Texas Instruments SN74LVTH18646A 3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers SN74LVTH18646APM

Name: SN74LVTH18646A 3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers
Brand: Texas Instruments

Description

3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers 64-LQFP -40 to 85

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Datasheet

Description

3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers 64-LQFP -40 to 85

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Datasheet

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Dallas, TX, United States

SN74LVTH18646A 3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers
SN74LVTH18646APM

SN74LVTH18646A 3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers SN74LVTH18646APM

3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers 64-LQFP -40 to 85

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Datasheet

Futian, China

Integrated Circuits (ICs) - Logic - Specialty Logic
SN74LVTH18646APM

Integrated Circuits (ICs) - Logic - Specialty Logic SN74LVTH18646APM

IC SCAN-TEST-DEV/XCVR 64-LQFP

Supplier's Site

	Texas Instruments	Shenzhen Shengyu Electronics Technology Limited
Product Category	IC Interfaces	IC Interfaces
Product Number	SN74LVTH18646APM	SN74LVTH18646APM
Product Name	SN74LVTH18646A 3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers	Integrated Circuits (ICs) - Logic - Specialty Logic
Technology	LVT
Device Type	Transceiver
Features	RoHS

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