Piezosystem Jena, Inc. Fast Scanning Piezo Microscopy Stage MICI-KMI53

Description
inverted microscope stage 25 mm manual x-y- axis adjustment 250 µm automated x-y- option fits most major brand microscopes The KMI stage provides a combination of manual and automated positioning of the microscope platform itself. Digital vernier micrometers provide 25 mm adjustment with µm precision, and special piezo-driven micrometer holders (MICI) provide up to 250 µm of nm precise automated motion. Inserts for various sample holders, such as slides, dishes, and SBS, are available.
  • Fast Scanning Piezo Microscopy Stage - MICI-KMI53 - Piezosystem Jena, Inc.
    Piezosystem Jena, Inc.
Datasheet
Description
inverted microscope stage 25 mm manual x-y- axis adjustment 250 µm automated x-y- option fits most major brand microscopes The KMI stage provides a combination of manual and automated positioning of the microscope platform itself. Digital vernier micrometers provide 25 mm adjustment with µm precision, and special piezo-driven micrometer holders (MICI) provide up to 250 µm of nm precise automated motion. Inserts for various sample holders, such as slides, dishes, and SBS, are available.
Datasheet

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Fast Scanning Piezo Microscopy Stage - MICI-KMI53 - Piezosystem Jena, Inc.
Piezosystem Jena, Inc.
Hopedale, MA, USA
Fast Scanning Piezo Microscopy Stage
MICI-KMI53
Fast Scanning Piezo Microscopy Stage MICI-KMI53
inverted microscope stage 25 mm manual x-y- axis adjustment 250 µm automated x-y- option fits most major brand microscopes The KMI stage provides a combination of manual and automated positioning of the microscope platform itself. Digital vernier micrometers provide 25 mm adjustment with µm precision, and special piezo-driven micrometer holders (MICI) provide up to 250 µm of nm precise automated motion. Inserts for various sample holders, such as slides, dishes, and SBS, are available.
  • inverted microscope stage
  • 25 mm manual x-y- axis adjustment
  • 250 µm automated x-y- option
  • fits most major brand microscopes

The KMI stage provides a combination of manual and automated positioning of the microscope platform itself. Digital vernier micrometers provide 25 mm adjustment with µm precision, and special piezo-driven micrometer holders (MICI) provide up to 250 µm of nm precise automated motion. Inserts for various sample holders, such as slides, dishes, and SBS, are available.

Supplier's Site Datasheet

Technical Specifications

  Piezosystem Jena, Inc.
Product Category Microscope Stages
Product Number MICI-KMI53
Product Name Fast Scanning Piezo Microscopy Stage
Stage Type Automated Stage
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