Lake Shore Cryotronics, Inc. Cryogenic Probe Station Model FWPX

Description
Features of the Model FWPX Large-size wafer probe station Largest wafer sample size: 4 in Sample translation for rapid probing Customizable to accept 6 in wafers Lake Shore’s FWPX probe station is designed for researchers who require large-size wafer probing. The FWPX accommodates wafers up to 102 mm (4 in) in diameter and can be modified to accept up to 152 mm (6 in) wafers. This general-purpose probe station is designed for researchers or engineers conducting material characterization tests over large samples. It is also an effective unit for measuring organic materials. The FWPX employs a continuous refrigeration system using either liquid helium or liquid nitrogen for wafer cooling. It operates over a temperature range of 4.5 K to 475 K with the option to extend the base temperature to 3.5 K. I-V, C-V, and microwave measurements are standard. The station is configurable with up to six thermally anchored micro-manipulated probe arms and is optimally designed for electro-optical testing.
Request a Quote Datasheet
Description
Features of the Model FWPX Large-size wafer probe station Largest wafer sample size: 4 in Sample translation for rapid probing Customizable to accept 6 in wafers Lake Shore’s FWPX probe station is designed for researchers who require large-size wafer probing. The FWPX accommodates wafers up to 102 mm (4 in) in diameter and can be modified to accept up to 152 mm (6 in) wafers. This general-purpose probe station is designed for researchers or engineers conducting material characterization tests over large samples. It is also an effective unit for measuring organic materials. The FWPX employs a continuous refrigeration system using either liquid helium or liquid nitrogen for wafer cooling. It operates over a temperature range of 4.5 K to 475 K with the option to extend the base temperature to 3.5 K. I-V, C-V, and microwave measurements are standard. The station is configurable with up to six thermally anchored micro-manipulated probe arms and is optimally designed for electro-optical testing.
Request a Quote Datasheet

Suppliers

Company
Product
Description
Supplier Links
Cryogenic Probe Station - Model FWPX - Lake Shore Cryotronics, Inc.
Westerville, OH, United States
Cryogenic Probe Station
Model FWPX
Cryogenic Probe Station Model FWPX
Features of the Model FWPX Large-size wafer probe station Largest wafer sample size: 4 in Sample translation for rapid probing Customizable to accept 6 in wafers Lake Shore’s FWPX probe station is designed for researchers who require large-size wafer probing. The FWPX accommodates wafers up to 102 mm (4 in) in diameter and can be modified to accept up to 152 mm (6 in) wafers. This general-purpose probe station is designed for researchers or engineers conducting material characterization tests over large samples. It is also an effective unit for measuring organic materials. The FWPX employs a continuous refrigeration system using either liquid helium or liquid nitrogen for wafer cooling. It operates over a temperature range of 4.5 K to 475 K with the option to extend the base temperature to 3.5 K. I-V, C-V, and microwave measurements are standard. The station is configurable with up to six thermally anchored micro-manipulated probe arms and is optimally designed for electro-optical testing.

Features of the Model FWPX Large-size wafer probe station

  • Largest wafer sample size: 4 in
  • Sample translation for rapid probing
  • Customizable to accept 6 in wafers

Lake Shore’s FWPX probe station is designed for researchers who require large-size wafer probing. The FWPX accommodates wafers up to 102 mm (4 in) in diameter and can be modified to accept up to 152 mm (6 in) wafers. This general-purpose probe station is designed for researchers or engineers conducting material characterization tests over large samples. It is also an effective unit for measuring organic materials.

The FWPX employs a continuous refrigeration system using either liquid helium or liquid nitrogen for wafer cooling. It operates over a temperature range of 4.5 K to 475 K with the option to extend the base temperature to 3.5 K. I-V, C-V, and microwave measurements are standard. The station is configurable with up to six thermally anchored micro-manipulated probe arms and is optimally designed for electro-optical testing.

Supplier's Site Datasheet

Technical Specifications

  Lake Shore Cryotronics, Inc.
Product Category Nondestructive Testing (NDT) Probes
Product Number Model FWPX
Product Name Cryogenic Probe Station
NDT Probe Technology Magnetic / Hall Effect
Unlock Full Specs
to access all available technical data

Similar Products

Tabletop Probe Station - Model PS-100 - Lake Shore Cryotronics, Inc.
Lake Shore Cryotronics, Inc.
Specs
NDT Probe Technology Magnetic / Hall Effect
Features & Format Array Type Probe
View Details
Cryogenic Probe Station - Model CRX-VF - Lake Shore Cryotronics, Inc.
Lake Shore Cryotronics, Inc.
Specs
NDT Probe Technology Magnetic / Hall Effect
Features & Format Array Type Probe
View Details
Cryogenic Probe Station - Model CRX-4K - Lake Shore Cryotronics, Inc.
Lake Shore Cryotronics, Inc.
Specs
NDT Probe Technology Magnetic / Hall Effect
Features & Format Array Type Probe
View Details
Cryogenic Probe Station - Model CRX-6.5K - Lake Shore Cryotronics, Inc.
Lake Shore Cryotronics, Inc.
Specs
NDT Probe Technology Magnetic / Hall Effect
Features & Format Array Type Probe
View Details