Piezosystem Jena, Inc. Fast Scanning Piezo Microscopy Stage MICI-KMI53

inverted microscope stage 25 mm manual x-y- axis adjustment 250 µm automated x-y- option fits most major brand microscopes The KMI stage provides a combination of manual and automated positioning of the microscope platform itself. Digital vernier micrometers provide 25 mm adjustment with µm precision, and special piezo-driven micrometer holders (MICI) provide up to 250 µm of nm precise automated motion. Inserts for various sample holders, such as slides, dishes, and SBS, are available.