Xplore TEM, our SDD detector specifically designed for routine applications in 120kV and 200kV a new 80 mm2 sensor and polymer thin window and Extreme electronics this detector offers fast and accurate elemental characterization. Solid angle of 0.1 - 0.4 s rad Detection of elements from Be to Cf Quantitative analysis at >200,000 cps SATW window offers unparalleled ease of use
| Oxford Instruments | |
|---|---|
| Product Category | Radiation Detectors |
| Product Number | Xplore TEM |
| Product Name | Silicon Drift Detectors (SDD) |
| Detector Style | Fixed Installation |
