Controlled position of a stimulation magnetic source for semiconductor probing.
The system manually controls the position of the device under test (DUT), the contact probes, the microscope, and the magnetic source.
| SemiProbe | |
|---|---|
| Product Category | Electrical Test Probes |
| Product Number | Magnetic Stimulation System (MSS) |
| Product Name | Specialty Probe System |
| Probe Type | Magnetic |
