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Bruker Corporation X-ray Diffraction (XRD)

Description
Non-destructive Characterization of Material Properties Bruker's X-ray Diffraction and Scattering portfolio enables detailed analysis of any material from fundamental research to industrial quality control providing forward looking solutions to our customers today. Applications of these qualitative and quantitative techniques include: Phase Identification Quantitative Analysis Crystal structure determination PDF analysis (total scattering) Small Angle X-Ray Scattering (SAXS) X-Ray Reflectometry (XRR) High Resolution X-Ray Diffraction (HRXRD) Reciprocal Space Mapping (RSM) Residual Stress Texture (pole figures)

Suppliers

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Product
Description
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X-ray Diffraction (XRD) -  - Bruker Corporation
Billerica, MA, USA
X-ray Diffraction (XRD)
X-ray Diffraction (XRD)
Non-destructive Characterization of Material Properties Bruker's X-ray Diffraction and Scattering portfolio enables detailed analysis of any material from fundamental research to industrial quality control providing forward looking solutions to our customers today. Applications of these qualitative and quantitative techniques include: Phase Identification Quantitative Analysis Crystal structure determination PDF analysis (total scattering) Small Angle X-Ray Scattering (SAXS) X-Ray Reflectometry (XRR) High Resolution X-Ray Diffraction (HRXRD) Reciprocal Space Mapping (RSM) Residual Stress Texture (pole figures)

Non-destructive Characterization of Material Properties
Bruker's X-ray Diffraction and Scattering portfolio enables detailed analysis of any material from fundamental research to industrial quality control providing forward looking solutions to our customers today. Applications of these qualitative and quantitative techniques include:

  • Phase Identification
  • Quantitative Analysis
  • Crystal structure determination
  • PDF analysis (total scattering)
  • Small Angle X-Ray Scattering (SAXS)
  • X-Ray Reflectometry (XRR)
  • High Resolution X-Ray Diffraction (HRXRD)
  • Reciprocal Space Mapping (RSM)
  • Residual Stress
  • Texture (pole figures)
Supplier's Site

Technical Specifications

  Bruker Corporation
Product Category Diffractometers
Product Name X-ray Diffraction (XRD)
Features Benchtop (optional feature); High Resolution/Crystal Quality Capabilities (optional feature)
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