Texas Instruments SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 5962-9172701Q3A

Name: SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops
Brand: Texas Instruments

Description

Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125

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Datasheet

Description

Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125

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Datasheet

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Dallas, TX, United States

SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops
5962-9172701Q3A

SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 5962-9172701Q3A

Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125

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Datasheet

	Texas Instruments
Product Category	Flip-Flops
Product Number	5962-9172701Q3A
Product Name	SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops
Operating Temperature	-55 to 125 C (-67 to 257 F)

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