Oxford Instruments Datasheets for Diffractometers
Diffractometers are used to measure crystal structure, grain size, texture, and/or residual stress of materials and compounds through the interaction of X-ray beams, gamma rays, electron beams, or neutron beams with a sample.
Diffractometers: Learn more
| Product Name | Notes |
|---|---|
| C-Nano is an EBSD detector that is designed for all types of materials and applications. Utilizing a customized CMOS sensor, C-Nano delivers a top acquisition speed of 400 pps with... | |
| C-Swift is a class-leading, high throughput EBSD detector. As with the Symmetry detector, C-Swift uses a customized CMOS sensor to deliver both speed and sensitivity, ensuring high quality results on... | |
| Symmetry uses a customized CMOS sensor to unlock a unique and powerful combination of speed, sensitivity and diffraction pattern detail. Symmetry, in combination with the Aztec software, delivers exceptional performance... |