Texas Instruments SN54BCT8240A Scan Test Devices With Octal Buffers SNJ54BCT8240AFK

Description
Scan Test Devices With Octal Buffers 28-LCCC -55 to 125
Request a Quote Datasheet
Description
Scan Test Devices With Octal Buffers 28-LCCC -55 to 125
Request a Quote Datasheet

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SN54BCT8240A Scan Test Devices With Octal Buffers - SNJ54BCT8240AFK - Texas Instruments
Dallas, TX, United States
SN54BCT8240A Scan Test Devices With Octal Buffers
SNJ54BCT8240AFK
SN54BCT8240A Scan Test Devices With Octal Buffers SNJ54BCT8240AFK
Scan Test Devices With Octal Buffers 28-LCCC -55 to 125

Scan Test Devices With Octal Buffers 28-LCCC -55 to 125

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Technical Specifications

  Texas Instruments
Product Category Logic Gates
Product Number SNJ54BCT8240AFK
Product Name SN54BCT8240A Scan Test Devices With Octal Buffers
Gate Type Buffer/Driver
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