Texas Instruments SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 5962-9172701QLA

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Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125

Texas Instruments

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Description

Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125

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Texas Instruments

Dallas, TX, United States

SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops
5962-9172701QLA

SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 5962-9172701QLA

Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125

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Technical Specifications

	Texas Instruments
Product Category	Flip-Flops
Product Number	5962-9172701QLA
Product Name	SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops
Operating Temperature	-55 to 125 C (-67 to 257 F)

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