Hiden Analytical IG20 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis IG20

Hiden Analytical

Description

Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling

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Hiden Analytical

Livonia, MI, USA

IG20 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis
IG20

IG20 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis IG20

Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling

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Technical Specifications

	Hiden Analytical
Product Category	Wafer and Thin Film Instrumentation
Product Number	IG20
Product Name	IG20 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis
Form Factor	Ion Beam Gun

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