SemiProbe Datasheets for Electrical Test Probes
Electric test probes are used to establish a connection between a circuit under test and the measuring instrument.
Electrical Test Probes: Learn more
| Product Name | Notes |
|---|---|
| Beryllium Copper Beryllium Copper 20 mil (0.020") 35 mm (1.25") Solid Beryllium Copper probe for measurements requiring low contact resistance, sof t material reduces pad damage | |
| Controlled position of a stimulation magnetic source for semiconductor probing. The system manually controls the position of the device under test (DUT), the contact probes, the microscope, and the magnetic... | |
| Gold Plated solid tungsten probe for features > 100.0 um, reduced contact resistance, used to probe gold contacts/pads | |
| Gold Plated solid tungsten probe for features > 30.0 um, reduced contact resistance, used to probe gold contacts/pads | |
| Gold Plated solid tungsten probe for features > 40.0 um, reduced contact resistance, used to probe gold contacts/pads | |
| Gold Plated solid tungsten probe for features > 50.0 um, reduced contact resistance, used to probe gold contacts/pads | |
| Gold Plated solid tungsten probe for features > 60.0 um, reduced contact resistance, used to probe gold contacts/pads | |
| Gold Plated solid tungsten probe for features > 80.0 um, reduced contact resistance, used to probe gold contacts/pads | |
| Solid tungsten probe for structures >100.0 um, general purpose probe | |
| Solid tungsten probe for structures >20.0 um, general purpose probe | |
| Solid tungsten probe for structures >30.0 um, general purpose probe | |
| Solid tungsten probe for structures >4.0 um, general purpose probe | |
| Solid tungsten probe for structures >40.0 um, general purpose probe | |
| Solid tungsten probe for structures >5.0 um, general purpose probe | |
| Solid tungsten probe for structures >50.0 um, general purpose probe | |
| Solid tungsten probe for structures >8.0 um, general purpose probe | |
| Solid tungsten probe for structures >80.0 um, general purpose probe | |
| Submicron probe for small featue probing, can easily be bent or cut to length | |
| Submicron solid tungsten probe tip for small feature probing | |
| Tungsten Carbide Tungsten Carbide 20 mil (0.020") 35 mm (1.25") Tungsten Carbide probe for fetures >100.0 um, can be used for cutting & high temperature applications | |
| Tungsten Carbide Tungsten Carbide 20 mil (0.020") 35 mm (1.25") Tungsten Carbide probe for fetures >20.0 um, can be used for cutting & high temperature applications | |
| Tungsten Carbide Tungsten Carbide 20 mil (0.020") 35 mm (1.25") Tungsten Carbide probe for fetures >30.0 um, can be used for cutting & high temperature applications | |
| Tungsten Carbide Tungsten Carbide 20 mil (0.020") 35 mm (1.25") Tungsten Carbide probe for fetures >40.0 um, can be used for cutting & high temperature applications | |
| Tungsten Carbide Tungsten Carbide 20 mil (0.020") 35 mm (1.25") Tungsten Carbide probe for fetures >50.0 um, can be used for cutting & high temperature applications | |
| Tungsten Carbide Tungsten Carbide 20 mil (0.020") 35 mm (1.25") Tungsten Carbide probe for fetures >80.0 um, can be used for cutting & high temperature applications |