Highest stability
Resolution 0.1 µm
Travel range to 135 mm × 85 mm
For inverted microscopes, revolving nosepiece freely rotatable
Suitable Z sample scanner available
Velocity to 120 mm/s
Reference-Class Microscopy XY Stage
With controller and joystick. Large clear aperture 160 mm x 110 mm. Versions for inverted microscopes:
Nikon Eclipse Ti-E/Ti-U/Ti-S (M-687.UN)
Olympus IX2 (M-687.UO)
High-Resolution Piezo Linear Drive
Self-locking at rest. Low noise. Highest stability due to low thermal load and no need for lubricants. Large dynamics range of 10 µm/s to 100 mm/s, ideal for operation via joystick and automated high-content methods
Direct-Metrology Linear Encoder
High resolution and repeatability
User Software
PIMikroMove. PI General Command Set (GCS). Drivers for LabVIEW. Compatible with µ Manager, MetaMorph, MATLAB
Fields of Application
For inverted microscopes made by Nikon and Olympus, versions for other microscopes are available on request. For super-resolution microscopy, tiling, automated scanning microscopy
- Highest stability
- Resolution 0.1 µm
- Travel range to 135 mm × 85 mm
- For inverted microscopes, revolving nosepiece freely rotatable
- Suitable Z sample scanner available
- Velocity to 120 mm/s
Reference-Class Microscopy XY Stage
With controller and joystick. Large clear aperture 160 mm x 110 mm. Versions for inverted microscopes:
- Nikon Eclipse Ti-E/Ti-U/Ti-S (M-687.UN)
- Olympus IX2 (M-687.UO)
High-Resolution Piezo Linear Drive
Self-locking at rest. Low noise. Highest stability due to low thermal load and no need for lubricants. Large dynamics range of 10 µm/s to 100 mm/s, ideal for operation via joystick and automated high-content methods
Direct-Metrology Linear Encoder
High resolution and repeatability
User Software
PIMikroMove. PI General Command Set (GCS). Drivers for LabVIEW. Compatible with µ Manager, MetaMorph, MATLAB
Fields of Application
For inverted microscopes made by Nikon and Olympus, versions for other microscopes are available on request. For super-resolution microscopy, tiling, automated scanning microscopy