Lake Shore Cryotronics, Inc. Cryogenic Probe Station Model FWPX

Description
Features of the Model FWPX Large-size wafer probe station Largest wafer sample size: 4 in Sample translation for rapid probing Customizable to accept 6 in wafers Lake Shore’s FWPX probe station is designed for researchers who require large-size wafer probing. The FWPX accommodates wafers up to 102 mm (4 in) in diameter and can be modified to accept up to 152 mm (6 in) wafers. This general-purpose probe station is designed for researchers or engineers conducting material characterization tests over large samples. It is also an effective unit for measuring organic materials. The FWPX employs a continuous refrigeration system using either liquid helium or liquid nitrogen for wafer cooling. It operates over a temperature range of 4.5 K to 475 K with the option to extend the base temperature to 3.5 K. I-V, C-V, and microwave measurements are standard. The station is configurable with up to six thermally anchored micro-manipulated probe arms and is optimally designed for electro-optical testing.
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Description
Features of the Model FWPX Large-size wafer probe station Largest wafer sample size: 4 in Sample translation for rapid probing Customizable to accept 6 in wafers Lake Shore’s FWPX probe station is designed for researchers who require large-size wafer probing. The FWPX accommodates wafers up to 102 mm (4 in) in diameter and can be modified to accept up to 152 mm (6 in) wafers. This general-purpose probe station is designed for researchers or engineers conducting material characterization tests over large samples. It is also an effective unit for measuring organic materials. The FWPX employs a continuous refrigeration system using either liquid helium or liquid nitrogen for wafer cooling. It operates over a temperature range of 4.5 K to 475 K with the option to extend the base temperature to 3.5 K. I-V, C-V, and microwave measurements are standard. The station is configurable with up to six thermally anchored micro-manipulated probe arms and is optimally designed for electro-optical testing.
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Datasheet
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The Model FWPX is a cryogenic probe station designed for non-destructive electrical characterization of materials and devices over a temperature range of 4.5 K to 475 K, with an option to extend the base temperature to 3.5 K. It accommodates wafers up to 102 mm (4 in) in diameter and can be customized for up to 152 mm (6 in) wafers. The station supports up to six thermally anchored probe arms and is optimized for electro-optical, I-V, C-V, and microwave measurements. It uses continuous refrigeration with liquid helium or liquid nitrogen. The system is configured with variable temperature and magnetic field capabilities for material studies including Hall effect and magneto-transport measurements.

Datasheet Summary
Powered by GS/AI

The Model FWPX is a cryogenic probe station designed for non-destructive electrical characterization of materials and devices over a temperature range of 4.5 K to 475 K, with an option to extend the base temperature to 3.5 K. It accommodates wafers up to 102 mm (4 in) in diameter and can be customized for up to 152 mm (6 in) wafers. The station supports up to six thermally anchored probe arms and is optimized for electro-optical, I-V, C-V, and microwave measurements. It uses continuous refrigeration with liquid helium or liquid nitrogen. The system is configured with variable temperature and magnetic field capabilities for material studies including Hall effect and magneto-transport measurements.

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Cryogenic Probe Station - Model FWPX - Lake Shore Cryotronics, Inc.
Westerville, OH, United States
Cryogenic Probe Station
Model FWPX
Cryogenic Probe Station Model FWPX
Features of the Model FWPX Large-size wafer probe station Largest wafer sample size: 4 in Sample translation for rapid probing Customizable to accept 6 in wafers Lake Shore’s FWPX probe station is designed for researchers who require large-size wafer probing. The FWPX accommodates wafers up to 102 mm (4 in) in diameter and can be modified to accept up to 152 mm (6 in) wafers. This general-purpose probe station is designed for researchers or engineers conducting material characterization tests over large samples. It is also an effective unit for measuring organic materials. The FWPX employs a continuous refrigeration system using either liquid helium or liquid nitrogen for wafer cooling. It operates over a temperature range of 4.5 K to 475 K with the option to extend the base temperature to 3.5 K. I-V, C-V, and microwave measurements are standard. The station is configurable with up to six thermally anchored micro-manipulated probe arms and is optimally designed for electro-optical testing.

Features of the Model FWPX Large-size wafer probe station

  • Largest wafer sample size: 4 in
  • Sample translation for rapid probing
  • Customizable to accept 6 in wafers

Lake Shore’s FWPX probe station is designed for researchers who require large-size wafer probing. The FWPX accommodates wafers up to 102 mm (4 in) in diameter and can be modified to accept up to 152 mm (6 in) wafers. This general-purpose probe station is designed for researchers or engineers conducting material characterization tests over large samples. It is also an effective unit for measuring organic materials.

The FWPX employs a continuous refrigeration system using either liquid helium or liquid nitrogen for wafer cooling. It operates over a temperature range of 4.5 K to 475 K with the option to extend the base temperature to 3.5 K. I-V, C-V, and microwave measurements are standard. The station is configurable with up to six thermally anchored micro-manipulated probe arms and is optimally designed for electro-optical testing.

Supplier's Site Datasheet

Technical Specifications

  Lake Shore Cryotronics, Inc.
Product Category Nondestructive Testing (NDT) Probes
Product Number Model FWPX
Product Name Cryogenic Probe Station
NDT Probe Technology Magnetic / Hall Effect
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