BAE Systems - Fairchild Imaging Time Delay Integration Line Scan Sensor CCD5045

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Time Delay Integration Line Scan Sensor - CCD5045 - BAE Systems - Fairchild Imaging
Milpitas, CA, USA
Time Delay Integration Line Scan Sensor
CCD5045
Time Delay Integration Line Scan Sensor CCD5045
The CCD 5045 is a 4096 x 96 line, high-speed TDI sensor. With four outputs, each running at 25MHz, this CCD provides a total data rate of 100MHz which is equivalent to more than 23K lines per second. Utilizing Fairchild Imaging's proprietary buried channel CCD process, the CCD 5045 achieves consistent, superior TDI performance. 4096 pixels per line 96 lines at integration 13µm pixel size # of selectable TDI stages: 96,64,48,32 and 24 4 outputs - each capable of 25MHz data rate - 100MHz total data rate Horizontal anti-blooming High responsivity

The CCD 5045 is a 4096 x 96 line, high-speed TDI sensor. With four outputs, each running at 25MHz, this CCD provides a total data rate of 100MHz which is equivalent to more than 23K lines per second. Utilizing Fairchild Imaging's proprietary buried channel CCD process, the CCD 5045 achieves consistent, superior TDI performance.

  • 4096 pixels per line
  • 96 lines at integration
  • 13µm pixel size
  • # of selectable TDI stages: 96,64,48,32 and 24
  • 4 outputs - each capable of 25MHz data rate - 100MHz total data rate
  • Horizontal anti-blooming
  • High responsivity
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Technical Specifications

  BAE Systems - Fairchild Imaging
Product Category Focal Plane Arrays
Product Number CCD5045
Product Name Time Delay Integration Line Scan Sensor
Array Type Time-Delay Integration Array; Other
Features High Speed; Antiblooming
Output Channels 4
Dynamic Range 3000 dB
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