Oxford Instruments Electron Backscatter Diffraction (EBSD) Detector Symmetry®

Symmetry uses a customized CMOS sensor to unlock a unique and powerful combination of speed, sensitivity and diffraction pattern detail. Symmetry, in combination with the Aztec software, delivers exceptional performance on all materials and for all measurements. The highest analysis speed of Symmetry, in excess of 3000 pps, is more than twice that of any CCD-based EBSD detector on the market yet this is achieved without high beam currents or excessive pixel binning. This means that these high speeds can be achieved even on challenging, real world samples such as multiphase light metal alloys or deformed steels. In addition, Symmetry can collect distortion-free, megapixel resolution EBSPs for detailed strain and phase analyses. This is a detector to suit all applications, enhanced by innovative features such as software controlled tilting (with dynamic calibration) and a unique proximity sensor. Symmetry is truly a game changer and is already opening up new developments in even the most exacting of applications.