Micross Standard-Performance Nuclear Event Detector (NED) features a 2X increase in radiation dose rate sensitivity and 50%+ reduced response times at 10X lower overdrive levels relative to legacy devices with integrated differential drivers providing SWaP reduction, improved noise immunity and reduced delay times. The Standard-Performance NED can be screened to XT (Extended Temperature, -55°C to 125°C) and MIL-PRF-38534 Class H and provides a greatly improved functional replacement for the nearly 40-year-old legacy NED solution.
Micross Standard-Performance Nuclear Event Detector (NED) features a 2X increase in radiation dose rate sensitivity and 50%+ reduced response times at 10X lower overdrive levels relative to legacy devices with integrated differential drivers providing SWaP reduction, improved noise immunity and reduced delay times. The Standard-Performance NED can be screened to XT (Extended Temperature, -55°C to 125°C) and MIL-PRF-38534 Class H and provides a greatly improved functional replacement for the nearly 40-year-old legacy NED solution.
