SemiProbe Datasheets for Imaging Workstations
Imaging workstations are vision systems used for metrology or image analysis in laboratory and cleanroom settings.
Imaging Workstations: Learn more
| Product Name | Notes |
|---|---|
| Manual Prober for contacting of active devices on both sides of the wafer. Precision controls enable the user to probe from the top side of the wafer, the bottom side... | |
| Manual, semiautomatic and fully automatic systems with probing capabilities ranging from individual die to >450 mm wafers/substratesThe Probe System for Life (PS4L) family of wafer probing systems is designed based... | |
| SA-8VP Semiautomatic Vacuum Probing System The ONLY vacuum probing system designed to grow with your requirements and your business Easily customized to meet a variety of applications and budgets Ideal... | |
| SemiProbe IRIS inspection systems inspect, locate and identify defects created during wafer manufacturing, probing, bumping, dicing or general handling, providing microelectronic device manufacturers with accurate, timely quality assurance and process... | |
| The LA-50 DC is an economical, small footprint 50 mm (2”) probe system for R&D centers and Universities with the stability and flexibility you need for your work. It is... | |
| The ONLY production vacuum probing system designed to grow with your requirements and your business. • Probing modules can be added or exchanged with no interruption to your test operation... | |
| The SemiProbe Lab Assistant family of probe systems is specifically designed to address the requirements of Universities and research personnel - simplicity and ease of operation, portability, affordability and modularity. |