Oxford Instruments Electron Backscatter Diffraction (EBSD) Detector C-Swift

C-Swift is a class-leading, high throughput EBSD detector. As with the Symmetry detector, C-Swift uses a customized CMOS sensor to deliver both speed and sensitivity, ensuring high quality results on even the most challenging materials. C-Swift's maximum speed of 1000 pps is achieved with good pattern resolution (156 x 128 pixels), This represents 4 times the number of pixels than is used by a comparable CCD-based detector operating at similar speeds, ensuring reliable indexing and high hit rates on all types of samples. The distortion-free optics, in partnership with the powerful indexing algorithms in the Aztec software, enables C-Swift to deliver excellent angular precision down below 0.05°. For applications that demand higher quality patterns, C-Swift can collect 622 x 512 pixel patterns at speeds up to 250 pps, making it ideal for complex multi-phase samples and detailed phase analysis. This is a detector that has been designed for fast, effective sample characterization. Every component of the system, from the unique proximity sensor to the optional integrated fore scatter detectors, has been designed to maximize performance and ease of use, and to make EBSD a standard tool in every laboratory.