SemiProbe Specialty Probe System Simultaneous Double-Sided Prober (DSP)

Description
Manual Prober for contacting of active devices on both sides of the wafer. Precision controls enable the user to probe from the top side of the wafer, the bottom side of the wafer, or to simultaneously probe the top and bottom sides of the wafer.
  • Specialty Probe System - Simultaneous Double-Sided Prober (DSP) - SemiProbe
    SemiProbe
Description
Manual Prober for contacting of active devices on both sides of the wafer. Precision controls enable the user to probe from the top side of the wafer, the bottom side of the wafer, or to simultaneously probe the top and bottom sides of the wafer.

Suppliers

Company
Product
Description
Supplier Links
Specialty Probe System - Simultaneous Double-Sided Prober (DSP) - SemiProbe
SemiProbe
Winooski, VT, USA
Specialty Probe System
Simultaneous Double-Sided Prober (DSP)
Specialty Probe System Simultaneous Double-Sided Prober (DSP)
Manual Prober for contacting of active devices on both sides of the wafer. Precision controls enable the user to probe from the top side of the wafer, the bottom side of the wafer, or to simultaneously probe the top and bottom sides of the wafer.

Manual Prober for contacting of active devices on both sides of the wafer. Precision controls enable the user to probe from the top side of the wafer, the bottom side of the wafer, or to simultaneously probe the top and bottom sides of the wafer.

Supplier's Site

Technical Specifications

  SemiProbe
Product Category Imaging Workstations
Product Number Simultaneous Double-Sided Prober (DSP)
Product Name Specialty Probe System
System Type Turnkey / Complete System
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