SemiProbe Datasheets for Electrical Test Probes

Electric test probes are used to establish a connection between a circuit under test and the measuring instrument.
Electrical Test Probes: Learn more

Product Name Notes
Probe Tip -- DC-11001
Probe Tip -- DC-11024
Probe Tip -- DC-11025
Probe Tip -- DC-11026
Probe Tip -- DC-11027
Probe Tip -- DC-11028
Beryllium Copper Beryllium Copper 20 mil (0.020") 35 mm (1.25") Solid Beryllium Copper probe for measurements requiring low contact resistance, sof t material reduces pad damage
Specialty Probe System -- Magnetic Stimulation System (MSS) Controlled position of a stimulation magnetic source for semiconductor probing. The system manually controls the position of the device under test (DUT), the contact probes, the microscope, and the magnetic...
Probe Tip -- DC-11034 Gold Plated solid tungsten probe for features > 100.0 um, reduced contact resistance, used to probe gold contacts/pads
Probe Tip -- DC-11016 Gold Plated solid tungsten probe for features > 30.0 um, reduced contact resistance, used to probe gold contacts/pads
Probe Tip -- DC-11031 Gold Plated solid tungsten probe for features > 40.0 um, reduced contact resistance, used to probe gold contacts/pads
Probe Tip -- DC-11032 Gold Plated solid tungsten probe for features > 50.0 um, reduced contact resistance, used to probe gold contacts/pads
Probe Tip -- DC-11033 Gold Plated solid tungsten probe for features > 60.0 um, reduced contact resistance, used to probe gold contacts/pads
Probe Tip -- DC-11019 Gold Plated solid tungsten probe for features > 80.0 um, reduced contact resistance, used to probe gold contacts/pads
Probe Tip -- DC-11007 Solid tungsten probe for structures >100.0 um, general purpose probe
Probe Tip -- DC-11005 Solid tungsten probe for structures >20.0 um, general purpose probe
Probe Tip -- DC-11006 Solid tungsten probe for structures >30.0 um, general purpose probe
Probe Tip -- DC-11004 Solid tungsten probe for structures >4.0 um, general purpose probe
Probe Tip -- DC-11008 Solid tungsten probe for structures >40.0 um, general purpose probe
Probe Tip -- DC-11030 Solid tungsten probe for structures >5.0 um, general purpose probe
Probe Tip -- DC-11009 Solid tungsten probe for structures >50.0 um, general purpose probe
Probe Tip -- DC-11002 Solid tungsten probe for structures >8.0 um, general purpose probe
Probe Tip -- DC-11013 Solid tungsten probe for structures >80.0 um, general purpose probe
Probe Tip -- DC-11000
Probe Tip -- DC-11003
Probe Tip -- DC-11012
Probe Tip -- DC-11015
Probe Tip -- DC-11018
Probe Tip -- DC-11037
Submicron probe for small featue probing, can easily be bent or cut to length
Probe Tip -- DC-11010
Probe Tip -- DC-11029
Submicron solid tungsten probe tip for small feature probing
Probe Tip -- DC-11023 Tungsten Carbide Tungsten Carbide 20 mil (0.020") 35 mm (1.25") Tungsten Carbide probe for fetures >100.0 um, can be used for cutting & high temperature applications
Probe Tip -- DC-11035 Tungsten Carbide Tungsten Carbide 20 mil (0.020") 35 mm (1.25") Tungsten Carbide probe for fetures >20.0 um, can be used for cutting & high temperature applications
Probe Tip -- DC-11020 Tungsten Carbide Tungsten Carbide 20 mil (0.020") 35 mm (1.25") Tungsten Carbide probe for fetures >30.0 um, can be used for cutting & high temperature applications
Probe Tip -- DC-11036 Tungsten Carbide Tungsten Carbide 20 mil (0.020") 35 mm (1.25") Tungsten Carbide probe for fetures >40.0 um, can be used for cutting & high temperature applications
Probe Tip -- DC-11021 Tungsten Carbide Tungsten Carbide 20 mil (0.020") 35 mm (1.25") Tungsten Carbide probe for fetures >50.0 um, can be used for cutting & high temperature applications
Probe Tip -- DC-11022 Tungsten Carbide Tungsten Carbide 20 mil (0.020") 35 mm (1.25") Tungsten Carbide probe for fetures >80.0 um, can be used for cutting & high temperature applications