Oxford Instruments Silicon Drift Detectors (SDD) X-MaxN80T

The X-MaxN range of SDD for TEM exploits a new sensor chip, new electronics, and innovative packaging to deliver a truly 'next generation' SDD performance. X-MaxN TEM detectors use the latest low noise detector designs for excellent resolution and sensitivity - even at high count rates. Specially designed for routine TEM applications, the large-area 80 mm2 sensor of the X-MaxN 80 T provides superb solid angle and analytical performance. Designed to maximize throughput and low energy sensitivity Excellent resolution with guaranteed Mn specification at 50,000 cps Optimized take-off angle for best peak-to-background ratios and light element detection Proven performance on all classes of TEM including field emission, aberration corrected microscopes Count rates conducive to acquiring X-ray maps quickly, including real-time background removal and peak deconvolution using Tru Map software