Non-destructive Characterization of Material Properties Bruker's X-ray Diffraction and Scattering portfolio enables detailed analysis of any material from fundamental research to industrial quality control providing forward looking solutions to our customers today. Applications of these qualitative and quantitative techniques include:
Phase Identification
Quantitative Analysis
Crystal structure determination
PDF analysis (total scattering)
Small Angle X-Ray Scattering (SAXS)
X-Ray Reflectometry (XRR)
High Resolution X-Ray Diffraction (HRXRD)
Reciprocal Space Mapping (RSM)
Residual Stress
Texture (pole figures)
Non-destructive Characterization of Material Properties
Bruker's X-ray Diffraction and Scattering portfolio enables detailed analysis of any material from fundamental research to industrial quality control providing forward looking solutions to our customers today. Applications of these qualitative and quantitative techniques include:
- Phase Identification
- Quantitative Analysis
- Crystal structure determination
- PDF analysis (total scattering)
- Small Angle X-Ray Scattering (SAXS)
- X-Ray Reflectometry (XRR)
- High Resolution X-Ray Diffraction (HRXRD)
- Reciprocal Space Mapping (RSM)
- Residual Stress
- Texture (pole figures)