Category Wafer and Thin Film Instrumentation
Product Number IG20
Product Name IG20 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis
Form Factor Ion Beam Gun
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