Hiden Analytical IG20 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis IG20

Description

Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling

Hiden Analytical

Description

Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling

Suppliers

Company

Product

Description

Supplier Links

Hiden Analytical

Livonia, MI, USA

IG20 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis
IG20

IG20 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis IG20

Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling

Supplier's Site

Technical Specifications

	Hiden Analytical
Product Category	Wafer and Thin Film Instrumentation
Product Number	IG20
Product Name	IG20 5 KeV Argon or Oxygen Ion Source for UHV Surface Analysis
Form Factor	Ion Beam Gun

Unlock Full Specs

to access all available technical data

Similar Products

JEOL USA, Inc.

EC-52000IC ION CLEANER

Specs

Form Factor Monitor or instrument

Mounting / Loading Floor

View Details

Cosmic Equipment SpA

Wafer MV

fti-1000-wafer-mv

Specs

Form Factor Monitor or instrument

Applications Wafer

View Details

Daitron Co., Ltd.

Chip Tester

Specs

Form Factor Monitor or instrument

Mounting / Loading Floor

Applications Wafer

View Details

Xenemetrix Ltd.

EDXRF Analyzer

X-Calibur SDD

Specs

Form Factor Monitor or instrument

Mounting / Loading Manual loading; Floor

Technology Spectrometer (SIMS, XRF, FTIR, DLTS, AAS); EDXRF

View Details